Share Email Print

Proceedings of SPIE Volume 4735

Hybrid Image and Signal Processing VIII
Editor(s): David P. Casasent; Andrew G. Tescher
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 4735
Date Published: 7 June 2002
Softcover: 12 papers (120) pages
ISBN: 9780819444851

Table of Contents
show all abstracts | hide all abstracts
Fast watershed aided by target detection
Author(s): Huibao Lin; Jennie Si; Glen P. Abousleman
Show Abstract
Segmentation of MPEG-2 motion imagery within the compressed domain
Author(s): Thomas S. Heath; Mark A. Robertson; John G. Keller; Todd B. Howlett
Show Abstract
Pose estimation for autonomous robotic grasping
Author(s): Stanley E. Monroe; John Michael Rollins; Richard D. Juday
Show Abstract
New filters for optical correlators
Author(s): Nickolay N. Evtikhiev; Peter A. Ivanov; Alexey V. Kamensky; Rostislav S. Starikov
Show Abstract
Multiview 3D display system based on volume holographic lenticular element
Author(s): Byung-Chul Cho; Sang-Woo Lee; Jung-Sik Gu; Eun-Soo Kim
Show Abstract
High-dynamic-range imaging optical detectors
Author(s): Ricardo C. Coutinho; David R. Selviah; Hugh D. Griffiths
Show Abstract
Region-based scalable coding for interactive image/video communications over networks
Author(s): Ji Hyun Lee; Geo W. Lee; Sung Ho Yoon
Show Abstract
Hybrid image recognition architecture
Author(s): Claudio Delrieux; Roman Katz
Show Abstract
Image processing spreadsheet
Author(s): Claudio Delrieux; Gustavo Ramoscelli; Leonardo Arlenghi; Alejandro Vitale
Show Abstract
Dynamic programming-based approach to microarray image registration
Author(s): Sunil B. Rodrigues; Ronald Joe Stanley; Charles W. Caldwell; Paul D. Gader
Show Abstract
Convergence control of a moving object using hierarchical algorithms in a stereo vision system
Author(s): Jung-Hwan Ko; Jae-Soo Lee; Eun-Soo Kim
Show Abstract
Detection of sample parameters in secondary electron microscope images: test results
Author(s): Sowmya Mahadevan; David P. Casasent
Show Abstract

© SPIE. Terms of Use
Back to Top