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Proceedings of SPIE Volume 4703

Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
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Volume Details

Volume Number: 4703
Date Published: 7 June 2002
Softcover: 24 papers (238) pages
ISBN: 9780819444516

Table of Contents
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Determination of mechanical properties of superhard amorphous, nanocrystalline, and microcrystalline materials by laser-based surface acoustic waves
Author(s): Peter Hess
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NDE of zinc layer on steel substrate using laser-ultrasonic SAW
Author(s): Bouzid Chenni; Andre Moreau; J. Pouliquen
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Measurement and simulation of the laser-based thermo-elastic excitation and propagation of acoustic pulses for thin film and MEMS inspection
Author(s): Dieter Michael Profunser; Jacqueline Vollmann; Jurg Bryner; Jurg Dual
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Nondestructive evaluation of bonding characteristics of TiO2-Al2O3 gas sensor
Author(s): Bin Feng; Golam Newaz; Gregory W. Auner; Sheikh Akbar; A. Merhaba
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In-situ x-ray reflectivity measurement of the interface roughness of tantalum pentoxide thin film during rf magnetron sputtering deposition
Author(s): Chih-Hao Lee; Tzu-Wen Huang; Hsin-Yi Lee; Yung-Wei Hsieh
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Subsurface detection and characterization of Hertzian cracks in advanced ceramic materials using optical coherence tomography
Author(s): Mark Bashkansky; John F. Reintjes
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Atomic force acoustic microscopy at ultrasonic frequencies
Author(s): Walter Arnold; S. Hirsekorn; Malgorzata Kopycinska-Mueller; Ute Rabe; Michael Reinstaedtler; V. Scherer
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Quantitative elastic-property information with acoustic AFM: measurements and modeling
Author(s): Donna C. Hurley; Joshua S. Wiehn; Joseph A. Turner; Paul Rice
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Nonlinear vibrations in atomic force microscopy
Author(s): Joseph A. Turner
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Ultrasonic atomic force microscopy with real-time mapping of resonance frequency and Q factor
Author(s): Kazushi Yamanaka; Hiroshi Irihama; Toshihiro Tsuji; Keiichi Nakamoto
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Finite element simulations of nonlinear vibrations of atomic force microscope cantilevers
Author(s): Kangzhi Shen; Joseph A. Turner
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Improving atomic force microscopy images with the adaptation of ultrasonic force microscopy
Author(s): Carl J. Druffner; Shamachary Sathish
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Micro Materials Center Berlin: reliability research for MEMS
Author(s): Bernd Michel; Thomas Winkler
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Damage detection and characterization in smart CFRP composites
Author(s): Gerhard Mook; Juergen Pohl; Fritz Michel; Sven Herold
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Characterization of epoxy coating degradation using NDE imaging techniques
Author(s): Jochen Hoffmann; Victoria Kramb; Joel Johnson; Norbert Meyendorf
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Relations between crack opening behavior and crack tip diffraction of longitudinal wave
Author(s): Tsuyoshi Mihara; Masashi Nomura; Kazushi Yamanaka
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Characterization of miniaturized tensile specimens using micromagnetic techniques
Author(s): Henrik Roesner; Norbert Meyendorf
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Output signal prediction of an open-ended waveguide probe when scanning elliptically shaped cracks in metals
Author(s): Farhad Mazlumi; Hesam Sadeghi; R. Moini
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Accelerated life testing (ALT) in microelectronics and photonics: its role, attributes, challenges, pitfalls, and interaction with qualification tests
Author(s): Ephraim Suhir
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Microcharacterization of MEMS ultrasonic transducers using laser interferometry
Author(s): James L. Blackshire; Shamachary Sathish
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Micro- and nano-DAC: a powerful technique for nondestructive microcrack evaluation
Author(s): Bernd Michel; Dietmar Vogel
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Nondestructive characterization and application of doped and undoped polycrystalline diamond films
Author(s): Matthias Werner; Thomas Koehler; Stephan Mietke; Eckhard Woerner; Colin Johnston; Hans-Joerg Fecht
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Analytical modeling of flash thermography: results for a layered sample
Author(s): Matthias Goldammer; Joachim Baumann
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Diffusion-based thermal tomography
Author(s): Ronald A. Kline; William P. Winfree
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