Share Email Print


Test and Measurement Applications of Optoelectronic Devices
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a black-and-white photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 4648
Date Published: 16 April 2002
Softcover: 19 papers (188) pages
ISBN: 9780819443878

Table of Contents
show all abstracts | hide all abstracts
Carrier density dependence of the lifetime of InGaAs/AlGaAs high-power lasers
Author(s): Franz Rinner; Joseph Rogg; Nicolas Wiedmann; H. Konstanzer; Michael Dammann; Michael Mikulla; Reinhart Poprawe; Guenter Weimann
Show Abstract
Diode laser testing by taking advantage of its photoelectric properties
Author(s): Jens Wolfgang Tomm; A. Gerhardt; Dirk Lorenzen; P. Henning; H. Roehle
Show Abstract
Nondestructive technique for the direct measurement of the local temperature distribution in VCSELs
Author(s): Maurizio Dabbicco; Vincenzo Spagnolo; Michele Ferrara; Gaetano Scamarcio
Show Abstract
Failure mode analysis of high-power laser diodes
Author(s): Robert G. Ahrens; James J. Jaques; Niloy K. Dutta; Michael J. LuValle; Alfonso B. Piccirilli; Ron M. Camarda; Anthony B. Fields; Kenneth R. Lawrence
Show Abstract
Mapping of current and heat flows in IR light-emitting devices and lasers
Author(s): Volodymyr K. Malyutenko
Show Abstract
Microreflectance inspection of diode laser front facets
Author(s): Fabian Doerfel; Stefan Nerreter; Jens Wolfgang Tomm; Ruediger Grunwald; R. Kunkel; Johann Luft
Show Abstract
Crystallization process of Ag-Sb-Te alloy and films for phase-change optical data storage
Author(s): Yagya Deva Sharma; Promod K. Bhatnagar
Show Abstract
Mixing of two 155-um laser waves in millimeter frequency range for optical components test
Author(s): Pascal Dherbecourt; Olivier Latry; Eric Joubert; Mohamed Ketata
Show Abstract
High-power high-brightness ridge-waveguide tapered diode lasers at 940 nm
Author(s): Marc T. Kelemen; Franz Rinner; Joseph Rogg; Nicolas Wiedmann; Rudolf Kiefer; Martin Walther; Michael Mikulla; Guenter Weimann
Show Abstract
Beam shaping of broad-area diode lasers: principles and benefits
Author(s): Albrecht von Pfeil; Thilo von Freyhold
Show Abstract
Optically pumped high-power fiber lasers
Author(s): Theodore F. Morse
Show Abstract
Applications of SLDs in fiber optical gyroscopes
Author(s): Paul R. Ashley; Mark G. Temmen; Mohan Sanghadasa
Show Abstract
Adjustable coherence length sources for low-coherence interferometry
Author(s): Adrian Gh. Podoleanu; Radu G. Cucu; Richard B. Rosen; George M. Dobre; John A. Rogers; David A. Jackson; Vladimir R. Shidlovski
Show Abstract
Design of high-power superluminescent diodes with low spectral modulation
Author(s): Gerard A. Alphonse
Show Abstract
Superluminescent diodes for optical coherence tomography
Author(s): Vladimir R. Shidlovski; Jay Wei
Show Abstract
Application of sub-ns pulsed LEDs in fluorescence lifetime spectroscopy
Author(s): Michael Wahl; Uwe Ortmann; Kristian Lauritsen; Rainer Erdmann
Show Abstract
Applying surface-mounted LEDs in automotive interior and exterior lighting
Author(s): Kun Michelle Huang
Show Abstract
Trace gas analysis by diode laser cavity ring-down spectroscopy
Author(s): Wen-Bin Yan
Show Abstract
Simultaneous Raman spectra measurement using power build-up cavity (PBC)
Author(s): Shinobu Ohara; Takashi Oketani; Masamori Endo; Shigeru Yamaguchi; Kenzo Nanri; Tomoo Fujioka
Show Abstract

© SPIE. Terms of Use
Back to Top