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Proceedings of SPIE Volume 4608

Nanostructure Science, Metrology, and Technology
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Volume Details

Volume Number: 4608
Date Published: 24 July 2002
Softcover: 29 papers (288) pages
ISBN: 9780819443472

Table of Contents
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Nanoelectronics: a military perspective
Author(s): Gerald M. Borsuk
Toward a retinal prosthesis for the blind: advanced microelectronics combined with a nanochannel glass electrode array
Author(s): Dean A. Scribner; Mark S. Humayun; Brian L. Justus; Charles D. Merritt; Richard B. Klein; J. Grant Howard; Martin C. Peckerar; F. Keith Perkins; Lee J. Johnson; W Bassett; P Skeath; J Weiland; Eugene de Juan; James A. Finch; Roger W. Graham; Walter C. Trautfield; Scott M. Taylor
Clusters on semiconductor surfaces
Author(s): Orest J. Glembocki; Sharka M. Prokes; Thomas A. Kennedy; A. K. Rajagopal
Chemical modification of surfaces utilizing noncovalent interactions
Author(s): Mu-San Chen; Walter J. Dressick; Terence L. Schull; Susan L. Brandow
Scan linearity: a hidden factor in SEM magnification calibration
Author(s): Albert Sicignano; Arkady V. Nikitin; Dmitriy Y. Yeremin; Matthew Sandy; E. Tim Goldburt
Optical energy conversion in crystalline nanowires
Author(s): Samuel S. Mao; Richard E. Russo; Peidong Yang
Fractal characterization of nanoscale powder agglomerates
Author(s): Siva Manickavasagam; Craig Saltiel; M. Pinar Menguec; Martin L. Sadowski; Zbigniew M. Drozdowicz
Facility for nanoscience research: an overview
Author(s): J. A. Stroscio; E. W. Hudson; S. R. Blankenship; Robert J. Celotta; A. P. Fein
Power actuators for nanotechnology
Author(s): Vadim I. Rakhovsky
Performance of a nanocrystalline tungsten composite in ballistic impacts
Author(s): Lee S. Magness; L Kecskes; Francis S. Biancaniello; Stephen D. Ridder; M Chung; D Kapoor
Metrology break-out group
Author(s): - -
Sensing macromolecules with microelectronics
Author(s): F. Keith Perkins; L M Tender; S J Fertig; Martin C. Peckerar
Nanomedicine (Viewgraphs Only)
Author(s): Kaveh Zamani

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