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X-Ray Micro- and Nano-Focusing: Applications and Techniques II
Editor(s): Ian McNulty

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Volume Details

Volume Number: 4499
Date Published: 13 December 2001

Table of Contents
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Imaging buried magnetic domains using hard x rays
Author(s): Jonathan C. Lang; J. Pollmann; Daniel Haskel; George Srajer; Jorg Maser; J. S. Jiang; Samuel D. Bader
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Development and application of a focused ultrasoft x-ray probe for radiobiological applications
Author(s): Melvyn Folkard; Giuseppe Schettino; Borivoj Vojnovic; Alan G. Michette; Christian David; Slawka J. Pfauntsch; Kevin M. Prise; Barry D. Michael
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X-ray microdiffraction study of martensite-retained austenite microstructures at the tip of a steel blade
Author(s): Zhonghou Cai; Barry P. Lai; Peter P. Ilinski; Dan G. Legnini; Wenbing Yun
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Current and ultimate limitations of scanning x-ray nanotomography
Author(s): Ian McNulty
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X-ray imaging microscope with a partial coherent illumination
Author(s): Akihisa Takeuchi; Hidekazu Takano; Kentaro Uesugi; Yoshio Suzuki
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Wide-field x-ray microscopy with Kirkpatrick-Baez optics
Author(s): Terrence Jach; Stephen M. Durbin; Alex Bakulin; David S. Bright; Cristian Stagarescu; George Srajer; Daniel Haskel; Joseph Pedulla
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New XRMF spectrometer with high resolution and high efficiency using polycapillary x-ray lens and PSPC+
Author(s): Xunliang Ding; Yiming Yan; Qiuli Pan; Yumei Yan; Yejun He
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Microbeam production using compound refractive lenses: beam characterization and applications
Author(s): Christian G. Schroer; Bruno Lengeler; Boris Benner; Til Florian Guenzler; Marion Kuhlmann; Alexandre S. Simionovici; Sylvain Bohic; Michael Drakopoulos; Anatoly A. Snigirev; Irina Snigireva; Walter H. Schroeder
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Refractive and diffractive x-ray optical elements
Author(s): Irina Snigireva; Anatoly A. Snigirev; Serguei Kuznetsov; Christoph Rau; Timm Weitkamp; Leonid Shabelnikov; Michail Grigoriev; Vecheslav Yunkin; Martin Hoffmann; Edgar I. Voges
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Diffraction-limited microbeam with Fresnel zone plate optics in hard x-ray regions
Author(s): Yoshio Suzuki; Akihisa Takeuchi; Hidekazu Takano; Takuji Ohigashi; Hisataka Takenaka
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Diffractive lenses for photon energies ranging from the extreme ultraviolet to hard x rays
Author(s): Christian David; Bernd Noehammer; Harun H. Solak; Bianca Haas; Fredy Glaus; J. Friso van der Veen; Volker Schlott; Jeroen Bongaerts; Burkhard Kaulich; Jean Susini
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Tunable diffractive optical elements for hard x-rays
Author(s): Christian David; Bernd Noehammer; Eric Ziegler; Olivier Hignette
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Submicron focusing of hard x rays with reflecting surfaces at the ESRF
Author(s): Olivier Hignette; Gerard Rostaing; Peter Cloetens; Amparo Rommeveaux; Wolfgang Ludwig; Andreas K. Freund
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Novel integrating solid state detector with segmentation for scanning transmission soft x-ray microscopy
Author(s): Michael Feser; Chris J. Jacobsen; Pavel Rehak; Gianluigi DiGeronimo; Peter Holl; Lothar Strueder
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PSF measurement of imaging detectors with an x-ray microbeam
Author(s): Hidekazu Takano; Yoshio Suzuki; Kentaro Uesugi; Akihisa Takeuchi; Naoto Yagi
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Experimental analysis of high-resolution soft x-ray microscopy
Author(s): Weilun Chao; Erik H. Anderson; Gregory Denbeaux; Bruce D. Harteneck; Angelic L. Pearson; Deirdre L. Olynick; Gerd Schneider; David T. Attwood
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