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Proceedings of SPIE Volume 4450

Harnessing Light: Optical Science and Metrology at NIST
Editor(s): Carmina Londono
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Volume Details

Volume Number: 4450
Date Published: 18 June 2001
Softcover: 14 papers (188) pages
ISBN: 9780819441645

Table of Contents
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100 years of optical science and metrology at NIST
Author(s): William R. Ott
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100 years of photometry and radiometry
Author(s): Jonathan E. Hardis
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Metrology for the optoelectronics industry
Author(s): Gordon W. Day
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Electronic display metrology: not a simple matter
Author(s): Edward F. Kelley
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Optical frequency standards for clocks of the future
Author(s): Leo W. Hollberg; Scott A. Diddams; E. A. Curtis; Chris W. Oates; Richard W. Fox
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Ultralow-temperature magnifying glass: how Bose-Einstein condensation makes quantum mechanics visible
Author(s): Eric A. Cornell; Paul C Haljan
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Single-molecule probes
Author(s): Laurie S. Goldner; Kenneth D. Weston; William F. Heinz; Jeeseong Hwang; Eric S. DeJong; John P. Marino
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Interferometric figure metrology: enabling in-house traceability
Author(s): Christopher J. Evans; Angela D. Davies; Tony L. Schmitz; Robert E. Parks
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Absolute extreme-ultraviolet metrology
Author(s): Charles Tarrio; Robert E. Vest; Steven Grantham
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NIST activities in support of space-based radiometric remote sensing
Author(s): Joseph P. Rice; B. Carol Johnson
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Atomic spectroscopy at NIST: 2001
Author(s): Joseph Reader
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Developments in optical radiation measurement at NPL: part I
Author(s): Nigel P. Fox
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Developments in optical radiation measurement at NPL: part II
Author(s): Nigel P. Fox
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Cryogenic infrared radiometer for transferal of NIST radiometric standards
Author(s): Blake G. Crowther; Deron K. Scott; Andrew L. Shumway; Richard D. Williams; Alan Thurgood
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