### PROCEEDINGS VOLUME 4447

Surface Scattering and Diffraction for Advanced MetrologyFormat | Member Price | Non-Member Price |
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Softcover | $105.00 * | $105.00 * |

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 4447

Date Published: 23 October 2001

Softcover: 18 papers (172) pages

ISBN: 9780819441614

Date Published: 23 October 2001

Softcover: 18 papers (172) pages

ISBN: 9780819441614

Table of Contents

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Scattering of electromagnetic waves from the random surface of a left-handed medium

Author(s): Tamara A. Leskova; Alexei A. Maradudin; I. Simonsen

Author(s): Tamara A. Leskova; Alexei A. Maradudin; I. Simonsen

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Fabrication of one-dimensional random surfaces that display enhanced backscattering for only one specified angle of incidence

Author(s): Mikael Ciftan; Tamara A. Leskova; Alexei A. Maradudin

Author(s): Mikael Ciftan; Tamara A. Leskova; Alexei A. Maradudin

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Excitation of surface plasmon polaritons by the scattering of a volume electromagnetic beam from a circularly symmetric defect on a planar metal surface

Author(s): Matthias Kretschmann; Tamara A. Leskova; Alexei A. Maradudin

Author(s): Matthias Kretschmann; Tamara A. Leskova; Alexei A. Maradudin

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Numerical study of an inverse scattering algorithm for metallic and dielectric surfaces

Author(s): Demetrio Macias; Eugenio R. Mendez; Victor Ruiz-Cortes

Author(s): Demetrio Macias; Eugenio R. Mendez; Victor Ruiz-Cortes

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Phase-shifting interference microscope for the characterization of metallic interconnections of flat panel displays

Author(s): Pierre Boher; Jean-Philippe Piel; Jean-Louis P. Stehle; Arnaud Dubois; Albert Claude Boccara

Author(s): Pierre Boher; Jean-Philippe Piel; Jean-Louis P. Stehle; Arnaud Dubois; Albert Claude Boccara

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Metrological characterization of an ARS sensor based on an elliptical mirror system and a calibrated CMOS photo detector array

Author(s): Thomas Rinder; Hendrik Rothe

Author(s): Thomas Rinder; Hendrik Rothe

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Optical characterization of MEMS deformable mirror array structures

Author(s): Soe-Mie F. Nee; Lewis F. DeSandre; Thomas G. Bifano; Linda F. Johnson; Mark B. Moran

Author(s): Soe-Mie F. Nee; Lewis F. DeSandre; Thomas G. Bifano; Linda F. Johnson; Mark B. Moran

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Modeling the appearance of special effect pigment coatings

Author(s): Thomas A. Germer; Maria E. Nadal

Author(s): Thomas A. Germer; Maria E. Nadal

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Influence of target surfaces and speckles for eye-safe scannerless imaging laser radar

Author(s): Ulrich Schael; Hendrik Rothe

Author(s): Ulrich Schael; Hendrik Rothe

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Reflectivity of Al coating sputtered by using the nitrogen-containing plasma

Author(s): Kamil A. Moldosanov; Vladimir P. Anisimov; Irina A. Anisimova; Alexander M. Skrynnikov; Victor A. Kashirin

Author(s): Kamil A. Moldosanov; Vladimir P. Anisimov; Irina A. Anisimova; Alexander M. Skrynnikov; Victor A. Kashirin

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Spectral coherence from rough surface scattering with a secondary source

Author(s): Zu-Han Gu

Author(s): Zu-Han Gu

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Redistribution of modes in a surface disordered waveguide

Author(s): Elena I. Chaikina; N. Patricia Puente; Tamara A. Leskova; Eugenio R. Mendez

Author(s): Elena I. Chaikina; N. Patricia Puente; Tamara A. Leskova; Eugenio R. Mendez

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Band-limited uniform diffuser in transmission II: a multilayer system

Author(s): Alexei A. Maradudin; Eugenio R. Mendez; Tamara A. Leskova; Ingve Simonsen

Author(s): Alexei A. Maradudin; Eugenio R. Mendez; Tamara A. Leskova; Ingve Simonsen

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Measuring correlation between speckle patterns reflected from rough surfaces at different wavelengths by adaptive photo-EMF detector

Author(s): Serguei I. Stepanov; Marcos Plata

Author(s): Serguei I. Stepanov; Marcos Plata

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Spectral invariance propagation of ultrashort laser pulses and its changes by aperture

Author(s): Zhongyang Wang; Jian Deng; Zhizhan Xu

Author(s): Zhongyang Wang; Jian Deng; Zhizhan Xu

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Mueller matrix measurements of small spherical particles deposited on c-Si wafer

Author(s): Bernard Kaplan; Bernard Drevillon

Author(s): Bernard Kaplan; Bernard Drevillon

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