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Proceedings of SPIE Volume 4399

Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering
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Volume Details

Volume Number: 4399
Date Published: 3 October 2001
Softcover: 17 papers (146) pages
ISBN: 9780819440945

Table of Contents
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Use of endoscopes in pulsed digital holographic interferometry
Author(s): Giancarlo Pedrini; Staffan Schedin; I. Alexeenko; Hans J. Tiziani
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Digital holographic interferometry for characterization of transparent materials
Author(s): Pietro Ferraro; Sergio De Nicola; Andrea Finizio; Simonetta Grilli; Giovanni Pierattini
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Moire interferometry using stuck foil-embossed diffraction grating
Author(s): Jaroslav Vaclavik; Jiri Minster; Roman Houha
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In-line detection and evaluation of surface defects on thin metallic wires
Author(s): Juan Carlos Martinez-Anton; Philip Siegmann; Luis Miguel Sanchez-Brea; Eusebio Bernabeu; Jose Antonio Gomez-Pedrero; Hector A. Canabal
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Reflection grating method for 3D measurement of reflecting surfaces
Author(s): Marcus Petz; Reinhold Ritter
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Diode laser interferometer for surface profilometry with nanometer resolution on lateral dimensions in the centimeter range
Author(s): Karl Meiners-Hagen; Ahmed Abou-Zeid
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Shape and displacement determination based on extended spatio-temporal fringe pattern analysis
Author(s): Michal Emanuel Pawlowski; Malgorzata Kujawinska
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Integrated environment for the inspection of complex parts
Author(s): Sebastien Remy; Alain Bernard; Gabriel Ris
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Tool 3D geometry measurement system
Author(s): Huijie Zhao; Jun Ni; Yi Sun; Xuewen Lin
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Modified high-accuracy 3D shape data conversion system for reverse engineering applications
Author(s): Robert Sitnik; Malgorzata Kujawinska
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Prototype of a fiber optic sensor for quick measurement of fiber optic eccentricity
Author(s): Giulio D'Emilia
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Near-infrared linear birefringence measurement system using a photoelastic modulator
Author(s): Baoliang Bob Wang
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Applications of Fresnel diffraction from phase objects
Author(s): Mohammad Taghi Tavassoly; Ahmad Darudi; Hamid Reza Khalesifard; Seyed Mohammad Reza Sadat Hosseini
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Virtual moire interference approach for an industrial safety monitoring system
Author(s): Rida Hamza; Darren Cofer
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Virtual optical laboratory for speckle metrology
Author(s): Janos Kornis; Attila Nemeth; Zoltan Fuezessy
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Speckle interferometry for measurement of continuous deformations
Author(s): Wei An; Torgny E. Carlsson
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