Share Email Print
cover

Proceedings of SPIE Volume 4285

Testing, Reliability, and Applications of Optoelectronic Devices
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 4285
Date Published: 17 May 2001
Softcover: 28 papers (278) pages
ISBN: 9780819439635

Table of Contents
show all abstracts | hide all abstracts
Reliability assurance of broad-area high-power multimode laser diodes for telecommunications equipment
Author(s): D. R. Pendse; Aland K. Chin; D. Bull; J. Maider
Show Abstract
Diode laser illuminators for night-vision applications
Author(s): Jeffrey T. Remillard; Willes H. Weber; Timothy Fohl
Show Abstract
Comparison of improved operating parameters of five different wavelength LEDs for significantly brighter illumination
Author(s): Eduard K. Mueller; Susanne M. Lee; Brian C. Van de Workeen; Otward M. Mueller
Show Abstract
Integrated chip set for a pulsed time-of-flight laser radar
Author(s): Juha Tapio Kostamovaara; Antti Maentyniemi; Pasi J. M. Palojaervi; Tero Peltola; Tarmo Ruotsalainen; Elvi Raeisaenen-Ruotsalainen
Show Abstract
Novel delay-time tunable pulsed laser source
Author(s): Gong-Ru Lin; Yung-Cheng Chang
Show Abstract
Contact wire zigzag value detection in the electrified railway
Author(s): Xiaorong Gao
Show Abstract
Integrated LED-photodiode chemical sensor
Author(s): Jeng-Ya Yeh; Suwandi Rusli; Soraya Pornsuwan; Albena Ivanisevic; Anne-Marie Nickel; Arthur B. Ellis; Thomas F. Kuech; Luke J. Mawst
Show Abstract
Negative luminescence from InAsSbP-based diodes in the 4.0- to 4.3-um range
Author(s): Boris A. Matveev; Meyrhan Aydaraliev; Nonna V. Zotova; Sergey A. Karandashev; Maxim A. Remennyi; Nikolai M. Stus'; Georgii N. Talalakin; Volodymyr K. Malyutenko; Oleg Yu. Malyutenko
Coded IR proximity detector
Author(s): Tudor Zisu; Sorin Miclos
Highly reliable high-power 1480-nm pump lasers for EDFAs and Raman amplifiers
Author(s): Junji Yoshida; Naoki Tsukiji; Akinobu Nakai; Toru Fukushima; Akihiko Kasukawa
Reliability and performance of InGaAs broad-area lasers emitting between 910 and 980 nm
Author(s): Yao Zou; Erik P. Zucker; Kushant Uppal; Debbie L. Coblentz; Pamela X. Liang; Matthew G. Peters; Richard R. Craig
Show Abstract
Packaging and characterization equipment for high-power diode laser bars and VCSELs
Author(s): Konstantin Boucke; Juergen Jandeleit; Wolfgang Brandenburg; Andreas Ostlender; Peter Loosen; Reinhart Poprawe
Show Abstract
Fully functional integrated tunable and stabilized lasers and transmitters for DWDM applications
Author(s): Richard B. Bylsma; Leonard J. P. Ketelsen; David A. Ackerman; John E. Johnson; Kishore K. Kamath; E. J. Dean; Waleed A. Asous; J. Michael Geary; Eric Mak; David A. Snyder; J. W. Stayt; S. L. Broutin; M. A. Eshelman; Mark M. Meyers; S. P. Scrak; Robert L. Hartman; Thomas L. Koch
Show Abstract
High-density optoelectronic interconnect using micromachined spring arrays
Author(s): Christopher L. Chua; David K. Fork; Donald L. Smith
Show Abstract
80-Gb/s optical demultiplexing using modulators
Author(s): Niloy Choudhury; Mostafa A. El-Aasser; Niloy K. Dutta
Show Abstract
Metal-semiconductor-metal photodetectors
Author(s): Paul Raymond Berger
Show Abstract
Environmental acceleration factors of nonhermetic packaged AIGaAs LEDs
Author(s): Patricia F. Mead; Yubing Yang; Melody Burch; Patrick McCluskey; F. G. Johnson
Show Abstract
Radiation effects on optical fibers and amplifiers
Author(s): Robert G. Ahrens; James J. Jaques; Michael J. LuValle; David J. DiGiovanni; Robert S. Windeler
Show Abstract
Stable high-repetition-rate pulses from a fiber laser
Author(s): Niloy Choudhury; Anguel N. Nikolov; Niloy K. Dutta
Show Abstract
Thermal failure model and reliability tests of solar cells
Author(s): Xiankun Xin; Guang Ci Cao
Show Abstract
Rotating polarizer and rotating retarder plate polarimeters: comparison of performances
Author(s): Stefano Pelizzari; Luigi Rovati; C. De Angelis
Show Abstract

© SPIE. Terms of Use
Back to Top