Share Email Print

Proceedings of SPIE Volume 4103

Optical Diagnostic Methods for Inorganic Materials II
Editor(s): Leonard M. Hanssen
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 4103
Date Published: 11 October 2000
Softcover: 21 papers (198) pages
ISBN: 9780819437488

Table of Contents
show all abstracts | hide all abstracts
Evaluation of fused silica for DUV laser application by short-time diagnostics
Author(s): Wolfgang Triebel; Sylvia Bark-Zollmann; Christian Muehlig; Andreas Voitsch; Frank Coriand; Jochen Alkemper
Show Abstract
Further evaluation of the Exicor birefringence measurement system
Author(s): Baoliang Bob Wang
Show Abstract
Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 um using generalized ellipsometry
Author(s): Thomas E. Tiwald; Mathias Schubert
Show Abstract
Comparison of AC laser calorimeter measurements with FTIR measurements of superconductors
Author(s): Etsuo Kawate; Mitsuo Koguchi; Zhen Wang; Yoshinori Uzawa; Kohtaro Isida
Show Abstract
Infrared refractive index measurements using a new method
Author(s): Di Yang; Michael E. Thomas; William J. Tropf; Simon G. Kaplan
Show Abstract
Intercomparison of regular spectral transmittance and reflectance measurements with FTIR- and monochromator-based spectrophotometers
Author(s): Simon G. Kaplan; Leonard M. Hanssen; Edward A. Early; Maria E. Nadal
Show Abstract
Comparison and development of absorption peak determination algorithms for wavelength standards
Author(s): Changjiang Zhu; Leonard M. Hanssen
Show Abstract
Alternative methods of optical diagnostics in the field of standardization and metrology
Author(s): Boris I. Constantinov; Teodosie I. Pasechnic; Sergiu Sircu
Show Abstract
Angle-dependent absolute infrared reflectance and transmittance measurements
Author(s): Simon G. Kaplan; Leonard M. Hanssen
Show Abstract
Reflectometer for pseudo-Brewster angle spectrometry (BAIRS)
Author(s): Roy F. Potter
Show Abstract
Characterization of Si-on-insulator buried layers by FTIR and scatterometry
Author(s): Victor A. Yakovlev; Sylvie Bosch-Charpenay; Peter A. Rosenthal; Peter R. Solomon; Jiazhan Xu; John C. Stover; Maria J. Anc; Michael L. Alles
Show Abstract
Microscopic spectrophotometry applied to quasifractal gold particle clusters
Author(s): Jacob Jonsson; Juan Sotelo; Gunnar A. Niklasson; Arne Roos; Bengt Nilsson
Show Abstract
Anisotropy of paper: comparison of different laser tools
Author(s): Jean-Francis Bloch; Geraldine Champon
Show Abstract
Fourier transform spectrometer for thermal-infrared emissivity measurements near room temperatures
Author(s): Juntaro Ishii; Akira Ono
Show Abstract
Development of an adiabatic laser calorimeter
Author(s): Etsuo Kawate; Leonard M. Hanssen; Simon G. Kaplan; Raju V. Datla
Show Abstract
Measurement technique for obtaining the extraordinary-ray absorption coefficient of uniaxial crystals
Author(s): David H. Terry; Di Yang; Michael E. Thomas
Show Abstract
Mueller-polarimetry diagnostics method of synthetic ionite granule dimension distribution
Author(s): Sergey N. Savenkov; Evgen A. Oberemok; Vadim V. Danilov; Vladimir V. Tesolkin
Show Abstract
Near-grazing-angle reflectometry of absorbing media
Author(s): Antonio Jefersen de Deus Moreno; Alexandre V. Ghiner; Ritta Vitlina; Gregory I. Surdutovich; Antonio Carlos Pereira
Show Abstract
Testing the accuracy of a laser calorimeter by comparison with an FTIR
Author(s): Etsuo Kawate
Show Abstract
Ceramic surface polariton sensor
Author(s): Carl-Gustaf Ribbing; Oerjan Staaf
Show Abstract

© SPIE. Terms of Use
Back to Top