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Laser Interferometry X: Techniques and Analysis
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Softcover $105.00 * $105.00 *

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Volume Details

Volume Number: 4101
Date Published: 7 July 2000
Softcover: 64 papers (632) pages
ISBN: 9780819437464

Table of Contents
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Coordinate transform method for closed fringe analysis
Author(s): Zongtao Ge; Fumio Kobayashi; Shinichi Matsuda; Mitsuo Takeda
Radial in-plane interferometer for ESPI measurement
Author(s): Armando Albertazzi; Cesar Kanda; Maikon R. Borges; Frank Hrebabetzky
AFM scanning moire method for nanodeformation measurement
Author(s): Huimin Xie; Gin Boay Chai; Anand Krishna Asundi; Jin Yu; Yunguang Lu; Bryan Kok Ann Ngoi; Zhaowei Zhong; Satoshi Kishimoto
New phase-stepping algorithm based on the self-consistent concept
Author(s): Chunlong Wei; Mingyi Chen; Yingjie Yu; Hongwei Guo; Guodong Li
Effective error reduction method in phase-shifting interferometer
Author(s): Yingjie Yu; Chunlong Wei; Mingyi Chen; Hongwei Guo
Study of internal deformation fields in granular materials using 3D digital speckle x-ray flash photography
Author(s): Stephen G. Grantham; William G. Proud; Howell Timothy Goldrein; John E. Field
Distance measurements by three-beam optical feedback interferometry
Author(s): Thierry M. Bosch; Noel Servagent
Interferometer calibration: an approach with the virtual interferometer
Author(s): Alexander Bai; Frank Bitte; Horst Konstantin Mischo; Tilo Pfeifer

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