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PROCEEDINGS VOLUME 4101

Laser Interferometry X: Techniques and Analysis
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Volume Details

Volume Number: 4101
Date Published: 7 July 2000
Softcover: 64 papers (632) pages
ISBN: 9780819437464

Table of Contents
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Laser-diode phase-shifting interferometer applied to joint-transform correlator
Author(s): Takeshi Takahashi; Yukihiro Ishii
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Visualization of Berry spin-redirection phase in polarization interferometer with geometric shear
Author(s): Alexander V. Tavrov; Yoko Miyamoto; Tsutomu Kawabata; Mitsuo Takeda; Vladimir A. Andreev
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Spatio-temporal approach to shape and motion measurements of 3D objects
Author(s): Malgorzata Kujawinska; Michal Emanuel Pawlowski
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Evaluation of phase changes of interferograms during continuous deformations
Author(s): Torgny E. Carlsson; Wei An
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Coordinate transform method for closed fringe analysis
Author(s): Zongtao Ge; Fumio Kobayashi; Shinichi Matsuda; Mitsuo Takeda
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Choosing a phase-measurement algorithm for measurement of coated LIGO optics
Author(s): Katherine Creath
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Minimization of systematic errors in phase-shifting interferometry: evaluation of residuals
Author(s): Parameswaran Hariharan; Emily J. Pryputniewicz; Ryszard J. Pryputniewicz
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Distortion correction method for aspheric optical testing
Author(s): Joseph E. Hayden; Timothy S. Lewis
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Hybrid optical-computational methodology for studies and optimization of microelectronic components
Author(s): Cosme Furlong; Ryszard J. Pryputniewicz
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Radial in-plane interferometer for ESPI measurement
Author(s): Armando Albertazzi; Cesar Kanda; Maikon R. Borges; Frank Hrebabetzky
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Low-coherence videoholography for subsurface deformation measurements in layered objects
Author(s): Arne Kraft; Gerd Guelker; Klaus D. Hinsch; A. Eljarad
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Investigation of photorefractive properties of pure and dye-doped nematic liquid crystals for dynamic holography devices
Author(s): Janusz Parka
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Influence of unresolved speckles in interferometric phase measurements
Author(s): Ervin Kolenovic; Wolfgang Osten; Werner P. O. Jueptner
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Shadow moire method for the measurement of the source position in three-dimensional shearography
Author(s): Roger M. Groves; Stephen W. James; Ralph P. Tatam
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Shape measurement by source displacement in three-dimensional shearography
Author(s): Roger M. Groves; Stephen W. James; Ralph P. Tatam
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Estimation of inside stress of microcantilever: investigation of measuring principle using macro-model
Author(s): Yasuhiko Arai; Shunsuke Yokozeki
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AFM scanning moire method for nanodeformation measurement
Author(s): Huimin Xie; Gin Boay Chai; Anand Krishna Asundi; Jin Yu; Yunguang Lu; Bryan Kok Ann Ngoi; Zhaowei Zhong; Satoshi Kishimoto
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Optimization of plasma-deposited silicon oxinitride films for interferometric MOEMS applications
Author(s): Christophe Gorecki
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Submicrometric profilometry of nonrotationally symmetrical surfaces using the Ronchi test
Author(s): Santiago Royo; Josep Arasa; Jesus Caum
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High-resolution measurement of extended technical surfaces with scalable topometry
Author(s): Wolfgang Osten; Daniel Kayser; Thorsten Bothe; Werner P. O. Jueptner
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Improved fast white-light scanning profilometer
Author(s): Artur G. Olszak
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Three-dimensional profilometry using moire pattern projection
Author(s): Toru Yoshizawa; Takayoshi Yamaguchi; Masayuki Yamamoto; Yukitoshi Otani
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Novel aperture connection method for measurement of surface with rotation axis
Author(s): Mingyi Chen; Hongwei Guo; Weiming Cheng
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Fringe formation in a dual-beam symmetric illumination-observation TV holography system: an analysis
Author(s): Nandigana K. Krishna Mohan; Angelica Andersson; Mikael Sjoedahl; Nils-Erik Molin
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Polarization phase shifting in white-light interferometry
Author(s): S. Suja Helen; Mahendra P. Kothiyal; Rajpal S. Sirohi
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Compensation techniques in speckle interferometry
Author(s): Rajpal S. Sirohi; Baij Nath Gupta
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New phase-stepping algorithm based on the self-consistent concept
Author(s): Chunlong Wei; Mingyi Chen; Yingjie Yu; Hongwei Guo; Guodong Li
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Interferometry measurement of laser-induced plasma density and improvement
Author(s): Bangke Zheng; Paul Choon Keat Lee
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Optical processing of interference patterns
Author(s): Ventseslav Christov Sainov; Nikola Metchkarov; Valentin A. Kostov; Wolfgang Osten
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New algorithm insensitive to both translational and tilt phase-shifting error for phase-shifting interferometry
Author(s): Hongwei Guo; Mingyi Chen; Chunlong Wei
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Precise angle monitor based on the concept of pencil-beam interferometry
Author(s): Shinan Qian; Peter Z. Takacs
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Linear integer unconcerned phase-maps Fourier-transform profilometry by changing the angle of projection
Author(s): Jingang Zhong
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Effective error reduction method in phase-shifting interferometer
Author(s): Yingjie Yu; Chunlong Wei; Mingyi Chen; Hongwei Guo
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Heisenberg principle applied to fringe analysis
Author(s): Cesar A. Sciammarella; Federico M. Sciammarella
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Holographic interferometry and its application in brake vibration and noise analysis
Author(s): Mitchell M. Marchi; Fang Chen; Pat Harwood; R. Linder; Gordon M. Brown
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Particle analysis with digital holography
Author(s): Mike Adams; Thomas M. Kreis; Werner P. O. Jueptner
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Study of internal deformation fields in granular materials using 3D digital speckle x-ray flash photography
Author(s): Stephen G. Grantham; William G. Proud; Howell Timothy Goldrein; John E. Field
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Image formation in phase-shifting digital holography
Author(s): Ichirou Yamaguchi; Jun-ichi Kato; Sohgo Ohta; Junko Mizuno
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Distance measurements by three-beam optical feedback interferometry
Author(s): Thierry M. Bosch; Noel Servagent
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Real-time chirp control of an external-cavity semiconductor laser for absolute distance measurement
Author(s): Thierry M. Bosch; Noel Servagent
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Measurement and control of the bending of x-ray mirrors using speckle interferometry
Author(s): Pierre M. Jacquot; Massimo Facchini; Muriel Mattenet; Gerhard Gruebel
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Resolution improvements of the digital light-in-flight recording by holography method
Author(s): Bengt J.L. Nilsson; Torgny E. Carlsson
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New generation of optical extensometers based on grating (moire) interferometry
Author(s): Malgorzata Kujawinska; Leszek A. Salbut
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Surface strain characterization using time-division-multiplexed 3D shearography
Author(s): Stephen W. James; Roger M. Groves; Ralph P. Tatam
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Mechanical testing using digital speckle photography
Author(s): Per Synnergren; Mikael Sjoedahl
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Strain/displacement of a carabiner via interferometry
Author(s): Michael A. Walk
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Interferometry in the optics research group: an overview
Author(s): Hedser H. van Brug
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Shearography system for the testing of large-scale aircraft components taking into account noncooperative surfaces
Author(s): Wolfgang Osten; Michael K. Kalms; Werner P. O. Jueptner; Gustav Tober; Wolfgang Bisle; Dieter Scherling
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Indication of deformations on the surface of toroidal objects by an optoelectronic method
Author(s): Hans Rottenkolber; Werner P. O. Jueptner
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Optical techniques for the evaluation of thermo-functional gradients in human dentine
Author(s): Anil Kishen; Vadakke Matham Murukeshan; Anand Krishna Asundi
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Detection and compensation of misalignment for interferometric diagnostic tools applied in space-borne facilities
Author(s): Volker Kebbel; Hans-Juergen Hartmann; Werner P. O. Jueptner; Ulf Schnars; Laura Gatti; Joachim Becker
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Characterization of micro-optics using digital holography
Author(s): Volker Kebbel; Hans-Juergen Hartmann; Werner P. O. Jueptner
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Application of a Ronchi technique to quality control of ophthalmic surfacing
Author(s): Santiago Royo; Josep Arasa; Carlos Pizarro
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Model-based optimization of interferometers for testing aspherical surfaces
Author(s): Horst Konstantin Mischo; Tilo Pfeifer; Frank Bitte
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Interferometer calibration: an approach with the virtual interferometer
Author(s): Alexander Bai; Frank Bitte; Horst Konstantin Mischo; Tilo Pfeifer
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Characterization of MEMS microgears rotating up to 360,000 rpm by stroboscopic optoelectronic laser interferometry microscope (SOELIM) methodology
Author(s): Gordon C. Brown; Ryszard J. Pryputniewicz; Maarten P. DeBoer; Samuel L. Miller
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Combined 3D-shape and deformation analysis of small objects using coherent optical techniques on the basis of digital holography
Author(s): Soenke Seebacher; Torsten Baumbach; Wolfgang Osten; Werner P. O. Jueptner
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Diffraction strain sensor for micromeasurements
Author(s): Bing Zhao; Anand Krishna Asundi
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Digital microholointerferometry for microstructure studies
Author(s): Lei Xu; Xiaoyuan Peng; Jianmin Miao; Anand Krishna Asundi
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Computer-generated interferograms of symmetrical gas flows
Author(s): Igor Victorovic Ershov; Yuriy D. Babichev
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AC impedance-emission spectroscopy of determining the electrochemical behavior of anodized aluminum in aqueous solutions
Author(s): Khaled J. Habib; Sami J. Habib
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Three-dimensional profilometry with interference microscope using wavelength-to-depth encoding
Author(s): Guoqiang Li; Pang Chen Sun; Yeshaiahu Fainman; Paul C. Lin
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Sensing of earthquake precursors with laser interferometer
Author(s): Vadim K. Milyukov; Valentina V. Azarova; Yuri Goliaev; Tatiana I. Solovieva
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Determination of lasing material properties using laser interferometry and finite-element method
Author(s): Xiaoyuan Peng; Anand Krishna Asundi; Yihong Chen; Zhengjun Xiong; Gnian Cher Lim
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