### Proceedings of SPIE Volume 4100

Scattering and Surface Roughness IIIFormat | Member Price | Non-Member Price |
---|---|---|

Softcover | $105.00 * | $105.00 * |

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 4100

Date Published: 26 September 2000

Softcover: 23 papers (230) pages

ISBN: 9780819437457

Date Published: 26 September 2000

Softcover: 23 papers (230) pages

ISBN: 9780819437457

Table of Contents

show all abstracts |
hide all abstracts

Surface plasmon polariton propagation near an index step

Author(s): Tamara A. Leskova; Alexei A. Maradudin; Wolfgang Zierau

Author(s): Tamara A. Leskova; Alexei A. Maradudin; Wolfgang Zierau

Show Abstract

Scattering of electromagnetic waves from one-dimensionally rough surfaces containing surface resonant structures

Author(s): Arthur R. McGurn; Rosa A. Fitzgerald; Granville Sewell

Author(s): Arthur R. McGurn; Rosa A. Fitzgerald; Granville Sewell

Show Abstract

Small slope approximation method: scattering of a vector wave from 2D dielectric and metallic surfaces with Gaussian and non-Gaussian statistics

Author(s): Bruno Chevalier; Gerard Berginc

Author(s): Bruno Chevalier; Gerard Berginc

Show Abstract

Light scattering resonances in arbitrarily shaped one-dimensional reentrant surfaces

Author(s): Pedro Negrete-Regagnon; Rafael Hernandez-Walls; Victor Ruiz-Cortes

Author(s): Pedro Negrete-Regagnon; Rafael Hernandez-Walls; Victor Ruiz-Cortes

Show Abstract

Effective impedance boundary condition for the coherent scattering of light from a one-dimensional randomly rough surface

Author(s): Tamara A. Leskova; Alexei A. Maradudin

Author(s): Tamara A. Leskova; Alexei A. Maradudin

Show Abstract

Numerical study of an inverse scattering algorithm for perfectly conducting one-dimensional surfaces

Author(s): Demetrio Macias; Eugenio R. Mendez; Victor Ruiz-Cortes

Author(s): Demetrio Macias; Eugenio R. Mendez; Victor Ruiz-Cortes

Show Abstract

Wavelength dependence of the light scattered from a dielectric film deposited on a metal substrate

Author(s): Ingve Simonsen; Tamara A. Leskova; Alexei A. Maradudin; Ola D. Hunderi

Author(s): Ingve Simonsen; Tamara A. Leskova; Alexei A. Maradudin; Ola D. Hunderi

Show Abstract

Amplified backscattering from dye-doped polymer bounded with 1D rough metal film

Author(s): Gang-Ding Peng; Zu-Han Gu

Author(s): Gang-Ding Peng; Zu-Han Gu

Show Abstract

Simulation of the optical behavior of rough identical multilayers

Author(s): Isabelle Icart; Didier Arques

Author(s): Isabelle Icart; Didier Arques

Show Abstract

Modeling of surface roughness: application to physical properties of paper

Author(s): Jean-Francis Bloch; Marc Butel

Author(s): Jean-Francis Bloch; Marc Butel

Show Abstract

Band-limited uniform diffuser in transmission

Author(s): Tamara A. Leskova; Alexei A. Maradudin; Eugenio R. Mendez; Ingve Simonsen

Author(s): Tamara A. Leskova; Alexei A. Maradudin; Eugenio R. Mendez; Ingve Simonsen

Show Abstract

Numerical study of the resolution in a model near-field optical microscope

Author(s): Claudio I. Valencia; Eugenio R. Mendez

Author(s): Claudio I. Valencia; Eugenio R. Mendez

Show Abstract

Light scattering by periodic roughness at dielectric surface

Author(s): Vitali E. Gruzdev; Anastasia S. Gruzdeva

Author(s): Vitali E. Gruzdev; Anastasia S. Gruzdeva

Show Abstract

Design problems of a calibrated BRDF sensor with respect to dynamic range, speed, and large angle of view

Author(s): Thomas Rinder; Hendrik Rothe; Andre Kasper

Author(s): Thomas Rinder; Hendrik Rothe; Andre Kasper

Show Abstract

Polarized light-scattering measurements of polished and etched steel surfaces

Author(s): Thomas A. Germer; Thomas Rinder; Hendrik Rothe

Author(s): Thomas A. Germer; Thomas Rinder; Hendrik Rothe

Show Abstract

AFM data analysis: separating surface microtopography from instrumental artifacts

Author(s): Dorothee Hueser; Hendrik Rothe

Author(s): Dorothee Hueser; Hendrik Rothe

Show Abstract

Rapid detection of surface defects by x-ray scanning

Author(s): Vladimir V. Protopopov; Kamil A. Valiev; Rafik M. Imamov

Author(s): Vladimir V. Protopopov; Kamil A. Valiev; Rafik M. Imamov

Show Abstract

In-process characterization of surface topography changes during nitration

Author(s): Andreas Ciossek; Peter Lehmann; Stefan Patzelt; Gert Goch

Author(s): Andreas Ciossek; Peter Lehmann; Stefan Patzelt; Gert Goch

Show Abstract

Measuring surface roughness in transmission geometry

Author(s): Vladimir K. Ignatovich

Author(s): Vladimir K. Ignatovich

Show Abstract

Conformal mapping approximation to scattering from surfaces with Koch corrugation

Author(s): Mario Marcelo Lehman; Diana Calva Mendez

Author(s): Mario Marcelo Lehman; Diana Calva Mendez

Show Abstract

Modeling anisotropic scattering surfaces in illumination software

Author(s): Eric C. Fest; David G. Jenkins

Author(s): Eric C. Fest; David G. Jenkins

Show Abstract

Development problems of a nanometer coordinate measuring machine (NCMM)

Author(s): Ralph Petersen; Hendrik Rothe

Author(s): Ralph Petersen; Hendrik Rothe

Show Abstract

**© SPIE.**Terms of Use