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Proceedings of SPIE Volume 4100

Scattering and Surface Roughness III
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Volume Details

Volume Number: 4100
Date Published: 26 September 2000
Softcover: 23 papers (230) pages
ISBN: 9780819437457

Table of Contents
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Surface plasmon polariton propagation near an index step
Author(s): Tamara A. Leskova; Alexei A. Maradudin; Wolfgang Zierau
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Scattering of electromagnetic waves from one-dimensionally rough surfaces containing surface resonant structures
Author(s): Arthur R. McGurn; Rosa A. Fitzgerald; Granville Sewell
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Small slope approximation method: scattering of a vector wave from 2D dielectric and metallic surfaces with Gaussian and non-Gaussian statistics
Author(s): Bruno Chevalier; Gerard Berginc
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Light scattering resonances in arbitrarily shaped one-dimensional reentrant surfaces
Author(s): Pedro Negrete-Regagnon; Rafael Hernandez-Walls; Victor Ruiz-Cortes
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Effective impedance boundary condition for the coherent scattering of light from a one-dimensional randomly rough surface
Author(s): Tamara A. Leskova; Alexei A. Maradudin
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Numerical study of an inverse scattering algorithm for perfectly conducting one-dimensional surfaces
Author(s): Demetrio Macias; Eugenio R. Mendez; Victor Ruiz-Cortes
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Wavelength dependence of the light scattered from a dielectric film deposited on a metal substrate
Author(s): Ingve Simonsen; Tamara A. Leskova; Alexei A. Maradudin; Ola D. Hunderi
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Wolf effect from a real image as a secondary source
Author(s): Zong Qi Lin; Zu-Han Gu
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Amplified backscattering from dye-doped polymer bounded with 1D rough metal film
Author(s): Gang-Ding Peng; Zu-Han Gu
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Simulation of the optical behavior of rough identical multilayers
Author(s): Isabelle Icart; Didier Arques
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Modeling of surface roughness: application to physical properties of paper
Author(s): Jean-Francis Bloch; Marc Butel
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Band-limited uniform diffuser in transmission
Author(s): Tamara A. Leskova; Alexei A. Maradudin; Eugenio R. Mendez; Ingve Simonsen
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Numerical study of the resolution in a model near-field optical microscope
Author(s): Claudio I. Valencia; Eugenio R. Mendez
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Light scattering by periodic roughness at dielectric surface
Author(s): Vitali E. Gruzdev; Anastasia S. Gruzdeva
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Design problems of a calibrated BRDF sensor with respect to dynamic range, speed, and large angle of view
Author(s): Thomas Rinder; Hendrik Rothe; Andre Kasper
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Polarized light-scattering measurements of polished and etched steel surfaces
Author(s): Thomas A. Germer; Thomas Rinder; Hendrik Rothe
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AFM data analysis: separating surface microtopography from instrumental artifacts
Author(s): Dorothee Hueser; Hendrik Rothe
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Rapid detection of surface defects by x-ray scanning
Author(s): Vladimir V. Protopopov; Kamil A. Valiev; Rafik M. Imamov
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In-process characterization of surface topography changes during nitration
Author(s): Andreas Ciossek; Peter Lehmann; Stefan Patzelt; Gert Goch
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Measuring surface roughness in transmission geometry
Author(s): Vladimir K. Ignatovich
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Conformal mapping approximation to scattering from surfaces with Koch corrugation
Author(s): Mario Marcelo Lehman; Diana Calva Mendez
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Modeling anisotropic scattering surfaces in illumination software
Author(s): Eric C. Fest; David G. Jenkins
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Development problems of a nanometer coordinate measuring machine (NCMM)
Author(s): Ralph Petersen; Hendrik Rothe
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