Share Email Print
cover

Proceedings of SPIE Volume 3826

Polarization and Color Techniques in Industrial Inspection
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 3826
Date Published: 16 September 1999
Softcover: 30 papers (324) pages
ISBN: 9780819433121

Table of Contents
show all abstracts | hide all abstracts
Estimation of surface inclination by analysis of diffraction and polarization
Author(s): Volker Mueller
Show Abstract
Material model for physically based rendering
Author(s): Mathieu Robart; Mathias Paulin; Rene Caubet
Show Abstract
Inferring 3D scene structure from a single polarization image
Author(s): Stefan Rahmann
Show Abstract
Nonsegmenting defect detection and SOM-based classification for surface inspection using color vision
Author(s): Hannu Kauppinen; Hannu Rautio; Olli Silven
Show Abstract
Colored guest-host liquid crystal displays
Author(s): Danuta Bauman; Krzysztof Kozlowski
Show Abstract
Methods for detecting compression wood in green and dry conditions
Author(s): Jan Nystrom; Olle Hagman
Show Abstract
Improving results of a simple RGB model for cameras using estimation
Author(s): J. Birgitta Martinkauppi
Show Abstract
Online devices and measuring systems for the automatic control of newspaper printing
Author(s): Elzbieta A. Marszalec; Ismo Heikkila; Helene Juhola; Tapio Lehtonen
Show Abstract
Online color monitoring
Author(s): Robert Charles Massen
Show Abstract
Counting colored objects using highlights
Author(s): Henryk Palus
Show Abstract
Multichannel sensors in thin film technology
Author(s): Helmut Stiebig; Patrick G. Herzog; Dietmar Knipp; Friedhelm Koenig
Show Abstract
Visual inspection by spectral features in the ceramics industry
Author(s): Saku Kukkonen; Heikki A. Kalviainen; Jussi P. S. Parkkinen
Show Abstract
Characterization of flotation color by machine vision
Author(s): Ari Siren
Show Abstract
Autonomous physics-based color learning under daylight
Author(s): Yves Berube Lauziere; Denis J. Gingras; Frank P. Ferrie
Show Abstract
Non-euclidean structure of spectral color space
Author(s): Reiner Lenz; Peter Meer
Show Abstract
Making saturated facial images useful again
Author(s): Maricor N. Soriano; Elzbieta A. Marszalec; J. Birgitta Martinkauppi; Matti Pietikaeinen
Show Abstract
Texture and color features for tile classification
Author(s): Ramon Baldrich; Maria Vanrell; Juan Jose Villanueva
Show Abstract
Model-based daylight- and chroma-adaptive segmentation method
Author(s): Hans Jorgen Andersen; Erik Granum; C. M. Onyango
Show Abstract
Woodmetrics: imaging devices and processes in wood inspection at Lulea University of Technology
Author(s): Olle Hagman
Show Abstract
Color space quantization for inspection of textured objects
Author(s): A. Lynn Abbott; Yuedong Zhao
Show Abstract
Color metric for production quality control
Author(s): Anthony J. McCollum; Andrew K. Forrest
Show Abstract
Adaptive modeling color measurement errors
Author(s): Guoping Qiu; Hsiao-Pei Lee; Ming Ronnier Luo
Show Abstract
Perfect color constancy vs. color normalization for object recognition
Author(s): Graham D. Finlayson; Gui Yun Tian
Show Abstract
Recovering the spectral distribution of the illumination from spectral data by highlight analysis
Author(s): Harro M.G. Stokman; Theo Gevers
Show Abstract
Industrial measurement of birefringence of optical components
Author(s): Peter Kohns
Show Abstract
Visual classification of materials using the Stokes vector
Author(s): Bojian Liang; Andrew M. Wallace; Emanuele Trucco
Show Abstract
Fast and accurate measurement of liquid crystal tilt bias angle with the ELDIM EZContrast system
Author(s): Olivier Moreau; Thierry R. Leroux
Show Abstract
Using a commercially produced liquid crystal display as a polarization filter
Author(s): Susan L. Blakeney; Sally E. Day; J. Neil Stewart
Show Abstract
Using polarization to determine intrinsic surface properties
Author(s): Ondfej Drbohlav; Radim Sara
Show Abstract
Polarization-based fiber optic smart structures
Author(s): Tomasz R. Wolinski; Witold Konopka; Andrzej W. Domanski
Show Abstract

© SPIE. Terms of Use
Back to Top