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Proceedings of SPIE Volume 3784

Rough Surface Scattering and Contamination
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Volume Details

Volume Number: 3784
Date Published: 25 October 1999
Softcover: 39 papers (412) pages
ISBN: 9780819432704

Table of Contents
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NASA's Space Environments and Effects (SEE) program: contamination engineering technology development
Author(s): Steven D. Pearson; K. Stuart Clifton
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Satellite contamination and materials outgassing effects databases
Author(s): Bob E. Wood; B. David Green; O. Manuel Uy; Russell Paul Cain; Jason Thorpe
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Predicting temperature increases on the GOES imager and sounder radiant coolers
Author(s): Jack T. Sanders; Robert R. Gorman; Michael S. Woronowicz
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Application of general sticking coefficient models to spacecraft contamination analysis
Author(s): Chien W. Chang
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Preventing molecular and particulate infiltration in a confined volume
Author(s): John J. Scialdone
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Spray cleaning with hydrofluorocarbon solutions
Author(s): Robert Kaiser; Ryan S. Miller; Jeremy T. Cardin
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Consequences of atomic oxygen interaction with silicone and silicone contamination on surfaces in low earth orbit
Author(s): Bruce A. Banks; Kim K. de Groh; Sharon K. Miller; Christy Anne Haytas
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Optical Properties Monitor (OPM) in-situ experiment flown on the Mir station
Author(s): Donald R. Wilkes; James M. Zwiener
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Quartz crystal particle microbalance (QCPM)
Author(s): Daniel McKeown; William E. Corbin; Marvin G. Fox
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Sticky quartz crystal microbalance as a particle monitor
Author(s): O. Manuel Uy; Russell Paul Cain; Bliss G. Carkhuff; Andrew M. Lennon
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Tests of the sensitivity and mass range of a 50-MHz quartz crystal microbalance (QCM)
Author(s): Scott A. Wallace; Donald A. Wallace; Bob E. Wood
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Reflectivity of black-chromium coating at a wavelength of 121.6 nm
Author(s): Kamil A. Moldosanov
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Characterization of surfaces using neural pattern recognition methods based on BRDF and AFM measurements
Author(s): Thomas Rinder; Hendrik Rothe
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Optical surface profilometry in China
Author(s): Deyan Xu; Weixing Shen
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In-process roughness characterization of specularly reflecting surfaces using doubly scattered light
Author(s): Peter Lehmann
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Derivation of BRDF data from smooth surface topography of large AFM scans: investigation of the influences of surface figures and AFM artifacts
Author(s): Hendrik Rothe; Dorothee Hueser; Andre Kasper; Thomas Rinder
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Analysis of the surface of human skin
Author(s): Christoph Hof; Reinhart A. Lunderstaedt
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Three-dimensional topography measurement with triangular beam scanning technique
Author(s): Jianfeng Jiang; Yonghui He; Wansheng Zhao
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Noncontact high-precision surface 3D profiler
Author(s): Jianfeng Jiang; Yonghui He; Wansheng Zhao
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One- and two-dimensionally rough-surface radar backscatter cross section based on a stationary two-scale full-wave approach
Author(s): Ezekiel Bahar; Paul E. Crittenden
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Tilt-invariant approximation for the admittance operator in the rough-surface scattering theory
Author(s): Mikhail I. Charnotskii
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Small slope approximation method: higher-order contributions for scattering from conducting 3D surfaces
Author(s): Gerard Berginc; Yannick Beniguel; Bruno Chevalier
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Angular intensity correlation functions C^(1) and C^(10) for the scattering of S-polarized light from a 1D randomly rough dielectric surface
Author(s): Ingve Simonsen; Alexei A. Maradudin; Tamara A. Leskova
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Inverse relationship between surface brightness and polarization
Author(s): Walter G. Egan
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Modification of the Maxwell-Beard bidirectional reflectance distribution function
Author(s): Wendy C. Shemano; William F. Lynn; Dave Shemano; Thomas A. Davis
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Coherent and incoherent scattering from rough surfaces: influence of the angle of incidence
Author(s): Stephane Mainguy; Brigitte Pouligny
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Bidirectional reflectance from pigmented coatings
Author(s): Peter N. Raven; Rupert M. J. Watson; John W. Williams; Paul E. Y. Milne
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Amplified backscattering from a rough surface through dye-doped polymer
Author(s): Gang-Ding Peng; Zu-Han Gu
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Dynamic behavior of speckles from rough surface scattering
Author(s): Zu-Han Gu; Arthur R. McGurn
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Polarization of light scattered by spheres on a dielectric film
Author(s): Lipiin Sung; George W. Mulholland; Thomas A. Germer
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Multidetector hemispherical polarized optical scattering instrument
Author(s): Thomas A. Germer
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Surface etch-front morphologies using in-plane light scattering
Author(s): Yiping -P. Zhao; G. -C. Wang; Toh-Ming Lu
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Symmetry of speckle correlation around the backscattering directions in the double passage configurations
Author(s): Zu-Han Gu
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Use of Fresnel diffraction for the measurement of rotational symmetrical workpieces
Author(s): Hans Kurt Toenshoff; Andreas Tuennermann; Joern Korthals
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High-temperature attempts using real-time two-color laser speckle-shift strain-measurement system
Author(s): Meg L. Tuma; Lawrence C. Greer; Lawrence G. Oberle; Wendy Turkuc
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Application of surface-enhanced Raman scattering spectroscopy to the study of insect virus virion
Author(s): PeiDi Bao; XinMing Liu; TianQuan Huang; Bing Jiang; GuoFeng Wu
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Differential intensity detection of surface defect scattering
Author(s): Byong Chon Park; Yun Woo Lee; Beomhoan O
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Application of forward-angle light scattering to measured flocculation point of asphaltenes and evaluation of flocks dimensions
Author(s): Hector M. Gutierrez; Alberto Fernandez; Sonia Goncalves Abreu; Jimmy A. Castillo; Jannett Hung
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Spectroscopic studies of asphaltenes
Author(s): Sonia Goncalves Abreu; Jannett Hung; Hector M. Gutierrez; Alberto Fernandez; Jimmy A. Castillo
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