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PROCEEDINGS VOLUME 3754

Polarization: Measurement, Analysis, and Remote Sensing II
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Volume Details

Volume Number: 3754
Date Published: 25 October 1999
Softcover: 45 papers (436) pages
ISBN: 9780819432407

Table of Contents
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Eigenvalue parameters for surface roughness studies
Author(s): Shane R. Cloude
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Depolarization
Author(s): Russell A. Chipman
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Nonideal polarizers
Author(s): John R. Johnson
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Entropy of scattered field correlations by chiral spheroids
Author(s): Barry P. Ablitt; Keith I. Hopcraft; Eric Jakeman
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Stochastic aspects of the unified polarization calculus
Author(s): Aakhut Em Bak; Charles S. Brown
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Beam wander considerations in imaging polarimetry
Author(s): Matthew H. Smith; Jacob B. Woodruff; James D. Howe
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Measurement of polarization fluctuations in polydispersions of small spheroids
Author(s): Mark C. Pitter; Keith I. Hopcraft; Eric Jakeman; John G. Walker
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General Lorentz transformation and its application to deriving and evaluating the Mueller matrices of polarization optics
Author(s): Charles S. Brown; Aakhut Em Bak
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Thermal emission polarization
Author(s): Lawrence B. Wolff; Andrew Lundberg; Renjie Tang
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Correlation of Fresnel's interface reflection coefficients of external and internal reflection at the same angle of incidence for dielectric-dielectric interfaces
Author(s): Rasheed M. A. Azzam
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Infrared polarimetry using attenuated total reflection
Author(s): Lynn L. Deibler; Matthew H. Smith
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Imaging polarimetry in scene element discrimination
Author(s): Michael J. Duggin
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Measurements of midwave and longwave infrared polarization from water
Author(s): Joseph A. Shaw; Michael R. Descour; Derek S. Sabatke; John Phillips Garcia; Eustace L. Dereniak
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Polarimetric characterization of Spectralon
Author(s): Dennis H. Goldstein; David B. Chenault; J. Larry Pezzaniti
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Multispectral infrared Stokes imaging polarimeter
Author(s): Matthew H. Smith; James D. Howe; Jacob B. Woodruff; Miranda A. Miller; George R. Ax; Thomas E. Petty; Elizabeth A. Sornsin
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Return-path polarimeter for two-dimensional birefringence distribution measurement
Author(s): Michael I. Shribak; Yukitoshi Otani; Toru Yoshizawa
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Polarization Michelson interferometer: principles and applications
Author(s): Rasheed M. A. Azzam
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Compact solid polarization phase-shifting Mach-Zehnder interferometer
Author(s): Patrick J. Reardon; Jeff L. Howard; Greg Lawson; Alexander McPherson; Mark E. Wells
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Research Scanning Polarimeter: calibration and ground-based measurements
Author(s): Brian Cairns; Edgar E. Russell; Larry D. Travis
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Industrial applications of a high-sensitivity linear birefringence measurement system
Author(s): Baoliang Bob Wang; Theodore C. Oakberg; Paul Kadlec
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Dark-target retroreflection increase
Author(s): Walter G. Egan
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Relative variation of stress-optic coefficient with wavelength in fused silica and calcium fluoride
Author(s): Theodore C. Oakberg
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Computed-tomography imaging spectropolarimeter (CTISP): instrument concept, calibration, and results
Author(s): Brian H. Miles; Ricky A. Goodson; Eustace L. Dereniak; Michael R. Descour
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Infrared parallel-slab division-of-amplitude photopolarimeter
Author(s): Aed M. El-Saba; Rasheed M. A. Azzam; Mustafa A. G. Abushagur; Christopher L. Centamore; Allison Leigh Arp
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Diffractive-optical-element-based photopolarimeter
Author(s): Aed M. El-Saba; Mustafa A. G. Abushagur
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Comparison of visible and infrared backscattering Mueller matrices from roughened aluminum surfaces
Author(s): Gareth D. Lewis; David L. Jordan; Scott D. Niven
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Field-of-view analysis of liquid crystal polymer polarizing elements
Author(s): Marko S. Voitel; Kristina M. Johnson; Michael B. Robinson
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FT-IR-based ellipsometer using high-quality Brewster-angle polarizers
Author(s): Simon G. Kaplan; Leonard M. Hanssen
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Calibration of the Hyperspectral Imaging Polarimeter
Author(s): James Q. Peterson; Gary L. Jensen; Mark E. Greenman; Joseph A. Kristl
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Interaction between polarization and response vs. scan angle in the calibration of imaging radiometers
Author(s): Edward J. Knight; Cindy Merrow; Chad Salo
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Modeling of polarized light scattering in cirrus clouds: validation with in-situ measurements and ADEOS-POLDER reflectance observations
Author(s): Laurent C. Labonnote; Gerard Brogniez; Jean-Francois Gayet; Jean-Claude Buriez; Marie Doutriaux-Boucher
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Anomalous inversion of polarization of icy satellites and Saturn rings: superdiamagnetic model
Author(s): Sergey V. Girich; Vladimir A. Tchernyi; Andrew Yury Pospelov
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Design and analysis of a beam splitter for the equipartition of infrared input power
Author(s): Aed M. El-Saba; Rasheed M. A. Azzam
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Arbitrary-to-arbitrary polarization controller using nematic liquid crystals
Author(s): Zhizhong Zhuang; Seong-Woo Suh; Jayantilal S. Patel
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Jones matrix analysis of optical path in virtual coordinate measurement by laser tracking
Author(s): Yongdong Liu; Jia Wang; Jinwen Liang
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Polarization effects on image quality of optical systems with high numerical apertures
Author(s): Nikolay B. Voznesensky; Alexander V. Belozubov
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Mueller matrix analysis for some classes of objects: number of independent parameters
Author(s): Sergey N. Savenkov; Konstantin E. Yushtin
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Calibration of the multispectral polarimeter and its measurements of atmospheric aerosols
Author(s): Masayoshi Yasumoto; Sonoyo Mukai; Itaru Sano; Hirosi Ishida; Tsutomu Takashima
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Global aerosol distribution based on multidirectional data given by POLDER
Author(s): Itaru Sano; Sonoyo Mukai; Yasuhiko Okada
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Analysis of four-port optical fiber ring resonator with 3x3 fused taper bow-tie optical fiber coupler
Author(s): Rongsheng Chen; Qin Geng Li; Qing Cai; Guosheng Wei
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Depolarization ratio of zenith scattered radiation and measured NO2 slant columns
Author(s): Ivan K. Kostadinov; Giorgio Giovanelli; Fabrizio Ravegnani; Daniele Bortoli; Andrea Petritoli
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Improving the polarization correction algorithm of GOME (Global Ozone Monitoring Experiment)
Author(s): Nick A. J. Schutgens; Piet Stammes
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Diffractive optical element for Stokes vector measurement with a focal plane array
Author(s): Gregory P. Nordin; Jeffrey T. Meier; Panfilo C. Deguzman; Michael W. Jones
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Performance limitations of a four-channel polarimeter in the presence of detection noise
Author(s): Victor L. Gamiz; John F. Belsher
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Calibration procedures for a two-modular generalized ellipsometer
Author(s): Gerald E. Jellison; Frank A. Modine; Chi Chen
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