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Proceedings of SPIE Volume 3652

Machine Vision Applications in Industrial Inspection VII
Editor(s): Kenneth W. Tobin; Ning S. Chang
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Volume Details

Volume Number: 3652
Date Published: 8 March 1999
Softcover: 28 papers (272) pages
ISBN: 9780819431233

Table of Contents
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IR-based system for short-circuit detection during copper electrorefining process
Author(s): Esa Makipaa; Juha T. Tanttu; Henri Virtanen
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Industrial web inspection for manufacturing process understanding and control
Author(s): Wenyuan Xu; Steven P. Floeder
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Depth measurement of moving slurry at the wet end of a paper machine
Author(s): James S. Goddard; Hamed Sari-Sarraf; John C. Turner; Martin A. Hunt; Besma R. Abidi
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Two practical ways to avoid spurious reflections from shiny surfaces on a 3D machine vision inspection system
Author(s): Daoshan Yang; Jihong Chen; Huicheng Zhou; Shawn Buckley
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Online defects localization on mirrorlike surfaces
Author(s): Gaetan Delcroix; Denis Aluze; Fred Merienne; Bernard Lamalle; Patrick Gorria
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Using machine vision to estimate bird weight in the poultry industry
Author(s): Roberto Alencar Lotufo; Miguel Taube-Netto; Eduardo Conejo; Francisco Javier de Hoyos
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Novel illumination compensation algorithm for industrial inspection
Author(s): Shang-Hong Lai; Ming Fang
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Real-time vision system for defect detection and neural classification of web textile fabric
Author(s): Panagiotis Mitropoulos; Christos Koulamas; Radovan D. Stojanovic; Stavros Koubias; George D. Papadopoulos; George Karayanis
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Method of searching segmentation parameters applied to quality control of industrial pieces
Author(s): Pierre Geveaux; Sophie Kohler; Johel Miteran; Frederic Truchetet
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Automated optical passive alignment technique for PLC modules
Author(s): Yutaka Nakamura; Hitoshi Komoriya; Takao Hirahara; Tetsuo Koezuka
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Application of vision systems for color and appearance measurements in industrial inspection
Author(s): Alex M. Mumzhiu
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Automatic evaluation of the appearance of seam puckers on suits
Author(s): Tsunehiro Aibara; Takehiro Mabuchi; Kenji Ohue
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Imaging tristimulus colorimeter for the evaluation of color in printed textiles
Author(s): Martin A. Hunt; James S. Goddard; Kathy W. Hylton; Thomas P. Karnowski; Roger K. Richards; Marc L. Simpson; Kenneth W. Tobin; Dale A. Treece
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Robot bicolor system
Author(s): Kazuo Yamaba
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Real-time quality evaluation of pork hams by color machine vision
Author(s): Damien Legeard; Pascale Marty-Mahe; Jean Camillerapp; Philippe Marchal; Claude Leredde
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Real-time detection of appearance defects of turkey carcasses by color histogram analysis
Author(s): Guillaume Raffy; Pascale Marty-Mahe; Michel Ollivier; Philippe Marchal
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FLASH system for fast and accurate pattern localization
Author(s): Shang-Hong Lai; Ming Fang
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3D range image surface description via least squares surface fitting
Author(s): Songtao Li; Dongming Zhao; Jin Deng
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Image retrieval in the industrial environment
Author(s): Kenneth W. Tobin; Thomas P. Karnowski; Regina K. Ferrell
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Configurable hardware for image segmentation
Author(s): Scott Burdette Anderson; Philip P. Dang; Paul M. Chau
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Improving the processing speed of an optoelectronic morphological industrial inspection processor
Author(s): Haisong Liu; Minxian Wu; Guofan Jin; Qingsheng He; Yingbai Yan
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From CAD to geons: a simplified data representation for rapid indexing of large CAD models database
Author(s): Normand Gregoire; Richard Lepage; Tanneguy Redarce
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Vergence control system for stereo depth recovery
Author(s): Luis Miguel Jimenez; Oscar Reinoso; Rafael Aracil; Fernando Torres-Medina; Jose M. Sebastian y Zuniga
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Multiresolution texture analysis applied to road surface inspection
Author(s): Stephane Paquis; Vincent Legeay; Hubert Konik; Jean Charrier
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3D inspection system for manufactured machine parts
Author(s): David Garcia; Jose M. Sebastian y Zuniga; Francisco M. Sanchez Moreno; Luis Miguel Jimenez; J. M. Gonzalez
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Automatic inspection of the printing on soft drink cans by image processing analysis
Author(s): Catherine W. Ni
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Submicron defect detection by SEMSpec: an e-beam wafer inspection system
Author(s): Ning S. Chang
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SmART: Adaptive grayscale search tools for alignment and registration
Author(s): Thomas F. Hospod
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