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Proceedings of SPIE Volume 3636

Flat Panel Display Technology and Display Metrology
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Volume Details

Volume Number: 3636
Date Published: 12 April 1999
Softcover: 27 papers (258) pages
ISBN: 9780819431073

Table of Contents
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Polycrystalline thin-film transistors on plastic substrates
Author(s): Paul G. Carey; Patrick M. Smith; Steven D. Theiss; Paul Wickboldt; Thomas W. Sigmon
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Front panel engineering with CAD simulation tool
Author(s): Jacques Delacour; Serge Ungar; Gilles Mathieu; Guenther Hasna; Pascal Martinez; Jean-Christophe Roche
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VGA active-matrix OLED displays having the single polysilicon TFT pixel structure
Author(s): Miltiadis K. Hatalis; Mark J. Stewart; Robert S. Howell; Leo Pires; Webster E. Howard; Olivier Prache
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Compliant substrates for thin-film transistor backplanes
Author(s): Sigurd Wagner; Helena Gleskova; Eugene Y. Ma; Zhigang Suo
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High-resolution direct-view displays based on the biological photochromic material bacteriorhodopsin
Author(s): Norbert A. Hampp; Markus Sanio; Klaus Anderle
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Diffractive color separation filter for high-efficiency LCD panels
Author(s): Peter S. Erbach; Gregg T. Borek; David R. Brown; Thomas V. Gunn
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Scanner design and resolution trade-offs for miniature scanning displays
Author(s): Hakan Urey; David W. Wine; John R. Lewis
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Surface plasmon tunable filters and flat panel display device
Author(s): Yu Wang
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Thin-film EL phosphor development
Author(s): Wusheng Tong
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Trap states in electroluminescent SrS:Cu phosphor thin films using thermally stimulated luminescence
Author(s): David C. Morton; Eric W. Forsythe; Sey-Shing Sun
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Protectively coated phosphors
Author(s): Guillermo R. Villalobos; Shyam S. Bayya; Jasbinder Singh Sanghera; Ishwar D. Aggarwal
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Highly efficient phosphors and phospher screens for FED displays
Author(s): E. Tim Goldburt; V. A. Bolchouchine; B. N. Levonovitch; N. P. Sochtine
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Development of standards for characterization of cathodoluminescence efficiency
Author(s): Lauren E. Shea; Robert J. Walko
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Nanocrystalline phosphors for field emission displays
Author(s): Banahalli R. Ratna; A. D. Dinsmore; Y. Tian; David S.Y. Hsu; Henry F. Gray
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Thin CRT display design and performance
Author(s): Theodore S. Fahlen
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Low-voltage vertical multilayer thin-film-edge FEA for field emitter displays
Author(s): David S.Y. Hsu; Henry F. Gray
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Flashover performance of thin-wall spacers in field emission displays
Author(s): Xianyun Ma; Tangali S. Sudarshan
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Color calibration of liquid crystal displays
Author(s): Albert N. Cazes; Gordon W. Braudaway; James Christensen; Michael Cordes; Don DeCain; Shui-Chih A. Lien; Frederick C. Mintzer; Steven L. Wright
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NIST calibration facility for display colorimeters
Author(s): Steven W. Brown; Yoshihiro Ohno
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LCD visual performance: characterization and evaluation
Author(s): Michael E. Becker
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Simulated-eye-design camera for high-contrast measurements
Author(s): Edward F. Kelley
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New uniformity measurement method for LCD panels
Author(s): Thierry R. Leroux
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Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs
Author(s): Steven L. Wright; Steven Millman; Manabu Kodate
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Degradation of the reproduction of the high-order sensation caused by halation
Author(s): Hideki Shirai; Masashi Kameda; Makoto M. Miyahara; Shuji Taniho; V. Ralph Algazi
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Time-domain flicker measurement technique
Author(s): Joseph Miseli
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Stray light elimination in making projection display measurements
Author(s): Paul A. Boynton; Edward F. Kelley
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NIST display interface testbed: the development of a centrally controlled testing system for the automated generation of stimuli and control feedback
Author(s): John W. Roberts; James A. Ward
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