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Proceedings of SPIE Volume 3520

Three-Dimensional Imaging, Optical Metrology, and Inspection IV
Editor(s): Kevin G. Harding; Donald J. Svetkoff; Katherine Creath; James S. Harris
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Softcover $105.00 * $105.00 *

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Volume Details

Volume Number: 3520
Date Published: 29 December 1998
Softcover: 32 papers (314) pages
ISBN: 9780819429810

Table of Contents
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Dimensional measurement of plate products using a novel moire system
Author(s): Jussi Paakkari; Heikki J. Ailisto
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Multicolor fringe projection system with enhanced 3D reconstruction of surfaces
Author(s): Bernard R. Gilbert; Joel H. Blatt
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Mach-Zehnder interferometer fringe projector for variable-resolution video moire
Author(s): Phillip C. Kalmanson; August Schutte; Chris L. Hart; Joel H. Blatt
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High-speed moire contouring methods analysis
Author(s): Kevin G. Harding; Leonard H. Bieman
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Two-frequency phase-shifting projection moire topography
Author(s): Seung-Woo Kim; Jung-Taek Oh; Moon-Sik Jung; Yi-Bae Choi
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Integration of multiple-baseline color stereo vision with focus and defocus analysis for 3D shape measurement
Author(s): Ta Yuan; Murali Subbarao
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Application of phase-shift optical triangulation to precision gear gauging
Author(s): Guowen Lu; Shudong Wu; Nicholas Palmer; Hongyu Liu
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Speckle-induced phase error in laser-based phase-shifting projected-fringe profilometry
Author(s): Hongyu Liu; Guowen Lu; Jonathan Jones; Daniel Komisarek; Shudong Wu
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Nondestructive profiler for pipe inner wall using triangulation scanning method
Author(s): Bao Hua Zhuang; Wenwei Zhang
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Recovery of three-dimensional shapes by using a defocus structured light system
Author(s): Alfonso Serrano-Heredia; Carlos M. Hinojosa; Juan Gutierrez Ibarra; Victor M. Arrizon
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Calibrating method for a spatial-encoding-based rangefinder
Author(s): Xiaoyang Yu; Jian Zhang; Liying Wu; Juchun Lu; Qing Lin; Guihong Bi
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Photogrammetrical matching of point clouds for 3D measurement of complex objects
Author(s): Carsten Reich
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Real-time videogrammetry uncertainty computation and test results
Author(s): Scott C. Sandwith
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High-resolution laser rangefinder based on a phase-shift measurement method
Author(s): Bernard A. Journet; Stephane Poujouly
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Ideas for fast and cheap object capture
Author(s): Philip C. D. Hobbs
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Fundamentals of the advanced Fresnel tracer used for two-dimensional in-process micromeasurements
Author(s): Burkhard Huhnke; Gunnar Urbschat
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Micromeasurements on smooth surfaces with a new confocal optical profiler
Author(s): Ferran Laguarta; Roger Artigas; Agusti Pinto; I. Al-Khatib
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Surface structure analysis of paper based on confocal laser scanning microscopy (CLSM) imaging: aiming at the prediction of printability for wood-containing paper
Author(s): Per Gunnar Auran
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Design-model-based in-process measuring method of a three-dimensional microprofile by employing the laser inverse scattering phase-reconstruction method
Author(s): Yasuhiro Takaya; Kazuhiro Wake; Motoki Izukura; Satoru Takahashi; Takashi Miyoshi
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Fuzzy logic applied to suface modeling from point clouds
Author(s): Jean-Marc Philippe; Alain Bernard; Gabriel Ris
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3D range image surface feature classification using tripod operators
Author(s): Songtao Li; Dongming Zhao
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Implicit surface reconstruction for reverse engineering
Author(s): Y. He; Peihua Gu; K. Ferguson; J. Ronsky; R. Zernicke
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Definition of the fundamentals for the automatic generation of digitalization processes with a 3D laser sensor
Author(s): Stephane Davillerd; Benoit Sidot; Alain Bernard; Gabriel Ris
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Volumetric properties for three-dimensional solid objects using optical images
Author(s): Somia Mostafa El-Hefnawy; El-Sayed H. El-Konyaly
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Multiwavelength shearography for evaluation of in-plane strain distributions
Author(s): Ralf Kaestle; Erwin K. Hack; Urs J. Sennhauser
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Birefringent torque sensor for motors
Author(s): Dukki Chung; Francis L. Merat; Fred M. Discenzo; James S. Harris
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Strain/stress measurements using electronic speckle pattern interferometry
Author(s): Tilo Pfeifer; Horst Konstantin Mischo; Andreas Ettemeyer; Zhiguo Wang; Ronny Wegner
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Optical fiber transient current measurement
Author(s): Kaicheng Li; Miaoyuan Ye
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Simultaneous measurement of the root-mean-square roughness and autocorrelation length by optical method
Author(s): Dalwoo Kim; Ki-Jang Oh; Choong-Soo Lim
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Characterization of a geometrically desensitized interferometer for flatness testing
Author(s): Xavier Colonna de Lega; James F. Biegen; Dave Stephenson; Peter J. de Groot
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Coherence scanning in a geometrically desensitized interferometer
Author(s): Leslie L. Deck; Peter J. de Groot; Xavier Colonna de Lega
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Practical applications of laser holography in metrology for 3D imaging and industrial inspection
Author(s): Vera Moiseevna Ginzburg
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