Share Email Print
cover

Proceedings of SPIE Volume 3478

Laser Interferometry IX: Techniques and Analysis
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 3478
Date Published: 30 June 1998
Softcover: 51 papers (476) pages
ISBN: 9780819429339

Table of Contents
show all abstracts | hide all abstracts
Intelligent approaches in image analysis
Author(s): Claus E. Liedtke
Show Abstract
Active optical metrology: a definition with examples
Author(s): Wolfgang Osten
Show Abstract
Regularization methods for processing fringe pattern images
Author(s): Jose Luis Marroquin Zaleta; Mariano Rivera; Salvador Botello; Ramon Rodriguez-Vera; Manuel Servin Guirado
Show Abstract
Sinusoidal wavelength-scanning interferometers
Author(s): Osami Sasaki; Kenichiro Tsuji; Shouichi Sato; Tomokazu Kuwahara; Takamasa Suzuki
Show Abstract
Principles of digital holographic interferometry
Author(s): Thomas M. Kreis; Werner P. O. Jueptner; Juergen Geldmacher
Show Abstract
Direct group-delay measurement and 3D profilometry using a white-light interferometer
Author(s): Yi Liang; Q. M. Jonathan Wu; Chander Prakash Grover
Show Abstract
High-speed 3D shape measurement using a nonscanning multiple-beam confocal imaging system
Author(s): Mitsuhiro Ishihara; Hiromi Sasaki
Show Abstract
Three-dimensional shape measurement using fiber optic low-coherence speckle interferometry
Author(s): Itziar Balboa; Ralph P. Tatam
Show Abstract
Self-mixing interference inside a laser diode: application for displacement, velocity, and distance measurement
Author(s): Thierry M. Bosch; Noel Servagent; Flore Gouaux; Gregory Mourat
Show Abstract
Phase determination algorithms compensating for spatially nonuniform phase modulation in phase-shifting interferometry
Author(s): Kenichi Hibino; Makoto Yamauchi
Show Abstract
New error-compensating seven-sample phase-shifting algorithm and application in 3D fringe projection profilometry
Author(s): Hong Zhang; Michael J. Lalor; David R. Burton
Show Abstract
New approaches for phase determination
Author(s): Jan Thesing
Show Abstract
New robust algorithms for ap hase-stepping technique
Author(s): Cezary Kosinski
Show Abstract
Single phase-step algorithm for phase difference measurement using ESPI
Author(s): Meinhard Sesselmann; Armando Albertazzi
Show Abstract
Two-dimensional phase unwrapping by direct elimination of rotational vector fields from phase gradients obtained by heterodyne techniques
Author(s): Takahiro Aoki; Toshihiro Sotomaru; Yoko Miyamoto; Mitsuo Takeda
Show Abstract
Unwrapping of digital speckle pattern interferometry phase maps using a minimum L0-norm algorithm
Author(s): Guillermo H. Kaufmann; Pablo D. Ruiz; Gustavo E. Galizzi
Show Abstract
Feature extraction from interferograms for phase distribution analysis
Author(s): Torsten Merz; Dietrich W. Paulus; Heinrich Niemann
Show Abstract
Fringe processing in nonregular domains by boundary-fitted image mapping
Author(s): Armando Albertazzi
Show Abstract
Interferometry with VUV wavelengths
Author(s): Wolfgang Emer; Johannes Schwider
Show Abstract
Precise measurement of nonoptical surfaces by an oblique incidence interferometer
Author(s): Yukitoshi Otani; Toyoaki Kuwahara; Masayuki Yamamoto; Toru Yoshizawa
Show Abstract
Dual-hologram shearing interference technique with regulated sensitivity
Author(s): Gregory R. Toker; Daniel Levin
Show Abstract
Interferometric analysis of stress-induced birefringence in a rotating glass disk
Author(s): Peter J. de Groot; Ara Dergevorkian; Tod Erickson
Show Abstract
Analyses of light diffracted on rough surfaces to measure in-plane displacements using a heterodyne interferometer
Author(s): Tomasz S. Tkaczyk
Show Abstract
Improved method for measuring refractive index of a medium
Author(s): Der-Chin Su; JuYi Lee
Show Abstract
Synthesis of the optical coherence function and its applications in photonic sensing
Author(s): Kazuo Hotate; Zuyuan He; Takashi Saida
Show Abstract
Pseudoheterodyne signal processing scheme for interrogation of fiber Bragg grating sensor arrays
Author(s): Clare K. Chatterjea; Stephen W. James; Ralph P. Tatam
Show Abstract
Heterodyne interferometer with frequency-modulated laser diode for in- and out-of-plane measurements of vibrations
Author(s): Pawel Drabarek; Michael van Keulen; Siegbert Steinlechner
Show Abstract
Miniature fiber optic pressure sensors for turbomachinery applications
Author(s): William N. MacPherson; James M. Kilpatrick; James S. Barton; Julian D. C. Jones
Show Abstract
Investigation of laser welds by means of digital speckle photography
Author(s): Daniel Holstein; Hans-Juergen Hartmann; Werner P. O. Jueptner
Show Abstract
Speckle interferometry in situ: a feasibility study
Author(s): Massimo Facchini
Show Abstract
Real-time two-color laser speckle-shift strain measurement system
Author(s): Meg L. Tuma; Lawrence C. Greer; Michael J. Krasowski; Lawrence G. Oberle; Kristie A. Elam; Daniel C. Spina
Show Abstract
Quantitative three-dimensional measurements of vibration amplitudes and phases as a function of frequency by digital speckle pattern interferometry
Author(s): Christophe De Veuster; Yvon L. M. Renotte; Leon Berwart; Yves F. Lion
Show Abstract
New simultaneous initialization and online phase calculation in ESPI displacement measurement
Author(s): Harald Friebe
Show Abstract
Developmental steps for double-pulse shearography
Author(s): Wolfgang Steinchen; Lian Xiang Yang; Gerhard Kupfer; Peter Maeckel; Frank Voessing
Show Abstract
Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis
Author(s): J. L. Fernandez; Antonio Fernandez; Angel F. Doval; Abundio Davila; Jesus Blanco-Garcia; Carlos Perez-Lopez
Show Abstract
Local measurements of high-gradient in-plane displacement/strain fields by automated grating interferometry
Author(s): Malgorzata Kujawinska; Leszek A. Salbut; Robert Sitnik
Show Abstract
Displacement measurement for vibration with large amplitude using moire topography
Author(s): Yasuhiko Arai; Shunsuke Yokozeki
Show Abstract
New methods to stabilize frequency and power of a two-longitudinal-mode He-Ne laser in two-mode laser interferometers
Author(s): Jianping Yin; Heung-Ruoul Noh; Wonho Jhe; Yifu Zhu; Yiqiu Wang
Show Abstract
Polarization fading elimination of interferometric fiber optic arrays by input polarization control
Author(s): Xiaodong Zhou; Weizhong Tang; Wen Zhou
Show Abstract
Fourier transform moire deflectometry
Author(s): Ming Wang; Dacheng Li; Jingang Zhong; Weimin Chen
Show Abstract
Phase measurement algorithm without phase-unwrapping problem for phase-stepping interferometry
Author(s): Chunlong Wei; Mingyi Chen; Weidong Hou; Zhijiang Wang
Show Abstract
General phase-stepping algorithm using a Lissajous figure technique
Author(s): Chunlong Wei; Mingyi Chen; Hongwei Guo; Zhijiang Wang
Show Abstract
Versatile electronic speckle pattern interferometry
Author(s): Rajpal S. Sirohi
Show Abstract
Polarization interferometry in fiber optic smart structures
Author(s): Tomasz R. Wolinski; Witold Konopka; Andrzej W. Domanski
Show Abstract
3D object model construction from multiple range views
Author(s): Yongho Li; Jarle Strand; Anil K. Jain; Carolyn R. Mercer
Show Abstract
Coherent light-beating scattering (CLBS) as a new interference technique for size and velocity control
Author(s): Anatoly T. Sukhodolsky; P. A. Sukhodolsky
Show Abstract
Electro-optic holography method for determination of surface shape and deformation
Author(s): Cosme Furlong; Ryszard J. Pryputniewicz
Show Abstract
Flatness measurement by a UV moire technique
Author(s): Hisatoshi Fujiwara; Yutaka Kodera; Yukitoshi Otani; Toru Yoshizawa
Show Abstract
New ellipsometric configuration based on a Zeeman laser for fast measurements
Author(s): Liviu Singher; Leonid Boim; Gregory R. Toker
Show Abstract
Liquid-core fiber for temperature sensing
Author(s): Yiding Wang; ZuoWei Li; ZhiGuo Zhang; XianWei Zhong; ZhiYoung Hu; Yu-Dong Li; Shiyong Liu
Show Abstract
Vortex flowmeter with polarimetric sensing
Author(s): Marcin Roszko; Andrzej W. Domanski; Marek Wojciech Sierakowski; Marcin Swillo
Show Abstract

© SPIE. Terms of Use
Back to Top