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Proceedings of SPIE Volume 3447

Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications
Editor(s): Ali M. Khounsary
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Volume Details

Volume Number: 3447
Date Published: 13 November 1998
Softcover: 13 papers (134) pages
ISBN: 9780819429025

Table of Contents
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Design of a LIGA beamline using a multilayer-coated reflection mirror
Author(s): Hiroo Kinoshita; Yachiyo Kimpara; T. Uruga; Takeo Watanabe; Masahito Niibe; Yuriy Ya. Platonov; James L. Wood
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Mirror benders for white beam collimation at HASYLAB
Author(s): Ulrich Hahn; Horst Schulte-Schrepping
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R&D program on multisegmented piezoelectric bimorph mirrors at the ESRF: status report
Author(s): Riccardo Signorato
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Fabrication of an aspherical mirror for extreme-ultraviolet lithography (EUVL) optics
Author(s): Masahito Niibe; Atsushi Miyafuji; Hiroo Kinoshita; Takeo Watanabe; Shozo Inoue; Keiji Koterazawa
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Design, analysis, and performance of an epoxy-bonded bendable mirror
Author(s): Neal D. Hartman; Philip A. Heimann; Alastair A. MacDowell; Keith D. Franck; Andrew P. Grieshop; Steven C. Irick; Howard A. Padmore
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Liquid-cooled transmissive optical component
Author(s): Mark A. Culpepper; James P. Metz; James L. Stapp
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Performance analysis of a side-cooled vertical-focusing mirror for the undulator beamline at APS
Author(s): Yifei R. Jaski; Mati Meron; P. James Viccaro
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Bendable mirrors
Author(s): Jean-Jacques Ferme; Gilbert M. Dahan
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Performance of side-cooled high-heat-load mirrors
Author(s): Ali M. Khounsary; Wenbing Yun; Ian McNulty; Zhonghou Cai; Barry P. Lai
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Understanding surface scatter effects in grazing incidence x-ray synchrotron applications
Author(s): James E. Harvey; Patrick L. Thompson; Cynthia L. Vernold
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Error reduction techniques for measuring long synchrotron mirrors
Author(s): Steven C. Irick
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Metrology of a mirror at the Advanced Photon Source: comparison between optical and x-ray measurements
Author(s): Lahsen Assoufid; Jonathan C. Lang; Jin Wang; George Srajer
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Mirror distortion measurements with an in-situ LTP
Author(s): Peter Z. Takacs; Shinan Qian; Kevin J. Randall; Wenbing Yun; Haizhang Li
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