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Proceedings of SPIE Volume 3434

Image Intensifiers and Applications; and Characteristics and Consequences of Space Debris and Near-Earth Objects
Editor(s): C. Bruce Johnson; Timothy D. Maclay; Firooz A. Allahdadi
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Softcover $105.00 * $105.00 *

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Volume Details

Volume Number: 3434
Date Published: 18 November 1998
Softcover: 14 papers (148) pages
ISBN: 9780819428899

Table of Contents
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Spectral response characteristics of x-ray microchannel plate image converters (XMCPIC)
Author(s): Mengtong Qiu; Kuilu Wang; Xiangdong Qin; Wensheng Wang; Bao Hui Wang; Fuli Wei
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Multispectral simulation environment for modeling low-light-level sensor systems
Author(s): Emmett J. Ientilucci; Scott D. Brown; John R. Schott; Rolando V. Raqueno
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Solar blind and bispectral imaging with ICCD, BCCD, and EBCCD cameras
Author(s): Malka Brith Lindner; Shimon Elstein; Pinhas Lindner
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Intensified cooled integrating CCD camera
Author(s): Thomas F. Lynch
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Gallium-arsenide electron-bombarded CCD technology
Author(s): Verle W. Aebi; Kenneth A. Costello; John P. Edgecumbe; John J. Boyle; William L. Robbins; Ray Bell; David J. Burt; Andrew Harris; Ian Palmer; Peter J. Pool
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Review of electron-bombarded CCD cameras
Author(s): C. Bruce Johnson
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Advances in photon counting for bioluminescence
Author(s): Martin B. Ingle; J. Ralph Powell
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Infrasound from the El Paso superbolide of October 9, 1997
Author(s): Douglas O. ReVelle; Rodney W. Whitaker; William T. Armstrong
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Description and experimental results of a 58-lb portable LEO satellite tracker
Author(s): Richard J. Tansey; Blair F. Campbell; Andrea Koumvakalis; R. Dantowitz; M. Kozubal
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U.S. Space Surveillance Network capabilities
Author(s): R. Sridharan; Antonio F. Pensa
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Orbital debris removal and meteoroid deflection
Author(s): Jonathan W. Campbell; Charles R. Taylor; Larry L. Smalley; Thomas Dickerson
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Onset of petalling in a thin spacecraft wall perforated by an orbital debris particle
Author(s): William P. Schonberg
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Debris collision hazard from breakups in the geosynchronous ring
Author(s): Michael F. Kamprath; Alan B. Jenkin
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Re-entry survivability and risk
Author(s): Michael L. Fudge
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