Share Email Print

Proceedings of SPIE Volume 3426

Scattering and Surface Roughness II
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 3426
Date Published: 30 October 1998
Softcover: 39 papers (390) pages
ISBN: 9780819428813

Table of Contents
show all abstracts | hide all abstracts
Design and synthesis of random uniform diffusers
Author(s): Eugenio R. Mendez; Gabriel C. Martinez-Niconoff; Alexei A. Maradudin; Tamara A. Leskova
Show Abstract
Spectral changes of light scattered from a random metal suface in the Otto attenuated total reflection configuration
Author(s): Tamara A. Leskova; Alexei A. Maradudin; Andrei V. Shchegrov; Eugenio R. Mendez
Show Abstract
High-frequency approximations of the full wave solutions to single and double scatter cross sections for two-dimensional random rough surfaces
Author(s): Ezekiel Bahar; Magda El-Shenawee
Show Abstract
Application of MOMI iteration to solve the magnetic and electric field integral equations
Author(s): J. Merle Elson; Phuc G. Tran
Show Abstract
Modified Beckmann-Kirchoff scattering theory for nonparaxial angles
Author(s): Cynthia L. Vernold; James E. Harvey
Show Abstract
Iterative approach to solving the magnetic and electric field integral equations for scattering by a dielectric thin film
Author(s): J. Merle Elson; Lewis F. DeSandre
Show Abstract
Effective mirror constituent of light scattering on a rough surface and light transfer in optical devices
Author(s): Margarita E. Globus; Boris V. Grinyov; Marina A. Ratner
Show Abstract
Experimental studies of scatter-probe near-field optical microscopy
Author(s): Saul Alonso Zavala Ortiz; Pedro Negrete-Regagnon; Eugenio R. Mendez
Show Abstract
Surface electromagnetic waves in near-field optical scanning microscopy
Author(s): Montserrat Freixa Pascual; Wolfgang Zierau; Tamara A. Leskova; Alexei A. Maradudin
Show Abstract
Features in the speckle correlations of light scattered from volume-disordered dielectric media
Author(s): V. Malyshkin; Arthur R. McGurn; Alexei A. Maradudin
Show Abstract
Analysis of microstructure changes and dynamic processes on rough surfaces using speckle correlation
Author(s): Thomas Fricke-Begemann; Frank Beyrau; Gerd Guelker; Klaus D. Hinsch; Peter Jauschke; Karin Wolff
Show Abstract
Parametric optical surface roughness measurement by means of polychromatic speckle autocorrelation
Author(s): Stefan Patzelt; Andreas Ciossek; Peter Lehmann; Armin Schoene
Show Abstract
Computer simulation studies of the speckle correlations of light scattered from a random array of dielectric spheres
Author(s): Arthur R. McGurn; Alexei A. Maradudin
Show Abstract
Polarization and surface roughness
Author(s): Walter G. Egan
Show Abstract
Polarization measurement of the light scattered by dielectric randomly rough isotropic surfaces
Author(s): Elena I. Chaikina; Pedro Negrete-Regagnon; Gabriel C. Martinez-Niconoff; Eugenio R. Mendez
Show Abstract
Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically generated microrough silicon
Author(s): Thomas A. Germer; Bradley W. Scheer
Show Abstract
Polarization of scattering by rough surfaces
Author(s): Soe-Mie F. Nee; Tsu-Wei Nee
Show Abstract
Detection of subsurface defects
Author(s): Zu-Han Gu; Zong Qi Lin; Michel A. Josse
Show Abstract
Diffuse reflectance of sintered and pressed polytetrafluoroethylene (PTFE)
Author(s): Patricia Yvonne Barnes; Edward A. Early
Show Abstract
Light reflection from a porous surface where the size of the pore is near the wavelength
Author(s): Vladimir Pshenitsin; Vadim Antonov; Alexei L. Diikov
Application of optical scatterometry to microelectronics and flat panel display processing
Author(s): John Robert McNeil; Stephen A. Coulombe; Petre-Catalin Logofatu; Christopher J. Raymond; S. Sohail H. Naqvi; George J. Collins
Show Abstract
NIST virtual/physical random-profile roughness calibration standards
Author(s): Jun-Feng Song; Christopher J. Evans; M. McGlauflin; E. Whitenton; Theodore V. Vorburger; Y. Yuan
Show Abstract
Characterization of planarity of polymer thin films on rough surfaces
Author(s): Wen-li Wu; William E. Wallace
Show Abstract
Roughness evaluation from ultrapure fluid transfer surface materials for microelectronics fabrication
Author(s): Dumitru Gh. Ulieru
Show Abstract
Handheld directional reflectometer: an angular imaging device to measure BRDF and HDR in real time
Author(s): Phillip R. Mattison; Mark S. Dombrowski; James M. Lorenz; Keith J. Davis; Harley C. Mann; Philip Johnson; Bryan Foos
Show Abstract
Evaluation of in-situ ARS sensors for characterizing smooth and rough surfaces
Author(s): Andre Kasper; Hendrik Rothe
Show Abstract
Novel statistical calibration method for laser scanners
Author(s): Jerry Xiaoming Chen; Yung-Tsai Chris Yen
Show Abstract
Ultraviolet scattering by thin carbon foils
Author(s): Richard R. Zito
Show Abstract
Optical design of the INTEGRAL Optical Monitoring Camera
Author(s): Emmanuel Mazy; Jean-Marc Defise; J.-Y. Plesseria; Lieve de Vos
Show Abstract
Globally accessible bidirectional scattering distribution function software data tool
Author(s): Susan H. C. P. McCall; Robert P. Breault; Rorik A. Henrikson; Michael A. Reid; Anthony J. Clark; Robyn A. Ellis; Alice E. Piotrowski; Lorraine A. Piotrowski; John W. Rodney; Marshall L. McCall
Show Abstract
Modeling the affect of multiple beam clipping in FIR and submillimeter instrumentation: ISO-LWS and FIRST-SPIRE
Author(s): Martin E. Caldwell; Bruce Miles Swinyard; Peter F. Gray
Show Abstract
Modifying the Harvey-Shack surface scatter theory
Author(s): James E. Harvey; Cynthia L. Vernold
Show Abstract
Common-path heterodyne interferometer with automatic focusing system for online surface profiling
Author(s): Rong Liang; Dacheng Li; Mang Cao; Hongzhi Zhao; Yong-jun Wu
Show Abstract
Computation of the intensity distribution for a film on a GRIN substrate
Author(s): Mario Marcelo Lehman; Mario Garavaglia
Show Abstract
Scatterometer at Korea Research Institute of Standards and Science (KRISS) for bidirectional reflectance distribution function (BRDF)
Author(s): Byong Chon Park; Yun Woo Lee; Beomhoan O
Show Abstract
BRDF measurements of a new IR black coating with lower reflectance
Author(s): Sheldon M. Smith; John C. Fleming
Show Abstract
Rough-surface-enhanced scattering
Author(s): Zu-Han Gu; Zong Qi Lin; Mikael Ciftan
Show Abstract
Comparison of PSD measurements using stray light sensors with PSD curves evaluated from topography of large AFM scans
Author(s): Dorothee Hueser; Thomas Rinder; Hendrik Rothe
Show Abstract
INTEGRAL's Optical Monitoring Camera stray-light design
Author(s): Emmanuel Mazy; Jean-Marc Defise; J.-Y. Plesseria
Show Abstract

© SPIE. Terms of Use
Back to Top