Share Email Print
cover

Proceedings of SPIE Volume 3425

Optical Diagnostic Methods for Inorganic Transmissive Materials
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 3425
Date Published: 8 October 1998
Softcover: 29 papers (278) pages
ISBN: 9780819428806

Table of Contents
show all abstracts | hide all abstracts
FTIR reflectance characterization of SIMOX buried oxide layers
Author(s): Victor A. Yakovlev; Sylvie Bosch-Charpenay; Peter A. Rosenthal; Peter R. Solomon; Jiazhan Xu
Show Abstract
Intercomparisons of reflectance measurements
Author(s): Patricia Yvonne Barnes; Edward A. Early; B. Carol Johnson; James J. Butler; Carol J. Bruegge; Stuart F. Biggar; Paul R. Spyak; Milutin M. Pavlov
Show Abstract
Methods for absolute reflectance measurement of transmissive materials in the infrared
Author(s): Leonard M. Hanssen; Simon G. Kaplan
Show Abstract
Problems posed by scattering transmissive materials for accurate transmittance and reflectance measurements
Author(s): Leonard M. Hanssen; Simon G. Kaplan
Show Abstract
Characterization of narrowband infrared interference filters
Author(s): Simon G. Kaplan; Leonard M. Hanssen
Show Abstract
Characterization of high-OD ultrathin infrared neutral density filters
Author(s): Simon G. Kaplan; Leonard M. Hanssen; Alan L. Migdall; Glenn Lefever-Button
Show Abstract
Ultrathin film neutral density filter set for the infrared
Author(s): Glenn Lefever-Button; Joakim F. Lindblom; Forbes R. Powell
Show Abstract
Characterization of far-infrared optical thin film materials and blends: AgBr, AgCl, KBr, Csl, and CsBr
Author(s): Thomas D. Rahmlow; Jeanne E. Lazo-Wasem; David A. Rahmlow
Show Abstract
Environmental stability of rugate filters: in-situ measurements of their spectral properties
Author(s): Walter E. Johnson; Byron P. Edmonds; Marsha J. Wolf
Show Abstract
cSRM 2035: a rare-earth oxide glass for the wavelength calibration of near-infrared dispersive and Fourier transform spectrometers
Author(s): Steven J. Choquette; John C. Travis; David L. Duewer
Show Abstract
Re-evaluation of spectrophotometric standard reference materials for additional geometries and wavelengths
Author(s): Patricia Yvonne Barnes; Edward A. Early
Show Abstract
Absorption-line evaluation methods for wavelength standards
Author(s): Changjiang Zhu; Leonard M. Hanssen
Show Abstract
Normal infrared spectral emittance of Al2O3
Author(s): Simon G. Kaplan; Leonard M. Hanssen
Show Abstract
Multispectral pyrometry for insulating material emissometry
Author(s): Michael E. Thomas; Milton J. Linevsky
Show Abstract
Design and operation of a highly sensitive and accurate laser calorimeter for low-absorbtion materials
Author(s): Etsuo Kawate; Leonard M. Hanssen; Simon G. Kaplan; Raju V. Datla
Show Abstract
Infrared refractive indices and thermo-optic coefficients for several materials
Author(s): William J. Tropf; Michael E. Thomas; Milton J. Linevsky
Show Abstract
AC phase measuring interferometer for measuring dn/dT of fused silica and calcium fluoride at 193 nm
Author(s): Richard N. Shagam
Show Abstract
Transient grating in KNbO3/KTaO3 superlattice
Author(s): Huimin Liu; Felix E. Fernandez; Weiyi Jia; Lynn A. Boatner
Show Abstract
Measurements of index of refraction in the deep and vacuum ultraviolet using the minimum-deviation method
Author(s): John H. Burnett; Rajeev Gupta; Ulf Griesmann
Show Abstract
Fourier transform refractometry
Author(s): Simon G. Kaplan; Leonard M. Hanssen; Ulf Griesmann; Rajeev Gupta
Show Abstract
Measurements of the optical functions of uniaxial crystals using two-modulator generalized ellipsometry (2-MGE)
Author(s): Gerald E. Jellison; Frank A. Modine; Lynn A. Boatner
Show Abstract
FTIR-based polarimeter with high-quality Brewster's angle polarizers
Author(s): Simon G. Kaplan; Leonard M. Hanssen
Show Abstract
Measurement of the refractive index of transparent materials using null polarimetry near Brewster's angle
Author(s): Soe-Mie F. Nee
Show Abstract
Fourier transform spectropolarimetry for optical diagnostics of transmissive materials
Author(s): David B. Chenault; Dennis H. Goldstein; Diana M. Hayes
Show Abstract
Determination of birefringence by Brillouin spectroscopy
Author(s): TongChull Chey; Sukmock Lee; YunSik Yu; SungChul Kim
Show Abstract
Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infrared
Author(s): Douglas B. Leviton; Timothy J. Madison; Peter Petrone
Show Abstract
Variations in refractive index of color filter glasses
Author(s): Douglas B. Leviton; Peter Petrone
Show Abstract
Far-ultraviolet refractive index of optical materials for solar blind channel (SBC) filters for the HST advanced camera for surveys (ACS)
Author(s): Douglas B. Leviton; Timothy J. Madison; Peter Petrone
Show Abstract
Optical characterization of synthetic faceted gem materials grown from hydrothermal solutions
Author(s): Taijin Lu; James E. Shigley
Show Abstract

© SPIE. Terms of Use
Back to Top