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Proceedings of SPIE Volume 3399

Process Control and Sensors for Manufacturing
Editor(s): Richard H. Bossi; David M. Pepper
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Volume Details

Volume Number: 3399
Date Published: 15 March 1998
Softcover: 27 papers (258) pages
ISBN: 9780819428486

Table of Contents
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Distributed object architectures as a basis for digital sensor networks
Author(s): Ron T. Lake
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Optical fiber strain gauges for high-cycle fatigue monitoring of ceramic matrix composite materials
Author(s): Jonathan A. Greene; Carrie L. Kozikowski; Rob O'Neal; Stephen H. Poland; Michael P. Camden; Larry W. Simmons
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Robust laser-based detection of Lamb waves using photo-EMF sensors
Author(s): Marvin B. Klein; Gerald David Bacher
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Detection of surface corrosion and contamination by optical second-harmonic generation: application to health monitoring and cleanliness inspection
Author(s): Jeffrey H. Hunt
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Optical fiber corrosion sensors for aging aircraft
Author(s): Jonathan A. Greene; Mark E. Jones; Timothy A. Bailey; Ignacio M. Perez
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Inspection tools for aerospace critical surfaces
Author(s): Gary L. Workman; G. Wayne Thompson; Billy H. Nerren; H. Dewitt Burns
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Nondestructive evaluation of surface roughness by speckle correlation techniques
Author(s): Joerg Peters; Armin Schoene
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Shape measurement of the cold rolled strips using the rectangular fringe shift method
Author(s): HaSul Kim; Changhyun Park; Young Tae Shin; Jin Yang Jung
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Stiffness measurement and defect detection in laminated composites by dry-coupled plate waves
Author(s): W. Huang; Steve M. Ziola; John F. Dorighi; Michael R. Gorman
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Surface-wave-based sensor for evaluating in-situ consolidation of polymer composites
Author(s): Susan C. Mantell; D. Holley; Elizabeth J. Linstrom
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Electromagnetic localization of defects in carbon epoxy composite materials
Author(s): Michel B. Lemistre; Remi Gouyon; Daniel L. Balageas
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Ultrasonic vibration modal analysis of ICF targets using a photorefractive optical lock-in
Author(s): Thomas Chatters Hale; Thomas J. Asaki; Kenneth L. Telschow; Jim Hoffer
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Cradle-to-grave monitoring of a composite part using fiber grating sensors
Author(s): Eric Udd; Kelli Corona-Bittick; Jim Dorr; Kerry T. Slattery
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Composite cure monitoring with Bragg grating sensors
Author(s): Kerry T. Slattery; Kelli Corona-Bittick; Donald James Dorr
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Recent progress in online ultrasonic process monitoring
Author(s): Szu-Sheng L. Wen; Tzu-Fang Chen; Demartonne Ramos-Franca; Ky T. Nguyen; Cheng-Kuei Jen; Ikuo Ihara; A. Derdouri; Andres Garcia-Rejon
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Product development using process monitoring and NDE data fusion
Author(s): Todd Peterson; Richard H. Bossi
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EMAT-generated Lamb waves for volumetric inspection of strip steel
Author(s): Wayne M. Latham; P. Jerry Latimer; Daniel T. MacLauchlan; Kenneth R. Camplin; Dennis D. Lang
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Silicon wafer temperature monitoring using all-fiber laser ultrasonics
Author(s): Jorge J. Alcoz; Charles E. Duffer
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Defect detection of partially complete SAW and TIG welds using the ultrasonic time-of-flight diffraction method
Author(s): Shaun W. Lawson; Gary R. Bonser
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Integrated nondestructive inspection (INDI): the HMO framework for the next millenium
Author(s): Peter D. Dean
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Amorphous silicon imaging system for improved x-ray image capture in nondestructive evaluation
Author(s): Einar E. Anderson; Mark A. Hartney; Richard L. Weisfield
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Elemental characterization using pulsed fast-thermal neutrons
Author(s): George Vourvopoulos; Phillip C. Womble; Michael D. Belbot; Jonathon Paschal; Gary M. Spichiger
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Residual stress characterization of welds and post-weld processes using x-ray diffraction techniques
Author(s): Michael E. Brauss; James A. Pineault; John S. Eckersley
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Analysis of stress distributions in metal-matrix composites using computed tomography data
Author(s): Robert N. Yancey
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Real-time x-ray imaging with flat panels
Author(s): David L. Gilblom; Richard E. Colbeth; Mark Batts; Bruce Meyer
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Magnetoelastic torque transducer nondestructive to the measured shaft
Author(s): Shoucheng Yang; Xiaoyang Yu; Hua Guo; Yan Wang
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Defect detection in partially completed SAW and TIG welds using online radioscopy and image processing
Author(s): Gary R. Bonser; Shaun W. Lawson
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