Share Email Print
cover

PROCEEDINGS VOLUME 3205

Machine Vision Applications, Architectures, and Systems Integration VI
Editor(s): Susan Snell Solomon; Bruce G. Batchelor; John W. V. Miller
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 3205
Date Published: 18 September 1997
Softcover: 32 papers (308) pages
ISBN: 9780819426376

Table of Contents
show all abstracts | hide all abstracts
Advantages of computer cameras over video cameras/frame grabbers for high-speed vision applications
Author(s): Gaylord G. Olson; Jo Norvelle Walker
Show Abstract
Optical tooling for flexible manufacture
Author(s): David M. Berg
Show Abstract
Color measurements of nonhomogeneous colored flat surfaces using a PC-based color camera vision system
Author(s): Franz A. Pertl; Robert P. M. Craven; James E. Smith; Curtis Duhn
Show Abstract
High depth-of-field imaging without sacrificing light-gathering power and resolution
Author(s): Alan R. FitzGerrell; Edward R. Dowski
Show Abstract
Challenges of adapting a dual-wavelength infrared imaging system as an industrial inspection tool
Author(s): Behrouz N. Shabestari; Helen E. Kourous; Spencer D. Luster; Jaroslaw P. Sacha; Stephen Graff
Show Abstract
X-ray agricultural product inspection: segmentation and classification
Author(s): David P. Casasent; Ashit Talukder; Ha-Woon Lee
Show Abstract
Rotation invariant features for wear particle classification
Author(s): Hamzah Arof; Farzin Deravi
Show Abstract
Image recognition using a growing-cell-based neural network
Author(s): Jinming Yang; Majid A. Ahmadi; Graham A. Jullien; W. C. Miller
Show Abstract
Region segmentation based on 3D geometry from range images
Author(s): Dongming Zhao; Jenny J. Chen; Xingjun Wang; Sean X. Zhang
Show Abstract
Design of a flexible image processing library in C++
Author(s): Jaroslaw P. Sacha; Behrouz N. Shabestari; Timothy A. Kohler
Show Abstract
Three-dimensional multistage network applying for facial images decomposition
Author(s): Leonid I. Timchenko; Serge V. Chepornyuk; Maxim A. Grudin; David Mark Harvey; Yuri F. Kutaev; Alexander A. Gertsiy; Lubov V. Zahoruiko
Show Abstract
Implementation of SKIPSM for 3D binary morphology
Author(s): Frederick M. Waltz
Show Abstract
Integrated machine vision technology for line-scan applications
Author(s): Risto S. Mitikka; Markku Pietikainen; Jouko Vilmi; Heikki J. Ailisto
Show Abstract
Binary dilation using SKIPSM: some interesting variations
Author(s): Frederick M. Waltz
Show Abstract
New design environment for defect detection in web inspection systems
Author(s): S. Hossain Hajimowlana; Roberto Muscedere; Graham A. Jullien; James W. Roberts
Show Abstract
High-speed image processing algorithms using MMX hardware
Author(s): John W. V. Miller; James Wood
Show Abstract
Software implementation of 2D gray-level dilation using SKIPSM
Author(s): John W. V. Miller; Frederick M. Waltz
Show Abstract
Software implementation of the SKIPSM paradigm under PIP
Author(s): Ralf Hack; Frederick M. Waltz; Bruce G. Batchelor
Show Abstract
Color-to-speech sensory substitution device for the visually impaired
Author(s): Gabriel McMorrow; Xiaojun Wang; Paul F. Whelan
Show Abstract
Effects of aging on perception of motion
Author(s): Manpreet Kaur; Joseph Wilder; George Hung; Bela Julesz
Show Abstract
Real-time implementation of a color sorting system
Author(s): Srikathyanyani Srikanteswara; Qiang O. Lu; William King; Thomas H. Drayer; Richard W. Conners; D. Earl Kline; Philip A. Araman
Show Abstract
Machine vision for the control of reflecting nonplane surfaces
Author(s): Denis Aluze; Claudine Coulot; Fabrice Meriaudeau; Patrick Gorria; Christophe Dumont
Show Abstract
Comparative study of two different multiple-expert architectures for robust object recognition
Author(s): A. Fuad R. Rahman; Michael C. Fairhurst
Show Abstract
Machine vision: recent advances in CCD video camera technology
Author(s): Richard A. Easton; Ronald J. Hamilton
Show Abstract
Highly integrated image sensors enable low-cost imaging systems
Author(s): Paul K. Gallagher; Don Lake; David Chalmers; J. E. D. Hurwitz
Show Abstract
Train-by-show in color-based assembly and packaging inspection
Author(s): Robert K. McConnell
Show Abstract
Machine-vision-based alignment: space to factory to garage
Author(s): Donald J. Christian; Hoshang Shroff
Show Abstract
Diamond cutting-tool alignment with machine vision
Author(s): Stephen B. Kaiser
Show Abstract
Automated vision-based quality control for electro-optical module manufacturing
Author(s): Iqbal M. Dar
Show Abstract
Determination of bake time and temperature of painted plastic using mathematical morphology and neural networks
Author(s): Robert M. Lougheed; Michelle Mikulec; John M. Trenkle; David L. McCubbrey
Show Abstract
Application of online gauging for closed-loop process control
Author(s): Randall Kemmerer
Show Abstract
Machine vision and the World Wide Web: design and training aids
Author(s): Paul F. Whelan; Bruce G. Batchelor; Melanie R. F. Lewis; Ralf Hack
Show Abstract

© SPIE. Terms of Use
Back to Top