### Proceedings of SPIE Volume 3141

Scattering and Surface RoughnessFormat | Member Price | Non-Member Price |
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Softcover | $105.00 * | $105.00 * |

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 3141

Date Published: 26 September 1997

Softcover: 31 papers (348) pages

ISBN: 9780819425638

Date Published: 26 September 1997

Softcover: 31 papers (348) pages

ISBN: 9780819425638

Table of Contents

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In-situ measurement of roughness spectra using diffuse scattering

Author(s): Karen L. Kavanagh

Author(s): Karen L. Kavanagh

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Application of circular and spherical statistics for the interpretation of BRDF measurements

Author(s): Hendrik Rothe; Dorothee Hueser

Author(s): Hendrik Rothe; Dorothee Hueser

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Scattering of electromagnetic waves from a one-dimensional random metal surface with a localized defect

Author(s): Andrei V. Shchegrov; Alexei A. Maradudin

Author(s): Andrei V. Shchegrov; Alexei A. Maradudin

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Sensitivity of far-field speckle pattern to the small local changes of the rough surface geometry

Author(s): Michel A. Josse; Zong Qi Lin; Zu-Han Gu

Author(s): Michel A. Josse; Zong Qi Lin; Zu-Han Gu

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Surface roughness in sputtered tin oxide films studied by light scattering and atomic force microscopy

Author(s): Tomas Lindstroem; Jan Isidorsson; Gunnar A. Niklasson

Author(s): Tomas Lindstroem; Jan Isidorsson; Gunnar A. Niklasson

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Quality assessment of supersmooth to rough surfaces by multiple-wavelength light scattering measurement

Author(s): Angela Duparre; Stefan Gliech

Author(s): Angela Duparre; Stefan Gliech

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Scattering from sinusoidal gratings

Author(s): Byong Chon Park; Theodore V. Vorburger; Thomas A. Germer; Egon Marx

Author(s): Byong Chon Park; Theodore V. Vorburger; Thomas A. Germer; Egon Marx

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Development of a smooth-surface microroughness standard

Author(s): Bradley W. Scheer; John C. Stover

Author(s): Bradley W. Scheer; John C. Stover

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Analysis of near-field optical image of a deterministic surface structure using an exact Rayleigh approach

Author(s): Shu Wang

Author(s): Shu Wang

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Scatter-probe near-field optical microscopy of metallic surfaces

Author(s): Eugenio R. Mendez; Pedro Negrete-Regagnon; Saul Alonso Zavala Ortiz; Criseida Gonzalez-Rodriguez

Author(s): Eugenio R. Mendez; Pedro Negrete-Regagnon; Saul Alonso Zavala Ortiz; Criseida Gonzalez-Rodriguez

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Transfer function characterization of scattering surfaces revisited

Author(s): James E. Harvey; Cynthia L. Vernold

Author(s): James E. Harvey; Cynthia L. Vernold

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Comparison of Harvey-Shack scatter theory with experimental measurements

Author(s): Cynthia L. Vernold; James E. Harvey

Author(s): Cynthia L. Vernold; James E. Harvey

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Enhanced backscattering of light from a randomly rough interface between a dipole-active medium and a dielectric

Author(s): Tamara A. Leskova; Alexei A. Maradudin; Andrei V. Shchegrov

Author(s): Tamara A. Leskova; Alexei A. Maradudin; Andrei V. Shchegrov

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Transverse correlation length for randomly rough surfaces: two-dimensional roughness

Author(s): Simeon Simeonov; Arthur R. McGurn; Alexei A. Maradudin

Author(s): Simeon Simeonov; Arthur R. McGurn; Alexei A. Maradudin

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Scattering by randomly rough two-dimensional dielectric surfaces

Author(s): Elena I. Chaikina; Rafael Hernandez-Walls; Eugenio R. Mendez

Author(s): Elena I. Chaikina; Rafael Hernandez-Walls; Eugenio R. Mendez

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Stokes matrix in conical scattering from a one-dimensional randomly rough metal surface

Author(s): Igor V. Novikov; Alexei A. Maradudin

Author(s): Igor V. Novikov; Alexei A. Maradudin

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Surface plasmon polaritons in light scattering from free-standing randomly rough thin metal films

Author(s): Jun Q. Lu; Alexei A. Maradudin

Author(s): Jun Q. Lu; Alexei A. Maradudin

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Design review of an in-situ bidirectional reflectometer

Author(s): Michael T. Beecroft; Phillip R. Mattison

Author(s): Michael T. Beecroft; Phillip R. Mattison

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Final design, assembly, and testing of a space-based total integrated scatter instrument

Author(s): James B. Hadaway; Anees Ahmad; Jean M. Bennett

Author(s): James B. Hadaway; Anees Ahmad; Jean M. Bennett

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Goniometric optical scatter instrument for bidirectional reflectance distribution function measurements with out-of-plane and polarimetry capabilities

Author(s): Thomas A. Germer; Clara C. Asmail

Author(s): Thomas A. Germer; Clara C. Asmail

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Memory effect in the double passage of waves through a one-dimensional random phase screen

Author(s): Zong Qi Lin; Zu-Han Gu

Author(s): Zong Qi Lin; Zu-Han Gu

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Speckle correlations in the light scattered and transmitted by dielectric and metal films with rough surfaces

Author(s): Arthur R. McGurn; Alexei A. Maradudin

Author(s): Arthur R. McGurn; Alexei A. Maradudin

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Memory effect from a one-dimensional rough dielectric film on a glass substrate

Author(s): Zu-Han Gu; Jun Q. Lu

Author(s): Zu-Han Gu; Jun Q. Lu

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Phenomenological BRDF modeling for engineering applications

Author(s): James C. Jafolla; Jeffrey A. Stokes; Robert J. Sullivan

Author(s): James C. Jafolla; Jeffrey A. Stokes; Robert J. Sullivan

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Green function for fluorescence from spherical particles located on a substrate

Author(s): Gorden W. Videen; Steven C. Hill; J. David Pendleton

Author(s): Gorden W. Videen; Steven C. Hill; J. David Pendleton

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Scanning scattering microscope for surface and buried interface roughness and defect imaging

Author(s): Jan Lorincik; Joseph Fine; Greg Gillen

Author(s): Jan Lorincik; Joseph Fine; Greg Gillen

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Scattering from planar surfaces with magnetic and thermal fluctuations

Author(s): Mario Marcelo Lehman

Author(s): Mario Marcelo Lehman

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Toward a model accounting for the impact of surface treatment on the performances of scintillation counters

Author(s): Christian Moisan; Anthony Levin; H. Laman

Author(s): Christian Moisan; Anthony Levin; H. Laman

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