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PROCEEDINGS VOLUME 3121

Polarization: Measurement, Analysis, and Remote Sensing
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Volume Details

Volume Number: 3121
Date Published: 3 October 1997
Softcover: 49 papers (490) pages
ISBN: 9780819425430

Table of Contents
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Object detection in turbid media by differential backscattering of polarized light
Author(s): Mark P. Silverman; Wayne Strange
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Phase shifting interferometric imaging ellipsometer
Author(s): Conrad Wells; James C. Wyant
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Measurement of waveplate retardation using a photoelastic modulator
Author(s): Theodore C. Oakberg
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Measurement of low-level strain retardation in optical materials
Author(s): Theodore C. Oakberg
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Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry
Author(s): Elizabeth A. Sornsin; Russell A. Chipman
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Performance of a four-channel polarimeter with low-light-level detection
Author(s): Victor L. Gamiz
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Mueller matrix imaging of GaAs/AlGaAs self-imaging beamsplitting waveguides
Author(s): Matthew H. Smith; Elizabeth A. Sornsin; Tristan Jorge Tayag; Russell A. Chipman
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Polarization-sensitive infrared sensor for target discrimination
Author(s): Cornell S. L. Chun; David L. Fleming; W. A. Harvey; E. J. Torok
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Polarization signatures of spherical and conical targets measured by Mueller matrix imaging polarimetry
Author(s): Pierre-Yves Gerligand; Russell A. Chipman; Elizabeth A. Sornsin; Matthew H. Smith
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Polarization analysis system for very rough surfaces
Author(s): Gereon Vogtmeier; Bernhard Scholl; Hans Juergen Schmitt
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Physical interpretation of eigenvalue problems in optical scattering polarimetry
Author(s): Shane R. Cloude
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Polarized laser retroreflectance
Author(s): Walter G. Egan
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Error propagation in decomposition of Mueller matrices
Author(s): Diana M. Hayes
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Scattering from coated random rough surfaces characterized by the Mueller matrix
Author(s): Yuzhi Zhang; Ezekiel Bahar
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Co- and cross-polarized fields scattered from irregular layered structures: full wave analysis
Author(s): Ezekiel Bahar; Yuzhi Zhang
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Polarization rendering for modeling of coherent polarized speckle backscatter using TASAT
Author(s): Keith A. Bush; Gregg A. Crockett; Calvin C. Barnard; David G. Voelz; James F. Riker
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Visible Mueller matrix spectropolarimetry
Author(s): Elizabeth A. Sornsin; Russell A. Chipman
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Electro-optic spatial light modulator characterization using Mueller matrix imaging
Author(s): Elizabeth A. Sornsin; Russell A. Chipman
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Polarizational two-beam interferometer for nonlinear optical characterization
Author(s): Tigran V. Galstian; Artashes Yavrian; Michel Piche
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Bidirectional ellipsometry and its application to the characterization of surfaces
Author(s): Thomas A. Germer; Clara C. Asmail
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Standards for linear retardance
Author(s): Kent B. Rochford; Allen H. Rose
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Near-achromatic retardance behavior of HN22 Polaroid 3.6 to 5.4 um
Author(s): Arthur Lompado; Elizabeth A. Sornsin; Russell A. Chipman
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Evaluation of a selection of commercial polarizers and retarders at visible and near-infrared wavelengths
Author(s): Dennis H. Goldstein; David B. Chenault; Monte A. Owens
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Characterization of infrared polarizers
Author(s): Soe-Mie F. Nee; Teresa L. Cole; Chan Yoo; Dennis K. Burge
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Polarization properties of coated and uncoated parallel-slab multireflection beam splitters
Author(s): Aed M. El-Saba
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Analysis of poling-induced birefringence on the design of polarization-independent nonlinear optical polymeric devices
Author(s): Huajun Tang; Jeffery J. Maki; Ray T. Chen
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Fiber optic polarimetric temperature sensor with high sensitivity
Author(s): Jens C. Rasmussen; Bernhard Scholl
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Depolarization of infrared radiation reflected from rough surfaces
Author(s): Uri P. Oppenheim
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Vegetative target enhancement in natural scenes using multiband polarization methods
Author(s): Michael J. Duggin; Gerald J. Kinn; Edward H. Bohling
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MODIS polarization measurements and simulation and the 4O effect
Author(s): Eugene Waluschka
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Contrast enhancement in natural scenes using multiband polarization methods
Author(s): Michael J. Duggin; Gerald J. Kinn; Edward H. Bohling
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Investigation of atmospheric aerosol properties using ground-based spectropolarimeter
Author(s): Tsutomu Takashima; Kazuhiko Masuda
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Enhancement of vegetation mapping using Stokes parameter images
Author(s): Michael J. Duggin; Gerald J. Kinn; M. Schrader
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Stokes parameter imaging of scattering surfaces
Author(s): James D. Barter; Peter H.Y. Lee; H. R. Thompson; T. G. Schneider
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Influence of aerosol on the degree of linear polarization of skylight in the O2-A band
Author(s): Daphne M. Stam; Johan F. de Haan; Joop W. Hovenier; Piet Stammes
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Use of polarization for cloud study
Author(s): Philippe Goloub; Helene Chepfer; Maurice Herman; Gerard Brogniez; Frederic Parol
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Aerosol retrieval using the POLDER instrument: preliminary results
Author(s): Jean Luc Deuze; Philippe Goloub; Maurice Herman; D. Tanre; A. Marchand
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Application of an AOTF imaging spectropolarimeter
Author(s): Takao Suzuki; Hirohisa Kurosaki; Shigeharu Enkyo; Hajime Koshiishi
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High-spectral resolution polarization measurements of the atmosphere with the GOME BBM
Author(s): Ilse Aben; F. Helderman; Daphne M. Stam; Piet Stammes
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Mueller-matrix ellipsometry: a review
Author(s): Rasheed M. A. Azzam
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Four-port Fabry-Perot/Michelson interferometer: polarization-dependent response and ellipsometry
Author(s): Rasheed M. A. Azzam; M. Nazim Uddin
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Geometrical phase measurement with a Michelson interferometer for microsurface characterization
Author(s): Alexander V. Tavrov; Dmitry V. Ublinsky; Vladimir A. Andreev
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Polarimetric properties of atmospheric aerosols
Author(s): Itaru Sano; Sonoyo Mukai; Tsutomu Takashima
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Remote sensing of high-latitude wetlands using polarized wide-angle imagery
Author(s): Guillaume Perry; Joel Stearn; Vern C. Vanderbilt; Susan L. Ustin; Martha C. Diaz Barrios; Leslie A. Morrissey; Gerald P. Livingston; Francois-Marie Breon; Sophie Bouffies; Marc Leroy; Maurice Herman; Jean-Yves Balois
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Industrial applications on reflective or translucent samples of a novel automated Meuller-matrix scatterometer
Author(s): Francoise Delplancke
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Multiple scattering in chiral media: border effects, reduced depolarization, and sensitivity limit
Author(s): Francoise Delplancke; Jacques P. Badoz; Albert Claude Boccara
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Analysis of ground-based polarimetric sky radiance measurements
Author(s): Brian Cairns; Barbara E. Carlson; Andrew A. Lacis; Edgar E. Russell
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Polarizing properties of silver/glass nanocomposites
Author(s): Mark J. Bloemer; Joseph W. Haus
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Backscattering Mueller matrices from bead-blasted aluminium surfaces
Author(s): Gareth D. Lewis; David L. Jordan
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