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Proceedings of SPIE Volume 3098

Optical Inspection and Micromeasurements II
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Volume Details

Volume Number: 3098
Date Published: 17 September 1997
Softcover: 65 papers (602) pages
ISBN: 9780819425188

Table of Contents
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Inverse moire
Author(s): Jacques Harthong; Axel Becker
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Moire interferometry/termovision method for electronic package testing
Author(s): Leszek A. Salbut; Malgorzata Kujawinska
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Comparison of the moire two-beam phase-stepping and Fourier transform method techniques in Fizeau interferometry
Author(s): Benito Vasquez Dorrio; Jose Carlos Lopez Vazquez; Jose M. Alen; J. Bugarin; Antonio Fernandez; Angel F. Doval; Jesus Blanco-Garcia; Mariano Perez-Amor; J. L. Fernandez
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New grazing incidence microscope for the measurement of topography with a 2lambda-algorithm
Author(s): Klaus Koerner; Holger Fritz; Lajos Nyarsik; Hans-Hellmuth Fuchs
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Fast and flexible shape control with adaptive LCD fringe masks
Author(s): Martin Schoenleber; Hans J. Tiziani
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Optical metrology of difficult-to-access surfaces: micromeasurement of the inner profiles of diamond wiring dies
Author(s): Ferran Laguarta; I. Al-Khatib; Cristina Cadevall; Jesus Caum
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Interferometer for optical waviness and figure testing
Author(s): Klaus R. Freischlad
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Crossed data processing in spectrally resolved white-light interferometry
Author(s): Carmen Sainz; Antonio L. Guerrero
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Processing of white-light correlograms: simultaneous phase and envelope measurements by wavelet transformation
Author(s): Patrick Sandoz; Maxime Jacquot
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Interferometric testing of technical surfaces with computer-generated holograms
Author(s): Sven Brinkmann; Roland Schreiner; Thomas Dresel; Johannes Schwider
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Surface characterization of an internal combustion engine piston by angular speckle contouring
Author(s): Benno Staeger
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Three-dimensional analysis of machined surfaces by scatterometry
Author(s): Jorg W. Baumgart; Horst Truckenbrodt
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Microellipsometric surface measurement
Author(s): Jochen Doberitzsch; Wolfgang Holzapfel; Ulrich Neuschaefer-Rube
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Measurement and analysis of microtopography using wavelet methods
Author(s): Rolf-Juergen Recknagel; Gunther Notni
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Recent vibration analysis results at NTNU with video speckle interferometry
Author(s): Jesus D. R. Valera; Ole Johan Lokberg
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Vibration analysis by digital speckle pattern shearing interferometry
Author(s): Wolfgang Steinchen; Lian Xiang Yang; Gerhard Kupfer; Peter Maeckel; Anderas Thiemich
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Phase-shifted double single-pulse additive stroboscopic TV holography for the measurement of high-frequency vibrations using low-bandwidth phase-modulation devices
Author(s): Jose M. Alen; Angel F. Doval; J. Bugarin; Benito Vasquez Dorrio; Jose Carlos Lopez Vazquez; Antonio Fernandez; Jesus Blanco-Garcia; Mariano Perez-Amor; J. L. Fernandez
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Experimental modal analysis for vibration with large amplitude using moire topography
Author(s): Yasuhiko Arai; Shunsuke Yokozeki; Kazuhiro Shiraki
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Electronic speckle interferometry with pulsed lasers and practical applications
Author(s): Hans Steinbichler; Steffen Leidenbach
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Applications of 3D speckle interferometry to material and component testing
Author(s): Andreas Ettemeyer; Zhiguo Wang; Thomas Walz
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Applications of digital speckle photography in experimental mechanics
Author(s): Mikael Sjoedahl; Per Synnergren; Peder Johnson
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Modified electronic speckle pattern shearing interferometry for simultaneous derivative map measurements
Author(s): Grzegorz Dymny; Malgorzata Kujawinska; Stephan Waldner
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Laser speckle contrast analysis (LASCA) for flow measurement
Author(s): J. David Briers; Glenn J. Richards
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Methods of digital holography: a comparison
Author(s): Thomas M. Kreis; Mike Adams; Werner P. O. Jueptner
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Particle size and position measurement with digital holography
Author(s): Mike Adams; Thomas M. Kreis; Werner P. O. Jueptner
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Stroboscopic real-time holographic interferometry with photorefractive crystals applied to modal analysis
Author(s): Marc P. Georges; Philippe C. Lemaire
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Two methods for achieving subpixel resolution in phase difference determination by fringe pattern matching
Author(s): Zuobin Wang; Peter John Bryanston-Cross; Duc-Truong Pham
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Comparison of spatial self-filtering using numerical, photorefractive, and nonphotorefractive techniques
Author(s): Ernst Ulrich Wagemann; Hans J. Tiziani
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Two-step temporal phase unwrapping in profilometry
Author(s): Yves Surrel
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101-frame algorithm for phase-shifting interferometry
Author(s): Peter J. de Groot
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Optical heterodyne light source using laser diodes and its application to hybrid measurement
Author(s): Yukitoshi Otani; Tadaharu Nakano; Toru Yoshizawa
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Optical measurements using the spectral interferograms obtained at the output of the uncompensated Michelson interferometer
Author(s): Petr Hlubina
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Real-time dispersion curve measurement from spectrally resolved white-light interferometry
Author(s): Jose E. Calatroni; Carmen Sainz; Antonio L. Guerrero
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Source considerations for low-coherence speckle interferometry
Author(s): Itziar Balboa; Ralph P. Tatam
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New modulation technique for unambiguous measurements of phase changes in diode laser interferometers
Author(s): Igor Koltchanov; Klaus Petermann; Johannes Roths
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Stabilized Brillouin fiber ring laser (BFRL) using low-loss fused single-mode resonator couplers for application in distributed fiber sensor systems
Author(s): Matthias Moratzky; Siegmund Schroeter; E. Geinitz
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Condition and control monitoring of structures using an in-situ fiber optic system
Author(s): M. Jamieson; N. Hytiris; Mike J. Hepher; M. El Sharif
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Detection of eddy currents with a new laser-supported eddy current sensor
Author(s): Uwe Radtke; Horst-Artur Crostack; M. Maass
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Experimental results of the application of PLL and ALL noise reduction for an optical sensing system
Author(s): Olivier Jerome Dussarrat; D. Fraser Clark; T. J. Moir
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Microelectromechanical systems (MEMS) and their photonic application
Author(s): Yuji Uenishi; Koji Akimoto; Shinji Nagaoka
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3D-deformation analysis of microcomponents using digital holography
Author(s): Soenke Seebacher; Wolfgang Osten; Werner P. O. Jueptner
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Original approach to an optically active silicon-based interferometric structure for sensing applications
Author(s): Christophe Gorecki; Eric Bonnotte; Hiroshi Toshioshi; Fred Benoit; Hideki Kawakatsu; Hiroyuki Fujita
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Measurement of the nanometric deformation field in metallic microbars with microscopical ESPI
Author(s): Hubert A. Aebischer; Edoardo Mazza
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Interferometric displacement measurements performed with a self-mixing microinterferometer
Author(s): Johannes Roths; Martin Breinbauer; Bernhard Hilber; Christoph Gerz; Igor Koltchanov; Klaus Petermann
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Fast positioning of noncooperative objects
Author(s): Tobias Haist; Hans J. Tiziani
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Determination of 3D stress by optical sensor field tomography
Author(s): Dietrich Schupp
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Interferometric measurement of refractive index profiles for thin film characterization
Author(s): Colin J. R. Sheppard
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Wavelength dependence of the dynamic Faraday effect in magnetic liquids
Author(s): Beatrice Payet; Pascal Daveze; Lionel Delaunay
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Using dynamic Cotton and Mouton effect to study Brownian relaxation and magnetization of ferrofluids
Author(s): Pascal Daveze; Beatrice Payet; Lionel Delaunay
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Thermoelastic modeling: application to superresolution in photothermal and thermoelastic microscopy
Author(s): Bernard Cretin; N. Daher; Bruno Cavallier
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Plasmon spectroscopy for high-resolution angular measurements
Author(s): Johannes K. Schaller; Ralf Czepluch; Christo G. Stojanoff
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Three-dimensional measurement of the dynamical behavior of mechanical components with laser vibrometers
Author(s): Martin Sellhorst; Reinhard Noll
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Reflection and transmission imaging of nanostructures by an apertureless near-field optical microscope
Author(s): Reda Laddada; Pierre Michel Adam; Pascal Royer; Jean Louis Bijeon
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Tunnel noise spectroscopy by reflection SNOM and STM
Author(s): Pavel Tomanek; Lubomir Grmela; Jitka Bruestlova; Pavel Dobis
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Near-field imaging of the photocurrent on Au/GaAs interface with various wavelengths
Author(s): Stephane Davy; Michel Spajer; Daniel A. Courjon; Carlo Coluzza; R. Generossi; Antonio Cricenti; C. Barchesi; J. Almeida; G. Faini
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Nondestructive testing of microcracks using digital speckle pattern shearing interferometry
Author(s): Wolfgang Steinchen; Lian Xiang Yang; Gerhard Kupfer; Peter Maeckel
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Imaging of surface plasmons with a near-field microscope
Author(s): Victor Coello; Sergey I. Bozhevolnyi; Fedor A. Pudonin
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In-situ measurement of the water vapor concentration in industrial ovens by a user-friendly semiconductor laser system
Author(s): Peter Kohns; R. Stoermann; E. Budzynski; N. Walter; J. Knoop; R. Kuester
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Stable operation of uncoated laser diodes in an extended cavity configuration
Author(s): Peter Kohns
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Interferometric characterization of stress birefringence in germanium
Author(s): Ben Depuydt; Pierre Michel Boone; Piet Union; Peter F. Muys; Dirk Vyncke; Claus Goessens
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Measurement of an optical fiber using the spectral interferograms obtained at its output
Author(s): Petr Hlubina
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Transient bending wave analysis by Fourier evaluation of single-pulsed TV holography fringe patterns
Author(s): Antonio Fernandez; Angel F. Doval; J. Bugarin; Benito Vasquez Dorrio; Jose Carlos Lopez Vazquez; Jose M. Alen; Jesus Blanco-Garcia; Mariano Perez-Amor; J. L. Fernandez
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Measurement of the absorption of nonlinear crystals used for high-average-power frequency doubling
Author(s): Guido Mann; Stefan Seidel
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Integrated Optics Rotation Sensor (IORS)
Author(s): Colleen Mary Fitzpatrick; Victor Vali; Bruce R. Youmans; Ching Mei Yang; Michele Milbrodt; William J. Minford
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