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Proceedings of SPIE Volume 3094

Polarimetry and Ellipsometry
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Volume Details

Volume Number: 3094
Date Published: 1 April 1997
Softcover: 48 papers (392) pages
ISBN: 9780819425096

Table of Contents
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Polarization characteristics of quantum-well semiconductor structures
Author(s): Ivan S. Manak; Dmitrii V. Karasev; Valerii K. Kononenko; Sergei V. Nalivko; Aleksei A. Romanenko; Aleksei A. Vitalisov
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Polarization properties of light emission of AlGaAs double heterostructure injection lasers
Author(s): Ivan S. Manak; Yu. L. Zhuravskii; M. T. Klokova; Vasily L. Kasyutich
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Analysis of polarized light in multilayers
Author(s): Jaromir Pistora; Roman Kantor; Nicolas Negre; Kamil Postava; Romana Anyzova; Jaromir Seidl
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Stokes-Mueller formalism and Poincare sphere representation applied to studies of monomode optical fibers
Author(s): Pascal Olivard; Pierre-Yves Gerligand; Bernard Le Jeune; Jack Cariou; Jean Lotrian
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Weakly twisted optically anisotropic media: is there an analogy between Hi-Bi fibers and liquid crystals?
Author(s): Tomasz R. Wolinski
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Depolarization behavior of multiple scattered light from an optically dense random medium
Author(s): Christian Brosseau; D. Bicout; A. S. Martinez; J. M. Schmitt
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Static phase conjugator for pseudodepolarized laser beams
Author(s): Peter V. Polyanskii
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Associative data reconstruction for nonuniformly polarized optical fields
Author(s): Peter V. Polyanskii
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Polarization modulation polarimeter for an HPLC detector
Author(s): Yohji Shindo; Masanori Yazawa; Mituharu Izuka; Hideki Aoyama; Masao Kinnbara; Shiro Maeda
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Universal null polarimeter for crystal optics
Author(s): Oleg S. Kushnir; Orest G. Vlokh
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Computer-aided automatic polarimeter
Author(s): Aleksander Kiezun; Leszek R. Jaroszewicz; Ryszard Swillo
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Electrically switched compensator in high-accuracy polarimeter
Author(s): Yaroslav I. Shopa; Modest O. Kravchuk
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Nonmechanical azimuth change of a linear polarizer preceding a photodetector
Author(s): Chun Ye
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Compensation detector of birefringence
Author(s): Michael I. Shribak; Victor L. Kolpashchikov
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Magneto-optical modulators and isolators of partially polarized light
Author(s): Andrzej W. Domanski
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Overcoated wide-angle window designed for selected light wavelength
Author(s): Jerzy Ciosek
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Two-frequency He-Ne laser for heterodyne polarimetry and ellipsometry
Author(s): Valery G. Gudelev; Valery M. Yasinskii
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Null-polarimetric studies of waveplate parameters
Author(s): Oleg S. Kushnir; Orest G. Vlokh
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Polarimetric investigations of residual stresses in Czochralski-grown LiNbO3 single crystals
Author(s): Andrzej L. Bajor; Zbigniew Galazka
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Methods for determining optical parameters in gyrotropic crystals
Author(s): Alisa F. Konstantinova; E. A. Evdischenko
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Application of polarimetry in optical computerized tomography of anisotropic media
Author(s): S. Y. Berezhna; I. V. Berezhnyi; O. M. Krupych; Orest G. Vlokh
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Optical rotatory power of trigonal quartz and germanium dioxide single crystals
Author(s): Tatiana M. Glushkova; Dmitrii F. Kiselev; Marina M. Firsova; A. P. Styrkova
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Peculiarities of the optical anisotropy in lead germanate-type crystals
Author(s): Yaroslav I. Shopa; Modest O. Kravchuk; Orest G. Vlokh
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Polarimetry of semiconductor exciton spectra
Author(s): Z. B. Nitsovich; C. Yu. Zenkova; Bohdan M. Nitsovich
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Numerical and experimental study of corneal birefringence
Author(s): Jaroslaw W. Jaronski; Henryk T. Kasprzak; Elzbieta B. Jankowska-Kuchta
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Distributed polarimetric fiber optic sensors using a wavelength-scanning technique
Author(s): Serguei V. Miridonov; Mikhail G. Shlyagin; A. V. Khomenko; Diana Tentori-Santa-Cruz
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Polarization role in fiber optic interferometers
Author(s): Leszek R. Jaroszewicz
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Multiplexed polarimetric sensors with highly birefringent optical fibers for smart structures
Author(s): Tomasz R. Wolinski; Pawel Galazka; Jan Wojcik
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Nonlinear polarization-modulated ellipsometry
Author(s): Victor B. Taranenko; Vladimir Yu. Bazhenov; Olga A. Kulikovskaya
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Possibilities of ellipsometry with surface plasmon excitation in the investigation of thin films in comparison to separated ellipsometry and surface plasmon spectroscopy
Author(s): Eugene G. Bortchagovsky
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Characterization of thin metal films with overlayers by transparency and multiangle including surface plasmon excitation reflectance ellipsometry method
Author(s): Olga Yu. Borkovskaya; Nikolas L. Dmitruk; Oksana V. Fursenko
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Application of generalized ellipsometry to complex optical systems
Author(s): Mathias Schubert; Bernd Rheinlaender; John A. Woollam; Blaine D. Johs; Craig M. Herzinger
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Accuracy of traditional ellipsometry and complex ellipsometry-transmission photometry techniques for absorptive-film/transparent-substrate systems
Author(s): A. M. Kostruba; Orest G. Vlokh
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Comparison of the precision of a null-ellipsometer to an ellipsometer with a rotating analyzer
Author(s): Eugene G. Bortchagovsky; O. M. Getsko
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Ellipsometric studies of photochromic ultrathin polymer films
Author(s): Harald Knobloch; S. Katholy; Horst Orendi; J. Hesse; Dietrich Prescher; Ludwig Brehmer; Ralf Ruhmann
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Ellipsometry for determining the refractive index profiles of thin films
Author(s): Vladimir A. Tolmachev
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Ellipsometry for correctly determining the void fraction and true refractive index of thin films
Author(s): Vladimir A. Tolmachev
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Manifestation of optical activity in light reflection from gyrotropic uniaxial film
Author(s): Boris V. Nabatov; Alisa F. Konstantinova; A. Yu. Tronin
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Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multiwave ellipsometry
Author(s): Thomas Wagner; Blaine D. Johs; Craig M. Herzinger; Ping He; Shakil Pittal; John A. Woollam
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Ellipsometric investigation of implanted GaAs
Author(s): Miroslaw Kulik
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Determination of the optical model of the MOS structure with spectroscopic ellipsometry
Author(s): Andrzej Kudla; Danuta Brzezinska; Thomas Wagner; Zbigniew Sawicki
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Research of oxidation processes of a cadmium telluride film surface by ellipsometric method
Author(s): Lubov A. Zabashta; A. S. Opanasyuk; V. I. Kharchenko
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Ellipsometric studies of the effect of a metal island structure on the optic properties of a semiconductor surface
Author(s): Nikolas L. Dmitruk; Lubov A. Zabashta
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Practical aspects of multiple-angle ellipsometry of semiconductor structures
Author(s): Lubov A. Zabashta; Oleg I. Zabashta; Nikolas L. Dmitruk
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Polarization interference metrology for statistical parameters of optical fields
Author(s): Oleg V. Angelsky; Peter P. Maksimyak
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Determination of anisotropic film thickness, complex reflective indices, and their dispersion from reflectance spectra
Author(s): Valery N. Filippov; Vitaly P. Kutavichus
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Thin-film analysis based on the ratio of envelopes of the reflectance spectra measured at two incident angles
Author(s): Valery N. Filippov
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Effect of matching layer on polarization photosensitivity of an AIIIBV Schottky-barrier photodetector monolithically integrated with an optical waveguide
Author(s): Nikolas L. Dmitruk; Oksana V. Fursenko; Olga I. Mayeva
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