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Fabrication, Testing, and Reliability of Semiconductor Lasers II

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Volume Details

Volume Number: 3004
Date Published: 1 May 1997

Table of Contents
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WDM laser arrays with 2-nm channel spacing fabricated using a grating phase mask
Author(s): David Robert McDonald; Jin Hong; Frank R. Shepherd; Carla J. Miner; M. Cleroux; S. Ojha; R. Baulcomb; C. Rogers; S. J. Clements
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Highly efficient 808-nm-range Al-free lasers by gas source MBE
Author(s): Alexander Ovtchinnikov; Jari T. Nappi; Jaan Aarik; Stefan Mohrdiek; Harry M. Asonen
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Strain-compensated InGaAs/GaAsP/InGaP laser
Author(s): Niloy K. Dutta; William S. Hobson; Daryoosh Vakhshoori; John Lopata; George J. Zydzik
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VCSELs for 640- to 1100-nm emission
Author(s): Terry E. Sale; John Stuart Roberts; John P. R. David; R. Grey; Peter N. Robson
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Semiconductor optical amplifier for wavelength conversion in subcarrier multiplexed systems
Author(s): Paul N. Freeman; Niloy K. Dutta
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Grating-coupled surface emitters with built-in beam control
Author(s): Anders G. Larsson; Niklas Eriksson; Ming Li; Sigurgeir Kristjansson; Mats Hagberg
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Operational stability of 980-nm pump lasers at 200 mW and above
Author(s): Albert Oosenbrug; Abram Jakubowicz
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Some quality issues of low-cost 1300-nm laser diodes packaged in receptacles
Author(s): Marie Morin; S. Prigent; G. Terol; Pascal Y. Devoldere
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Electrostatic discharge damage to pump lasers while operating
Author(s): Richard G. S. Plumb; Anna M. Jeziorska
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Vertical-cavity surface-emitting lasers: the applications
Author(s): Robert A. Morgan; John A. Lehman; Mary K. Hibbs-Brenner; Yue Liu; Julian P. G. Bristow
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Reliability of a 1550-nm MQW DFB high-power laser source
Author(s): John D. Evans; I. G. A. Davies; A. Richard Goodwin; Jeffrey C. Yu; Adrian P. Janssen
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Life testing and failure analysis of GaN/AlGaN/InGaN light-emitting diodes
Author(s): Marek Osinski; Daniel L. Barton; Christopher J. Helms; Niel H. Berg; Piotr Perlin
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Characteristics of VCSELs and VCSEL arrays for optical data links
Author(s): Craig A. Gaw; Wenbin Jiang; Michael S. Lebby; Philip A. Kiely; Paul R. Claisse
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Aging behavior of high-power laser arrays monitored by photocurrent spectroscopy
Author(s): Jens Wolfgang Tomm; A. Baerwolff; Uwe Menzel; Ch. Lier; Thomas Elsaesser; Franz X. Daiminger; Stefan Heinemann
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EBIC and TEM analysis of catastrophic optical damage in high-power GaAlAs/GaInAs lasers
Author(s): Robert E. Mallard; Rick D. Clayton
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High-speed characteristics of VCSELs
Author(s): Jim A. Tatum; David Smith; James K. Guenter; Ralph H. Johnson
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Longitudinally resolved measurements of carrier concentration and gain in 980-nm InGaAs/GaAs high-power quantum well lasers
Author(s): Andrew J. Bennett; Edward H. Sargent; Rick D. Clayton; H. B. Kim; Jing Ming Xu
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Use of silicon Vee groove technology in the design and volume manufacture of optical devices
Author(s): Robert Cann; Paul Harrison; David A.H. Spear
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