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Machine Vision Applications, Architectures, and Systems Integration V
Editor(s): Susan Snell Solomon; Bruce G. Batchelor; Frederick M. Waltz
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Volume Details

Volume Number: 2908
Date Published: 31 October 1996
Softcover: 31 papers (284) pages
ISBN: 9780819423108

Table of Contents
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Developments in high-speed inspection using intelligent CCD cameras
Author(s): Dan A. Lehotsky
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High-speed electron beam data verification system using high-performance neural network accelerator board
Author(s): Toshiyuki Tamura; Dominique Bouchon; Pierre Fournier; Koichi Moriizumi; Ken-ichi Tanaka; Kazuo Kyuma
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Optical system for real-time web-process defect inspection
Author(s): James S. Harris
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Color AC plasma panel barrier measurement system
Author(s): John W. V. Miller; Timothy A. Kohler; Behrouz N. Shabestari; R. Sweney
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Sheep-pelt grading using laser scanning and pattern recognition
Author(s): Chris C. Bowman; Peter J. Hilton; P. Wayne Power; Michael P. Hayes; Richard P. Gabric
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Novel high-speed architecture for machine vision applications
Author(s): Bassam S. Farroha; R. G. Deshmukh
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Novel RAM-based neural networks for object recognition
Author(s): Gareth Howells; Michael C. Fairhurst; David Bisset
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Automated matching technique for identification of fingerprints
Author(s): Dinesh P. Mital; Eam-Khwang Teoh; S. K. Amarasinghe
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Neural-network-based system for recognition of partially occluded shapes and patterns
Author(s): Dinesh P. Mital; Eam-Khwang Teoh; S. K. Amarasinghe; P. N. Suganthan
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Using TDI camera with nonzero viewing angles for surface inspection
Author(s): Jari Miettinen; Xu Zelin; Heikki J. Ailisto
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System for characterizing small fibers
Author(s): John W. V. Miller; Timothy A. Kohler; Jaroslaw P. Sacha; Behrouz N. Shabestari
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Vision-based coin inspection system
Author(s): Erhard Schubert; Markus Becker
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Multiscale data analysis for leather defect detection
Author(s): Antonella Branca; Giovanni Attolico; Arcangelo Distante
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Automatic machine vision for lace inspection
Author(s): Hamid R. Yazdi; Tim King
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Programmable CCD camera equipped with user-configurable video rate digital video processing for use in industrial inspection
Author(s): James W. Roberts; J. Wynen
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Surface segmentation of laser range images for automated facility mapping
Author(s): Ralph J. Pinheiro; Carl D. Crane; James S. Tulenko; Dean Haddox
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New multiexpert architecture for high-performance object recognition
Author(s): Michael C. Fairhurst; A. Fuad R. Rahman
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One-dimensional Fourier transform coefficients for rotation-invariant texture classification
Author(s): Hamzah Arof; Farzin Deravi
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Automated x-ray detection of contaminants in continuous food streams
Author(s): David W. Penman
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Parallel algorithms for real-time tracking
Author(s): Robert R. Goldberg; Meir Roth
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Adaptive object's motion parameters evaluation in the presence of non-steady-state background by high-resolving TV observing system
Author(s): Alexander V. Helvas; Dmitry M. Mirov; Alexey E. Kirillov; Kirill Yu. Schastlivets
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Research on rapid agile metrology for manufacturing based on real-time multitask operating system
Author(s): Jihong Chen; Zhen Song; Daoshan Yang; Ji Zhou; Shawn Buckley
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Improving the method of testing tensile strength of material by 3D image
Author(s): Yin-Liang Yuan; Yawei Wang; Bai-Qiang Xu
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Compact optical correlator for machine vision with optically addressed bacteriorhodopsin spatial light modulator
Author(s): D. Sanchez; Drew A. Pommet; Michael A. Fiddy
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Height data from gradient maps
Author(s): Reinhard Klette; Karsten Schluens
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High-performance image processing system for powder mixture analysis
Author(s): Yufeng Liang
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System for high-speed image sequence acquisition
Author(s): Stephen M. Wiener; Yufeng Liang; Cunhong Jiang
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High-frame-rate display system for study of motion perception
Author(s): Manpreet Kaur; Yufeng Liang
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Prolog-based prototyping software for machine vision
Author(s): Bruce G. Batchelor; Ralf Hack; Andrew C. Jones
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Automated generation of finite-state machine lookup tables for binary morphology
Author(s): Frederick M. Waltz
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Multimedia extensions to prototyping software for machine vision
Author(s): Bruce G. Batchelor; Eric C. Griffiths; Ralf Hack; Andrew C. Jones
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