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PROCEEDINGS VOLUME 2873

International Symposium on Polarization Analysis and Applications to Device Technology
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Volume Details

Volume Number: 2873
Date Published: 16 August 1996
Softcover: 86 papers (364) pages
ISBN: 9780819422712

Table of Contents
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Keynote Speech: Recent developments of division-of-amplitude photopolarimeters
Author(s): Rasheed M. A. Azzam
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Mueller matrix imaging polarimetry: an overview
Author(s): Russell A. Chipman; Elizabeth A. Sornsin; J. Larry Pezzaniti
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High-sensitivity two-dimensional observation of thermal birefringence in the laser diode pumped solid state lasers
Author(s): Hiromitsu Kiriyama; Takuji Yoshida; Masanobu Yamanaka; Yasukazu Izawa; Tatsuhiko Yamanaka; Sadao Nakai; Chiyoe Yamanaka
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Measurement of low-level strain birefringence in optical elements using a photoelastic modulator
Author(s): Theodore C. Oakberg
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Retardation-modulated differential interference microscope and its application to 3D shape measurement
Author(s): Hiroshi Ishiwata; Masahide Itoh; Toyohiko Yatagai
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Application of spectro-polimetry for remote sensing
Author(s): Hajime Koshiishi; Ushin Lai; Takao Suzuki; Hirohisa Kurosaki
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Simultaneous measurement of linear and circular birefringence with heterodyne interferometry
Author(s): Hiroyuki Kowa; Kanae Muraki; Mitsuo Tsukiji; Atsuo Takayanagi; Norihiro Umeda
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Real-time measurement of two-dimensional birefringence
Author(s): Keigo Itoh; Teruhisa Okhawa; Yongchang Zhu; Tatsuo Takada; Takashi Maeno
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Dynamic observation of surface charge distribution by electro-optic Pockels effect technique
Author(s): Keiji Iizuka; Yongchang Zhu; Tatsuo Takada
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Dynamic variation of internal stress distribution in the curing process of epoxy resin using highly sensitive birefringence measurement system
Author(s): Shigekazu Yamagishi; Yasuhiro Sekine; Yongchang Zhu; Tatsuo Takada
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Measurement of the magneto-optical Kerr effect using a polarimetric method
Author(s): Sang-Youl Kim; Hyeon Gon Lee; Y. H. Won
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Development of an imaging spectro-polarimeter
Author(s): Takao Suzuki; Hirohisa Kurosaki; Shigeharu Enkyo; Hajime Koshiishi
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Optical CT imaging in highly scattering media by extraction of photons preserving initial polarization
Author(s): Hiromichi Horinaka; K. Hashimoto; Kenji Wada; T. Umeda; Yoshio Cho
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Measurement of molecular orientation of polymer films during rapid elongation process by means of birefringence using phase modulation technology
Author(s): Kentaro Egoshi; Yoshihiro Mochida
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Characterization of the polarization properties of a laser output from a CO2 laser with a special intracavity mirror
Author(s): Moriaki Wakaki; Hiroo Motegi; Yuichi Komachi; Genichi Kanai
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Optical polarization measurements of exciton-Zeeman splitting and carrier-spin relaxation in ZnxCd1-xSe/ZnSe multiquantum wells
Author(s): Takanari Yasui; Baoping Zhang; T. Yasuda; Yusaburo Segawa
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First thin film ellipsometry at a photon energy of 97eV with use of high-performance multilayer polarizers
Author(s): Masaki Yamamoto; K. Mayama; Hidekazu Kimura; Minaji Furudate; Mihiro Yanagihara
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Development of EUV free-standing multilayer polarizers
Author(s): Weibing Hu; Masaki Yamamoto; Makoto Watanabe
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Birefringence-sensitive interference microscope
Author(s): Kallol Bhattacharya
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Element-specific soft x-ray magneto-optic rotation studies of magnetic films and multilayers
Author(s): Jeffrey B. Kortright; Marybeth Rice
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Progress report on recent research with polarizing undulator
Author(s): Hideo Onuki; Kazutoshi Yagi; Koichi Awazu; Toru Yamada; Terubumi Saito; M. Yuri; Yutaka Inoue; S. Ishizaka
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Polarization studies on the B 1s exciton emission from h-BN using a soft x-ray multilayer polarizer
Author(s): Noboru Miyata; Mihiro Yanagihara; Minaji Furudate; T. Ejima; Makoto Watanabe
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Faraday effect and x-ray birefringence at cobalt K-absorption edge with the tunable x-ray polarimeter
Author(s): Kouhei Okitsu; Toshiaki Oguchi; H. Maruyama; Yoshiyuki Amemiya
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Superflat high-reflectivity semitransparent polarizer for soft x-ray
Author(s): Tsuneyuki Haga; Marcia C. K. Tinone; Masaru Shimada; Takashi Ohkubo; Akira Ozawa
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Reference measurement for fiber optic polarimetric sensors
Author(s): Jens C. Rasmussen; Bernhard Scholl; Hans Juergen Schmitt
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In-situ growth control of x-ray multilayers using visible light kinetic ellipsometry and grazing incidence x-ray reflectometry
Author(s): Eike Luken; Eric Ziegler; Manohar Lingham
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Fast birefringence measurement using right and left hand circulary polarized laser
Author(s): Norihiro Umeda; Sho Wakayama; Shinsuki Arakawa; Atsuo Takayanagi; Hiroyuki Kohwa
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Heterodyne interferometer for film thickness and refractive index measurements of optical thin film
Author(s): Nobuhiro Shimizu; Junya Yuguchi; Hideo Takahashi
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Innovative miniature differential laser Doppler interferometer
Author(s): Chih-Kung Lee; G. Y. Wu; T. D. Perng; S. J. Chiang; Wen-Jong Wu
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Measurements of the ellipsometric parameters of optical components inside an active laser
Author(s): Wolfgang Holzapfel; Stephan Neuschaefer-Rube
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Automated spectroscopic ellipsometry for characterization of complex multilayers for 550x650x0.7-mm LCD production control
Author(s): Dorian Zahorski; Jean-Louis P. Stehle; Jean-Philippe Piel; Jean Pierre Rey; L. Escadafals; Akira Iwasaki; Y. Kamiyama
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In-situ monitor and control using fast spectroscopic ellipsometry
Author(s): John A. Woollam; Xiang Gao; Scott Heckens; James N. Hilfiker
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Compact polarization analyzer for a free-space/fiber lightwave
Author(s): Osamu Mikami; Tohru Kodaira; Yukata Yoribayashi; Takayuki Sugeta
Infrared reflection polarizers using uniform and diffuse low-index layers buried in high-index substrates
Author(s): Rasheed M. A. Azzam; Mostofa M. K. Howlader
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Fast ellipsometry and Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter
Author(s): Shankar Krishnan; Paul C. Nordine
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Retardation measurements of light scattered by metallic rough surfaces
Author(s): Naoki Nagashima; Yasushi Sawada; Norimichi Shibuya; Kazuhiko Oka; Yoshihiro Ohtsuka
Measurement of two-dimensional birefringence distribution for laser materials
Author(s): Yukitoshi Otani; Toru Yoshizawa
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Vibration detection using photorefractive two-wave mixing in KNSBN:Cu crystal and its polarization effect
Author(s): Isao Oda; Yukitoshi Otani; Dieter Just; Liren Liu; Toru Yoshizawa
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In-situ ellipsometric study of growth of Au thin films
Author(s): Takehisa Shibuya; Naoji Amano; Shuichi Kawabata; Hideshi Yokota
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Ellipsometric topometry for technical surfaces
Author(s): Wolfgang Holzapfel; Ulrich Neuschaefer-Rube; Jochen Doberitzsch
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Photoelastic microellipsometer: a new tool for high-resolution force vector measurements
Author(s): Wolfgang Holzapfel; Ulrich Neuschaefer-Rube; Stephan Neuschaefer-Rube
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In-situ ultrahigh vacuum spectroscopic ellipsometry
Author(s): Tomoyuki Fukazawa; Kazuki Ishihara; Yoichi Hoshi; Shuichi Kawabata
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Spectroscopic ellipsometry and photometry applied to color filter characterization
Author(s): Christophe Defranoux; Jean-Philippe Piel; Jean-Louis P. Stehle
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Spectroellipsometric study of amorphous thin films
Author(s): Tomuo Yamaguchi; Ahalapitiya Hewage Jayatissa; K. Kawanishi; M. Aoyama
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Orthogonal linear polarized laser wave oscillation in a thin film integrated laser chip for MO disk signal detection
Author(s): Kenya Goto
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Mueller matrix polarimetry of electro-optic PLZT spatial light modulators
Author(s): Elizabeth A. Sornsin; Russell A. Chipman
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Novel superbroadband reflective polarizer
Author(s): Le Li; Sadeg M. Faris
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Optical retardance standard: a progress report
Author(s): Kent B. Rochford; Allen H. Rose; Paul A. Williams; I. G. Clarke; Paul D. Hale; Gordon W. Day
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Recording and readout properties of PRIZ spatial light modulator in photorefractive crystal
Author(s): Kiyoshi Nakagawa; Takumi Minemoto
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Simultaneous oblique deposition from opposite azimuthal directions for fabrication of thin film retardation plates
Author(s): Tomoyoshi Motohiro; Yasuhiko Takeda; Tatsumi Hioki; Shoji Noda
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Subwavelength gratings optimized for broadband quarter-wave plates
Author(s): Hisao Kikuta; Yasushi Ohira; Koichi Iwata
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Dual-beam light-scattering tomography (LST) for detection of functional defects in nonlinear optical crystals
Author(s): Tomoya Ogawa; Satoru Kawaai; Qiguang Tan; Nobuhito Nango
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Characterization of modulation-doped n-AlxGa1-xAs/GaAs heterostructure using spectroscopic ellipsometry and photoreflectance
Author(s): Cheong Chee Wong; Maho Mochizuki; Hiroyuki Yaguchi; Tadashi Saitoh; Yi-Ming Xiong
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Ellipsometric study of rare gas films physisorbed on a surface of a metal single crystal
Author(s): Sin-ichi Igarashi; Takato Hirayama; Ichiro Arakawa; Yukio Abe
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Determination of microstructure related optical constants of titanium dioxide thin films using optical methods
Author(s): Sang-Youl Kim; Hee Jung Kim; Hyun-Mo Cho; Yun Woo Lee
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Effect of crystalline orientation on photoelastic constant of Si single crystal
Author(s): Kenji Gomi; Yasushi Niitsu
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Transient state of polarization in optical ground wire caused by lightning and impulse current
Author(s): Masahiro Kurono; K. Isawa; Masayuki Kuribara
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Initial plasma oxidation of silicon studied by real-time ellipsometry
Author(s): Masahiro Kitajima; I. Kamioka; T. Kurashina; Keikichi G. Nakamura
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Birefringence induced by residual strain in optically isotropic III-V compound crystals
Author(s): Masayuki Fukuzawa; Masayoshi Yamada
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Some aspects of linear and circular magnetic birefringences utilized for studying the phase transitions of transparent magnetic crystals
Author(s): Katsunoti Iio; Tetsuya Kato; Nobuo Nakajima
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Optical properties of ion-implanted laser-annealed Si studied by spectroscopic ellipsometry
Author(s): Keiichiro Asai; Kenichi Watanabe; Toshiyuki Sameshima; Tadashi Saitoh; Yi-Ming Xiong
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Optical properties of sol-gel Ba0.7Sr0.3 TiO3 thin films studied by spectroscopic ellipsometry
Author(s): Iwao Suzuki; Masaru Miyazaki; Tadashi Saitoh; Yi-Ming Xiong
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Investigation of anisotropic effect on the optical properties of InxGa1-xP using spectroscopic ellipsometry
Author(s): Kenichi Watanabe; Tadashi Saitoh; Yi-Ming Xiong
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Characterization of Si delta-doped GaAs using photoellipsometry and photoreflectance
Author(s): Maho Mochizuki; Kenichiro Kobayashi; Hiroyuki Yaguchi; Tadashi Saitoh; Yi-Ming Xiong
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In-situ ellipsometric study of the phenomenon of photodoping of Ag metal into a-As2S3 film
Author(s): Shuichi Kawabata; Yuka Miyanishi; Tsumoto Ogawa; Moriaki Wakaki
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Spectroellipsometric characterization of SIMOX with a very thin Si layer
Author(s): Tomuo Yamaguchi; Ahalapitiya Hewage Jayatissa; S. Tonooka; M. Aoyama; M. Tabe; Y. Kanda
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Spectroellipsometric study of sulphur passivation of InAs
Author(s): Tomuo Yamaguchi; K. Ohshimo; Ahalapitiya Hewage Jayatissa; M. Aoyama; X. Y. Gong; Toshihiko Makino; Hirofumi Kan
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Polarization effect of the in-vivo cornea
Author(s): Maung H. Khin; Shuichi Kawabata; Kazuo Ishikawa; Toyohiko Hatada; Hitoshi Ohzu
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Single-shot excimer laser annealing of PECVD amorphous silicon
Author(s): Pierre Boher; Dorian Zahorski; Sylvie Prochasson; Bruno Godard; Jean-Louis P. Stehle; Y. Suzuki; Akira Iwasaki
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Characterization of laser-annealed polysilicon by spectroscopic ellipsometry and comparison to other techniques
Author(s): Pierre Boher; Jean-Louis P. Stehle; Y. Suzuki; Akira Iwasaki
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Fine characterization of ITO layers by spectroscopic ellipsometry
Author(s): Pierre Boher; Christophe Defranoux; Jean-Philippe Piel; Jean-Louis P. Stehle; Y. Suzuki
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Polarization-converting devices using a UV curable liquid crystal
Author(s): Shin Masuda; Toshiaki Nose; Rumiko Yamaguchi; Susumu Sato
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Nematic liquid crystal variable retarder and retardation modulator
Author(s): H. W. Lee; Chih-Kung Lee
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Circular dichroism and optical rotary dispersion spectra of light-scattering media
Author(s): Alexander A. Kokhanovsky
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Optical properties of liquid metals studied by spectroscopic ellipsometry
Author(s): Shankar Krishnan; Koji J. Yugawa; Paul C. Nordine
Compensation detector of birefringence
Author(s): Michael I. Shribak; Victor L. Kolpashchikov
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Optical films for liquid crystal display
Author(s): Yasuo Fujimura
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Tunable birefringent filters using liquid crystal variable retarders
Author(s): Greg A. Kopp
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Polarization modulation of a nematic liquid crystal grating
Author(s): Zhan He; Toshiaki Nose; Susumu Sato
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Method of measure the thickness of liquid crystal layer using phase plate
Author(s): Masami Ito; Atsushi Fukui; Kanji Nishii; Kenji Takamoto
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Thickness and index measurements of 8-um liquid crystal gap between plates by spectroscopic ellipsometry
Author(s): Christophe Defranoux; Jean-Louis P. Stehle
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Fiber optic polarization synthesizer
Author(s): Bernhard Scholl; Jens C. Rasmussen; Hans Juergen Schmitt
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