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Proceedings of SPIE Volume 2805

Multilayer and Grazing Incidence X-Ray/EUV Optics III
Editor(s): Richard B. Hoover; Arthur B. C. Walker
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Volume Details

Volume Number: 2805
Date Published: 19 July 1996
Softcover: 36 papers (358) pages
ISBN: 9780819421937

Table of Contents
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Advanced X-Ray Astrophysics Facility (AXAF)
Author(s): Martin C. Weisskopf; Stephen L. O'Dell; Leon P. Van Speybroeck
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Monitoring program for the coating of the AXAF flight optics
Author(s): Suzanne E. Romaine; Ricardo J. Bruni; Anna M. Clark; William A. Podgorski; D. Schultz; Daniel A. Schwartz; Leon P. Van Speybroeck; Ying Zhou; Robert Edward Hahn; George T. Johnston; Andrew J. Longmire; J. T. Humphreys; Alan P. Shapiro; R. Tjulander; E. Barinek
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Verification of the coating performance for the AXAF flight optics based on reflectivity measurements of coated witness samples
Author(s): Ricardo J. Bruni; Anna M. Clark; James M. Moran; Dan T. Nguyen; Suzanne E. Romaine; Daniel A. Schwartz; Leon P. Van Speybroeck
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Performance modeling of grazing incidence optics with structural deformations and fabrication errors
Author(s): David E. Zissa; Anees Ahmad; Chen Feng
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ACIS UV/optical blocking filter calibration at the National Synchrotron Light Source
Author(s): George Chartas; Gordon P. Garmire; John A. Nousek; Leisa K. Townsley; Forbes R. Powell; Richard L. Blake; Dale E. Graessle
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Characteristics of the flight model optics for the JET-X telescope onboard the Spectrum-X-Gamma satellite
Author(s): Oberto Citterio; Sergio Campana; Paolo Conconi; Mauro Ghigo; Francesco Mazzoleni; Ennio Poretti; Giancarlo Conti; Giancarlo Cusumano; Bruno Sacco; Heinrich W. Braeuninger; Wolfgang Burkert; Roland Egger; Christian M. Castelli; Richard Willingale
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Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes
Author(s): Ahsen M. Hussain; Karsten Dan Joensen; P. Hoeghoej; Finn Erland Christensen; Eric Louis; Harm-Jan Voorma; Yang Soong; Nicholas E. White; Ian S. Anderson
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Soft x-ray calibration of the Co/C multilayer mirrors for the Objective Crystal Spectrometer on the Spectrum Roentgen-Gamma satellite
Author(s): Salim Abdali; Charles Tarrio; Finn Erland Christensen; Herbert W. Schnopper
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Lobster-eye x-ray telescope prototype
Author(s): Paul Gorenstein; Elizabeth Whitbeck; Gerald K. Austin; Almus T. Kenter; Ladislav Pina; Adolf Van Inneman; Rene Hudec
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Role of sampling errors in the specification of x-ray mirror surfaces
Author(s): Eugene L. Church; Peter Z. Takacs
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Surface characterization of an XMM mandrel at the European Synchrotron Radiation Facility: part II
Author(s): Samuel Gougeon; Olivier Hignette; Andreas K. Freund; Ulrich Lienert; Philippe Gondoin; Daniel de Chambure
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Penta-Prism Long Trace Profiler (PPLTP) for measurement of grazing incidence space optics
Author(s): Shinan Qian; Haizhang Li; Peter Z. Takacs
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Solar X-ray Imager (SXI) optical performance analysis
Author(s): Martin E. Smithers; David E. Zissa
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Subarcsecond x-ray telescope for imaging the solar corona in the 0.25- to 1.2-keV band
Author(s): Dennis J. Gallagher; Webster C. Cash; Schuyler Jelsma; Jason Farmer
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Transmission maps of the ACIS UV/optical blocking filters
Author(s): Leisa K. Townsley; Forbes R. Powell; James F. MacKay; Max G. Lagally; John A. Nousek; Gordon P. Garmire
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High-resolution grazing incidence x-ray spectrometer and its characteristics
Author(s): Xianxin Zhong; Shaotang He
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High-efficiency holographic ion-etched gratings with multilayer coatings and operating on-blaze at normal incidence in the 125- to 300-A range
Author(s): John F. Seely; Michael P. Kowalski; Raymond G. Cruddace; Jack C. Rife; Troy W. Barbee; William R. Hunter; Glenn E. Holland
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Double multilayer monochromator for harmonic rejection in the 5-to60-keV range
Author(s): Manohar Lingham; Eric Ziegler; Eike Luken; Paul W. Loeffen; Stefan Muellender; Jose Goulon
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Design of stigmatic gratings for grazing incidence monochromator spectrographs
Author(s): Alexander V. Savushkin
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Electromagnetic theory of multilayer gratings and zone plates
Author(s): Michel Neviere; Frederic Montiel
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Characterization of x-ray polycapillary optics with a high-resolution x-ray optical bench
Author(s): Terrence Jach; Eric Steel; Huaiyu Heather Chen-Mayer; Johannes B. Ullrich; Robert Gregory Downing; Stephen Thurgate
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Fabrication and test of one-dimensional Bragg-Fresnel lens using Ag/Al multilayer zone plate
Author(s): Masaki Koike; Isao H. Suzuki; Satoshi Komiya; Yoshiyuki Amemiya
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Development of capillary optics for microbeam applications with synchrotron radition
Author(s): Reinhard Pahl; Donald H. Bilderback
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MCP-based x-ray collimators for lithography of semiconductor devices
Author(s): Adam N. Brunton; John Ernest Lees; George W. Fraser; Anton S. Tremsin; W. Bruce Feller; Paul L. White
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Diffractive-optic telescope for x-ray astronomy
Author(s): Daniel Dewey; Thomas H. Markert; Mark L. Schattenburg
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Multilayer supermirror coating for hard x-ray telescope
Author(s): Yuzuru Tawara; Koujun Yamashita; Hideyo Kunieda; Kazutoshi Haga; Kazuya Akiyama; Akihiro Furuzawa; Yuichi Terashima; Peter J. Serlemitsos
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Radiometric measurements for the purposes of the permanent space patrol of the solar EUV and soft x-ray radiation
Author(s): Sergey V. Avakyan
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Possibility of creation of high-quality x-ray carbon mirrors
Author(s): Pavel E. Kondrashov; Igor S. Smirnov; Elena G. Novoselova; Alexander M. Baranov; G. F. Ivanovsky
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Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples
Author(s): Anna M. Clark; Ricardo J. Bruni; Suzanne E. Romaine; Daniel A. Schwartz; Leon P. Van Speybroeck; P. W. Yip; Alvin J. Drehman; Alan P. Shapiro
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EUV spectrometric facility with laser-focus plasma radiation source
Author(s): Valeri O. Papanyan; Gagik Ts. Nersisyan
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X-ray interferometry technique for mirror and multilayer characterization
Author(s): Igor A. Schelokov; Olivier Hignette; Carsten Raven; Anatoly A. Snigirev; Irina Snigireva; Alexey Suvorov
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Superfinish technology for enhanced grazing incidence reflectivity in x-ray telescopes
Author(s): Roland Graue; Giuseppe Valsecchi
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Reflectance calibrations of AXAF witness mirrors using synchrotron radiation: 2 to 12 keV
Author(s): Dale E. Graessle; Anna M. Clark; Jonathan J. Fitch; Bernard Harris; Daniel A. Schwartz; Richard L. Blake
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Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV
Author(s): Jonathan J. Fitch; Dale E. Graessle; Bernard Harris; John P. Hughes; Dan T. Nguyen; Daniel A. Schwartz; Richard L. Blake
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Iridium optical constants from x-ray transmission measurements over 2 to 12 keV
Author(s): Bernard Harris; Dale E. Graessle; Jonathan J. Fitch; Jiahong Zhang Juda; Richard L. Blake; Mark L. Schattenburg; Eric M. Gullikson
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Soft x-ray (2 to 6 keV) spectroscopy using gratings at extreme grazing incidence
Author(s): Alessio Boscolo; Luca Poletto; Giuseppe Tondello
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