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Proceedings of SPIE Volume 2782

Optical Inspection and Micromeasurements
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Volume Details

Volume Number: 2782
Date Published: 18 September 1996
Softcover: 89 papers (858) pages
ISBN: 9780819421685

Table of Contents
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Coherence multiplexing and applications to desitributed microsensors and integrated optics
Author(s): Jean-Pierre Goedgebuer; Henri Porte; Wilhelm Elflein
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Micromeasurements: a challenge for photomechanics
Author(s): Malgorzata Kujawinska; Ryszard J. Pryputniewicz
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Computerized interferometric measurement of surface microstructure
Author(s): James C. Wyant; Joanna Schmit
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Double spectral modulation for surface analysis
Author(s): Jose E. Calatroni; Patrick Sandoz; Gilbert M. Tribillon; Herve Perrin
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Optical flying-height testing of magnetic read-write heads
Author(s): Peter J. de Groot; Leslie L. Deck; James A. Soobitsky; James F. Biegen
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Measuring roughness with dichromatic speckle correlation
Author(s): Joerg Peters; Peter Lehmann; Armin Schoene
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Differential optical profilometer using a single-probe beam
Author(s): N. B. E. Sawyer; Chung Wah See; Michael G. Somekh
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Use of CCD arrays versus PSD detectors in an optical triangulation-based microtopographer
Author(s): Manuel Filipe M. Costa
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Application of a PLL and ALL noise reduction for an optical sensing system
Author(s): Olivier Jerome Dussarrat; D. Fraser Clark; T. J. Moir
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Development and laboratory tests of deformation fiber optic sensors for civil engineering applications
Author(s): Laurent Vulliet; Nicoletta Casanova; Daniele Inaudi; Annette Osa-Wyser; Samuel Vurpillot
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Photothermal inspection of material changes in ceramic surfaces induced by mechanical load or laser treatment
Author(s): Bernhard Schmitz; Jurgen Geerkens; Gert Goch
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Integrated structural evaluation: combining ultrasonics and optics
Author(s): Brian Culshaw; S. Gareth Pierce; Wayne R. Philp; W. Craig Michie
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Noncontact phosphor thermometry for process control
Author(s): Michael R. Cates; David L. Beshears; Stephen W. Allison
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Micronic intensity analysis and imaging in laser optics by means of micro-thermoelectrical sensors
Author(s): Laurent Thiery; Jean-Pierre Prenel
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Study of magneto-optical properties in magnetic liquids from ac measurements
Author(s): Lionel Delaunay; Beatrice Payet
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Steps towards the use of DSPI for high-temperature strain measurement
Author(s): Petra Aswendt; Roland Hoefling
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Measurement of the strain field in a micrometer-sized region at a notch-tip
Author(s): Edoardo Mazza; Jurg Dual; C. R. Musil; Gaudenz Danuser; Martin Vetterli
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Interferometric deformation measurement using object-induced dynamic phase-shifting
Author(s): Xavier Colonna de Lega; Pierre M. Jacquot
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Observing deformations of 20 nm with a low-numerical aperture light microscope
Author(s): Gaudenz Danuser; Edoardo Mazza
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Fast optical distance measurement by analysis of the focus of a holographic lens
Author(s): Johannes K. Schaller; Ernst Ulrich Wagemann; Christo G. Stojanoff
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Combination of optically measured coordinates and displacements for quantitative investigation of complex objects
Author(s): Peter Andrae; Manfred-Andreas Beeck; Werner P. O. Jueptner; Werner Nadeborn; Wolfgang Osten
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3D deformation measurement in small areas based on grating method and photogrammetry
Author(s): Dirk Bergmann; Reinhold Ritter
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Determination of laser beam weldment properties by grating interferometry method
Author(s): Malgorzata Kujawinska; Leszek A. Salbut
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Displacement field measurement in the nanometer range
Author(s): Yves Surrel; Nicolas Fournier
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Remote control in-plane displacement measurement system
Author(s): Anna Kozlowska; Malgorzata Kujawinska; Christophe Gorecki
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Polarization-based fringe projection interferometer for phase-stepping techniques
Author(s): Piotr Szwaykowski
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High-reflectivity surface evaluation in Fizeau phase-stepping interferometry with a Ronchi grid as phase modulator
Author(s): Benito Vasquez Dorrio; J. Bugarin; Jose M. Alen; Antonio Fernandez; Angel F. Doval; Jose Carlos Lopez Vazquez; Jesus Blanco-Garcia; J. L. Fernandez; Mariano Perez-Amor
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Recovery of interference fringes in holograpic interferometry
Author(s): Philippe Tatasciore; Hans-Reinhard Meyer-Piening
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Real-time holography of ultrasonic surface waves
Author(s): F. D. Schroeder; Horst-Artur Crostack
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Holographic illumination for comparison in interferometry
Author(s): Zoltan Fuezessy; Ferenc Gyimesi; Bela Raczkevi; Janos P. Makai; Janos Kornis; Ildiko Laszlo
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Full field tomographic reconstruction of acoustic fields using TV holography: theory, developments, and possibilities
Author(s): Rolf Rustad; Ole Johan Lokberg; Hans Magne Pedersen; Kristin Klepsvik; Trude Stoeren
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In-situ thin film stress measurement using high-stability portable holographic interferometer
Author(s): George Eugene Dovgalenko; M. Shahid Haque; Anatoli Kniazkov; Yuri I. Onischenko; Gregory J. Salamo; Hameed A. Naseem
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Holographic data acquisition and display in real and quasi-real time: friendly for industrial inspections
Author(s): Valery Petrov; Bernhard Lau
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Bridging the gap between electronic speckle pattern interferometry and holography
Author(s): Bernhard Lau; Valery Petrov
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Recent progress in phase-unwrapping techniques
Author(s): Mitsuo Takeda
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Adaptive automatic shape measurement system
Author(s): Maria Pirga; Malgorzata Kujawinska
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Active stabilization and real-time analysis of interference fringes
Author(s): Ichirou Yamaguchi; Jiyuan Liu; Toshinori Nakajima; Jun-ichi Kato
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Fuzzy logic: a new tool for 3D displacement measurements
Author(s): Thomas Wolf; Bernd Gutmann; H. Weber
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High-speed two-dimensional fringe analysis using frequency demodultion
Author(s): Yasuhiko Arai; Shunsuke Yokozeki; Kazuhiro Shiraki; Tomoharu Yamada
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Applicability of electronic speckle pattern interferometry to the characterization of building materials
Author(s): Massimo Facchini
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Interferometric study of a machine tool
Author(s): Roland Hoefling; Jaroslav Vaclavik; Reimund Neigebauer
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Measurement optimization in speckle interferometry: the influence of the imaging lens aperture
Author(s): Mathias Lehmann
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Laser-optical strain sensor for noncontact and whole-field strain analysis
Author(s): Andreas Ettemeyer
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Speckle pattern correlation for local approach of damage evaluation
Author(s): Pierre R. Slangen; Patrick Ienny; Max Nemoz-Gaillard
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Linear approximation of the coherence function of a white-light source for efficient phase-shifting interferometry
Author(s): Patrick Sandoz
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Equivalent wavelength interferometry using diffractive optics
Author(s): Peter J. de Groot
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Deep field refelction mode for high-resolution surface relief exploration by coherence probe microscopy
Author(s): Paul C. Montgomery; Jean-Marc Lussert
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Detection of ultrasonic vibrations on rough surfaces through the photorefractive effect
Author(s): Philippe Delaye; Alain Blouin; Louis-Anne de Montmorillon; Ivan Biaggio; Denis Drolet; Jean-Pierre Monchalin; Gerald Roosen
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New heterodyne interferometers using double passing
Author(s): Pascal Vairac; Bernard Cretin
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Laser-ultrasound imaging of defects in carbon fiber composite materials
Author(s): C. M. Chen; Q. Shan; Richard J. Dewhurst
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Surface deformation measurement by photothermal deflection technique
Author(s): Mario Bertolotti; Roberto Li Voti; Stefano Paoloni; Concita Sibilia; G. L. Liakhou
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Polycrystalline materials studies by automatic grating interferometry
Author(s): Malgorzata Kujawinska; Leszek A. Salbut; Grzegorz Dymny
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Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip
Author(s): J. Ferber; U. C. Fischer; J. Koglin; Harald Fuchs
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Determination of the resolution in scanning near-field optical images with the help of shear force feedback
Author(s): Dominique Barchiesi; Christian Pieralli
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Acoustic control of tip-sample distance for optical near-field microscopy
Author(s): Bernard Cretin; Etienne Farnault
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Lithography on PMMA-DR1 with reflection near-filed optical microscopy (R-SNOM) and probe characterization
Author(s): Stephane Davy; G. Rachard; Michel Spajer
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Near-field study of magneto-optical samples: theoretical comparison of transversal and polar effects
Author(s): Daniel Van Labeke; A. Vial; Dominique Barchiesi
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Versatile scanning near-field optical microscope using an apertureless metallic probe
Author(s): R. Bachelot; Ahmed Lahrech; Philippe Gleyzes; Albert Claude Boccara
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Resonant scanning tunneling optical microscope
Author(s): Claudine Bainier; Daniel A. Courjon; J. Salvi; Fadi Baida; Christian Girard; Jean-Marie Vigoureux; A. Castiaux
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Spatially resolved study of Schottkey barriers
Author(s): Carlo Coluzza; J. Almeida; Tiziana Dell'Orto; O. Bergossi; Michel Spajer; Stephane Davy; Daniel A. Courjon; Antonio Cricenti; Renato Generosi; P. Perfetti; G. Faini
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Measuring the quality of fines by machine vision
Author(s): Pia Kemppainen-Kajola; Juhani P. Hirvonen; Jyrki Laitinen; Kari Luukko; Markku Kansakoski
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Automatic measurement of tool dimension using stereo CCD cameras
Author(s): Klaus Andresen; Markus Neugebauer
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Optical 3D coordinate-measuring system using structured light
Author(s): Wolfgang Schreiber; Gunther Notni; Peter Kuehmstedt; Joerg Gerber; Richard M. Kowarschik
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Optical testing of fine grating structures
Author(s): Peter Blattner; Hans Peter Herzig
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Common path interferometric microellipsometry
Author(s): Yueai Liu; Chung Wah See; Michael G. Somekh
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Phase modulation methods of interferometry
Author(s): Ilya Sh. Etsin; Lev N. Butenko
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Lasers in food industry
Author(s): Boris F. Fyodorov
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Nondestructive and contactless evaluation of surface coatings and adhesion defects by photothermal radiometry
Author(s): Roland Ritter; Michael Reick; Bernhard Schmitz; Gert Goch
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Multispectral measurements of slightly anisotropic thin films by guided optics method
Author(s): Josep Massaneda; Francois Flory; Salvador Bosch; Jordi Martorell; Serge Monneret
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Interferometric method for characterizing the mechanical properties of thin films by bulging tests
Author(s): Eric Bonnotte; L. Robert; Patrick Delobelle; Luc Bornier; Bertrand Trolard; Gilbert M. Tribillon; D. Mairey
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New dynamic method to study longitudinal magneto-optical effects in ferrofluids
Author(s): F. Donatini; Jean Monin
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Time-averaged speckle-interferometry for investigation and optimizing for electronic bond tools
Author(s): Volker Kirschner; Wolfgang Schreiber; Gunther Notni; Richard M. Kowarschik
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Interferometers with self-pumped phase-conjugate mirror for testing aspherical and cylindrical surfaces
Author(s): A. Krause; Martin Palme; Gunther Notni
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Surface rugosity and polarimetric analysis
Author(s): Philippe Elies; Bernard Le Jeune; Jean-Pierre Marie; Jack Cariou; Jean Lotrian
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Photorefractive novelty filters for transient phase evaluation
Author(s): Henning Rehn; Matthias Esselbach; Richard M. Kowarschik; Klaus H. Ringhofer
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Stationary and transient interferometry with a self-pumped phase conjugate mirror
Author(s): Henning Rehn; Gunther Notni; A. Krause; Burkhard Fleck; Armin Kiessling; Matthias Esselbach; Richard M. Kowarschik; Lutz Wenke
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Thin-cavity interferometric sensors for detection of weak radiation flux and microvibrations
Author(s): Maurice Patrick Whelan; Robert P. Kenny; John T. Sheridan; Constantin Th. Coutsomitros
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New scattering method for the measurement of optical fiber outer dimension
Author(s): Henri Gagnaire; Claude Brehm
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Nondestructive evaluation of material structure by second harmonic generation
Author(s): Daniele Blanc; Alain Cachard; Jean Claude Pommier
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Measuring the deformations of a scattering surface with a general purpose interferometer
Author(s): Marcelo Trivi; Vincenzo Greco; Lois M. Hoffer; Giuseppe Molesini
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Interference refractometer and thickness meter
Author(s): Serguei A. Alexandrov; Igor V. Chernyh; Valery N. Korban
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Displacement measurement based on Young's experiment
Author(s): Zuobin Wang; Peter John Bryanston-Cross; Hongwei Long
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Near-field calculations of the electromagnetic field in a metallic sample illuminated by a metallized nano-source
Author(s): Dominique Barchiesi; Luis Belmar-Letelier; Daniel Van Labeke
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Autocollimating detectors of birefringence
Author(s): Michael I. Shribak
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Two-frequency oscillator for interferometers with polarization dived channels
Author(s): German Ivanovych Il'in; Oleg G. Morozov; Yuri E. Pol'ski
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Spatial-resolvable remote sensing and detection of hydrocarbons based on cw low-power-lasers
Author(s): Ravil R. Agishev; Ravil A. Bajazitov; Marat M. Galeyev
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Photon scanning tunneling microscopy of unstained mammalian cells and chromosomes
Author(s): Fabrice Meriaudeau; L. Stubbs; Jim E. Parks; K. Bruce Jacobson; Jean-Pierre Goudonnet; Trinidad L. Ferrell
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Holographic interferometry using photorefractive crystals: recent advances and applications
Author(s): Marc P. Georges; Philippe C. Lemaire
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Investigations of mechanically alloyed nanocrystalline materials by microacoustic techniques
Author(s): P. Dubief; J. J. Hunsinger; E. Gaffet
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