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PROCEEDINGS VOLUME 2648

International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
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Volume Details

Volume Number: 2648
Date Published: 3 November 1995
Softcover: 116 papers (786) pages
ISBN: 9780819420213

Table of Contents
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Cavity electrodynamics in real experiments
Author(s): Evgenyi A. Vinogradov; I. N. Gaiduk; A. P. Ryabov; N. Yu. Boldyrev
Roughness effects in the infrared reflectance of thick 3C-SiC films grown on Si substrates
Author(s): J. Pascual; M. Ben el Mekki; G. Arnaud; J. Camassel
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Optical hysteresis and nonlinear light absorption in a-Si:H and a-SiC:H thin films
Author(s): Valentin N. Ciumash; Ion A. Cojocaru; G. Bostan; G. Para; Giampiero de Cesare; S. La Monica; Gabriella Maiello; A. Ferrari
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Optical properties of CdS nanoclusters incorporated in zeolite structures
Author(s): Serhiy G. Shevel; Vladimir L. Voznyi; German M. Telbiz; Oleksiy V. Shwetz
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Analytical method for determination of absorbing film optical constants and thickness from reflectance spectra
Author(s): Valery N. Filippov
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Optical absorption and thermal expansion of semiconductor glasses As-S-Ge by topological transition
Author(s): D. Tsiulyanu; N. Gumenyuk; S. Marian
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Developing a new method of the optical diagnostics materials for opto-, micro-, and quantum electronics based on semiconductor superlattices
Author(s): Olexander Yu. Semchuk; Leonid G. Grechko; Vitaly Pustovit
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Experimental evidence of the Coulomb interaction effects in CdS1-xSex quantum dots
Author(s): G. Ventruti; L. Baldassarre; M. Lugara; Vincenzo Spagnolo; Gaetano Scamarcio; Michele Ferrara; Annalisa Convertino; Ida Marie Catalano; Giancarlo C. Righini
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Determination of technological process-induced variations of silicon recombination parameters by infrared and microwave absorption
Author(s): E. Gaubas; A. Kaniava
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Determining optical constants of thin film on substrate from transmission and reflection data
Author(s): Peter Mrafko; Milan Ozvold
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New photoacoustic mean for the determination of surface recombination velocity in piezocrystals
Author(s): Vitalyi E. Gusev; Ludmila Makarova
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Use of physical criteria for solving equations of effective medium approximation (EMA)
Author(s): Valerie A. Ligachov; Anatolyi I. Popov; Sergei N. Stuokach
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Ambipolar diffusion length measurements in a-Si:H by constant photocurrent method (CPM)
Author(s): Valerie A. Ligachov
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Spectral diagnostics of laser erosion plasma of mercury chalcogenide targets
Author(s): Bohdan K. Kotlyarchuk; Dmytro I. Popovych; Victor K. Savchuk; Volodymyr G. Savitsky
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Surface polaritons in semiconductor films with depletion regions
Author(s): Nikolai N. Beletskii; Elena A. Gasan
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Reconstruction of fundamental absorption spectra of material by its refractive index spectrum in transparency region
Author(s): Bohdan V. Andriyevsky
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Determination of polarizability and surface concentration of biomolecules using surface plasmon resonance experiment
Author(s): Yuri M. Shirshov; Vladimir I. Chegel; Yuri V. Subbota; E. P. Matsas; A. E. Rachcov; T. A. Sergeeva
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Optical constants of semiconductors above the fundamental edge
Author(s): Tamara A. Kudykina
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Optical properties and structure of ion-implanted metal films on crystalline lithium niobate
Author(s): Olegh V. Vakulenko; Vasyl S. Staschuk; Borys M. Roman'uk; Mykola I. Kl'uy
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Far-infrared spectroscopy of polar semiconductor superlattices (GaAs-GaPxAs1-x)
Author(s): Nikolas L. Dmitruk; Anatoliy V. Goncharenko; Oleg S. Gorea; Volodymyr R. Romaniuk; Olga M. Tatarinscaia; Evgenie F. Venger
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Application of surface plasmon resonance for the investigation of ultrathin metal films
Author(s): Sergey A. Kostyukevych; Yuri M. Shirshov; E. P. Matsas; Alexander V. Stronski; Yuri V. Subbota; Vladimir I. Chegel; Peter E. Shepeljavi
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Inverse problem solution in ellipsometry
Author(s): Lubov A. Zabashta; Oleg I. Zabashta
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Excitonic spectra of ternary compounds on the basis of AgI
Author(s): Vladimir K. Miloslavsky; O. N. Yunakova; Jialin Sun
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Investigation of thin films of high- and low-absorbing substances by the method of spectroellipsometry with excitation of surface polaritons
Author(s): Igor A. Shaikevich; Pavel V. Kolesnik; L. Y. Melnichenko; V. Y. Pasko
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Optical characterization of the structure of SIPOS layers
Author(s): I. P. Lisovskii; Vladimir G. Litovchenko; V. B. Lozinskii; E. V. Mischenko; Walter Fussel
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Complex method for the determination of thin absorptive film parameters
Author(s): A. M. Kostruba; Orest G. Vlokh; R. O. Vlokh
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Intracavity titanium laser spectroscopy with controlled sensitivity
Author(s): V. B. Andrienko; O. N. Galkin; Y. N. Parkhomenko
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Investigation of photolysis and photochemical transformations in metal layer halides with optical methods
Author(s): Vyacheslav V. Bondar; Arkady Groodzinsky; Stepan Popovych; Yaroslav Pastyrsky; Olena V. Savchuk
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Optical test method of HTSC structures for creating miniature elements and devices for the optical-instrument-building industry
Author(s): I. V. Korotash; E. M. Rudenko
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Kramers-Kronig relations failure in the presence of additional light waves
Author(s): M. I. Strashnikova; E. V. Mozdor
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Application of laser-induced gratings for heat-transfer study of solids
Author(s): E. V. Ivakin; Alexander M. Lazaruk; Valery N. Filippov
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Enhancement of light diffraction efficiency in semiconductors by microwave electric field: experiment and calculations
Author(s): Liudvikas Subacius; Viktoras Gruzinskis; Eugenijus Starikov; P. Shiktorov; Kestutis Jarasiunas
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Determination of profile parameters of planar waveguides
Author(s): Dmitry V. Svistunov
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Nonlinear absorption of laser pulses in amorphous and crystalline As2S3 thin films
Author(s): Valentin N. Chumash; G. Bostan; Ion A. Cojocaru; Niculae E. Mincu; P. Cerbari
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Nondestructive characterization of porous silicon structures by transient grating technique
Author(s): Kestutis Jarasiunas; Markas Sudzius; Liudvikas Subacius; I. Simkiene; Vygantas Mizeikis
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Optical nonlinearities in GaAs at EL2 quenching by short laser pulses
Author(s): Markas Sudzius; L. Bastiene; Kestutis Jarasiunas
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Nonlinear and interferometric optical methods of diagnostics of semiconductors
Author(s): Volodymyr S. Ovechko; Andrii M. Dmitruk
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Displacement interferometer of cylindrical information carrier
Author(s): Michael Y. Kolesnikov; Viacheslav V. Petrov; Vitaly V. Pitsyuga; Igor V. Kosyak
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Determination of temperature changes of refractive index and thickness of material in one optical interference experiment
Author(s): Bohdan V. Andriyevsky; Mykola O. Romanyuk
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Diagnostics of glassy semiconductors by nonlinear absorptive methods
Author(s): Ishtvan V. Fekeshgazi; Konstantin V. May; Vladymyr M. Mitsa; V. V. Roman
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Four-wave mixing due to ionization of vapor
Author(s): Anatoliy I. Khizhnyak; Vladimir B. Markov; Igor M. Savukov; Tatiana V. Scherbakova
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Utilization of noncritical phase matchings for creation of nonlinear optical frequency converters
Author(s): Victor I. Zadorozhnii; Nikolai E. Kornienko; Lyudmila I. Konopaltseva; Arina M. Sytchova
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Photoluminescence diagnostic of semi-insulating materials for ion-implanted and quantum-size structures on gallium-arsenide-based micro-, opto-, and quantum electronics devices
Author(s): Fedir V. Motsnyi; Mikhail P. Lisitsa
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Anomalies of light and sound generation in photoexcited porous silicon
Author(s): Ivan V. Blonskij; Michail S. Brodyn; Volodymyr A. Tkhoryk; Alexander G. Filin; J. P. Piryatinskij
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Pecularities of recombination processes in injection lasers based on (In,Ga)As quantum dots leading to the single longitudinal mode operation at room temperature
Author(s): Sergey V. Zaitsev; Nikita Yu. Gordeev; M. P. Soshnikov; Alexander V. Lunev; Alexey Y. Egorov; Alexey E. Zhukov; Victor M. Ustinov; Nikolai N. Ledentsov; Petr S. Kop'ev
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Application of the polarized photoluminescence method to the characterization of superlattice corrugations
Author(s): Vladimir G. Litovchenko; Dmytro V. Korbutyak; Sergiy G. Krylyuk; Yurii V. Kryuchenko; V. I. Sugakov; Holger T. Grahn; Klaus H. Ploog
New method and calculation program to determine life-time of inhomogeneously broadened transitions
Author(s): Stanislav G. Rozuvan; K. P. Rozuvan; Igor A. Shaykevich; Eugene A. Tikhonov
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Photoluminescent and infrared Fourier diagnostics of porous silicon exposed to HF destructive etching
Author(s): Galina Yu. Rudko; Tamara Ya. Gorbach; Petr S. Smertenko; Sergey V. Svechnikov; Mikhail Ya. Valakh; Vladimir V. Bondarenko; Alexandr Dorofeev
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Structural morphology features and photoluminescence spectroscopy of IR-photosensitive HgCdTe/CdTe
Author(s): Lyudmila A. Karachevtseva; Alexei V. Lyubchenko; Nina Khilimova
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Ultra-short-pulse nature of superradiation in injection emitters
Author(s): Sergey V. Zaitsev; Anatoly M. Georgievski
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Photoluminescence and x-ray studies of thin layers down to single quantum wells
Author(s): Alexey V. Svitelskiy; Galina N. Semenova; Vasily P. Klad'ko; Tatyana Georgiyevn Kryshtab
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Photoluminescence controls as-grown porous silicon-air interaction
Author(s): S. P. Dikiy; A. D. Sardarly; S. V. Baranetz; Leonid L. Fedorenko; Sergey V. Svechnikov; E. B. Kaganovich
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Cathodoluminescent characteristics and light technical parameters of thin-film screens based on oxides and oxysulfides of rare-earth elements
Author(s): Vyacheslav D. Bondar; Myroslav Grytsiv; Arkady Groodzinsky; Mykhailo Vasyliv
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Establishment of admixtures of heavy and rare-earth elements in cadmium tungstate on luminescence spectra
Author(s): Mykola U. Bilyi; M. Diab; M. A. Krysyuk; L. M. Lymarenko; Z. T. Moroz; Sergiy G. Nedelko
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Influence of impurities and thermal treatment temperature on the spectral properties of the chromate luminophors
Author(s): Mykola U. Bilyi; Sergiy G. Nedelko; O. V. Chukova
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Luminescent express method for diagnostics of inhomogeneities in semiconductors
Author(s): Aleksandr F. Singaevsky; Grigory S. Pekar
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Quantum-well-laser mirror degradation investigated by microprobe optical spectroscopy
Author(s): C. Corvasce; Vincenzo Spagnolo; Gaetano Scamarcio; M. Lugara; F. Adduci; Michele Ferrara; Michele Sibilano; Sergio Pellegrino; Massimo del Giudice; M. G. Re
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Anomalies of photoacoustic response in CdS/Y-zeolite system
Author(s): Ivan V. Blonskij; Michail S. Brodyn; Volodymyr A. Tkhoryk; Piotr M. Tomchuk; Alexander G. Filin; German M. Telbiz
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Complex diagnostic of CdTe after under-threshold laser irradiation by photoluminescence, photoconductivity, and electrophysical methods
Author(s): Vladimir N. Babentsov; Aleksandr I. Vlasenko; Peter E. Mozol'; Elena P. Kopishinskaya
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Optical properties of submicron filament silicon crystals
Author(s): Y. G. Gule; Alla Ivanova Klimovskaya; Galina Yu. Rudko; Mikhail Ya. Valakh; I. P. Ostrovskii; G. G. Tsebulya
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Methods of testing light-emitting elements and devices for middle- and far-IR spectral regions based on negative luminescence phenomena
Author(s): Sergej S. Bolgov; Victor A. Botte; Lyudmila I. Konopaltseva; Victor I. Pipa; Anna P. Savchenko
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Evidence for the transport-related effects in the photoluminescence from porous silicon
Author(s): A. M. Evstigneev; A. V. Sachenko; G. A. Sukach; M. A. Evstigneev; Sergey V. Svechnikov
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Laser-power measurement technique using the relationship between intensities of photoluminescence bands
Author(s): V. Ya. Degoda; A. A. Artamonova; V. E. Rodionov
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Time-resolved nonlinear polarization spectroscopy for measuring transient absorption and refraction in isotropic materials
Author(s): Victor B. Taranenko; Vladimir Yu. Bazhenov; Olga A. Kulikovskaya
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Photoreflectance characterization on GaAs/AlGaAs optical waveguides of multiple quantum-well structure
Author(s): Gwo-Jen Jan; Yu-Yuan Tai; Kuo-Tung Hsu
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Modulation spectroscopy for determination of integral excitonic absorption in single quantum-well structure
Author(s): Ivan A. Avrutsky; Yury N. Pyrkov
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Diagnostics of Si-Ge alloys by spectroellipsometry
Author(s): Vladimir G. Litovchenko; Sergey I. Frolov; Nickolai I. Klyui; B. N. Shkarban; V. A. Mitus; D. Krueger
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Calculation of exciton suppression in quantum well filled by 2D electron gas and resultant modification of modulation spectra
Author(s): Ivan A. Avrutsky; Alexey V. Vosmishev
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Use of surface excitations in semiconductor materials for modulation of IR radiation
Author(s): Evgenie F. Venger; I. I. Burshta; A. V. Melnichuk; L. Y. Melnichuk; Y. A. Pasechnik
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Raman studies of silicon layers formed by cluster beam deposition
Author(s): M. Ehbrecht; L. Holz; Friedrich Huisken; Yu. N. Polivanov; V. V. Smirnov; O. M. Stelmakh
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Optical phonons and electron-phonon coupling in CdSxSe1-x quantum dots
Author(s): Vincenzo Spagnolo; Gaetano Scamarcio; G. Ventruti; M. Lugara; Michele Ferrara; Ida Marie Catalano; Giancarlo C. Righini
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Influence of different diode parameters on the accuracy of facet temperature measurements by means of Raman microspectroscopy
Author(s): A. J. Semjonov
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Ion-beam-induced amorphization and recrystallization processes in SiC: Raman-scattering analysis
Author(s): Alejandro Perez-Rodriguez; Christoph Serre; L. Calvo-Barrio; A. Romano-Rodriguez; Juan Ramon Morante; Y. Pacaud; R. Koegler; Wolfgang Skorupa
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Spectroscopic method for temperature measurements in active zone of AlxGa1-xAs DQW laser diodes
Author(s): A. J. Semjonov; B. Kolesov
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Scattering of light from binary diffraction gratings with a period less than a wavelength
Author(s): Victor V. Kotlyar; A. A. Proskin; Oleg Kamilevich Zalyalov
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Scattering of laser light from a relief surface with finite conductivity
Author(s): Victor V. Kotlyar; I. A. Pankov; Oleg Kamilevich Zalyalov
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Raman scattering and photoluminescence of Beta-ZnP2 crystals
Author(s): Tsezarii Andrijovyc Krys'kov; Antonina A. Gubanova; Ruslan Poveda; Mykola U. Bilyi; Victor O. Gubanov; Igor Dmitruk
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Optical phonons in layer PbI2 crystals with stacking faults
Author(s): N. A. Davydova; V. A. Bibik
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Optical testing of Li2B4O7 crystals by light scattering
Author(s): Vasilij N. Moiseenko; A. V. Vdovin; J. V. Burak
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Investigation of glass structure in As(Sb)-S(Se)-I systems by the methods of Raman spectroscopy and x-ray diffraction
Author(s): V. M. Rubish; I. Yurkin; V. Malesh; Vassyl' Fedelesh; M. L. Trunov; D. Semak
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D-SCAN: an instrument for nondestructive monitoring of growth defects in GaAs wafers
Author(s): Kestutis Jarasiunas; Juozas V. Vaitkus; E. Gaubas; J. Kapturauskas; R. Vasiliauskas
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Laser microscopy of electronic devices
Author(s): Colin J. R. Sheppard
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Defect localization in museum items with traditional and electronic holographic nondestructive testing
Author(s): Vladimir B. Markov; Pierre Michel Boone; Nikolai M. Burykin; Vadim V. Ovsyannikov
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Optical diagnostics of luminescence materials for data recording
Author(s): Vladislav I. Zimenko; Viacheslav V. Petrov; Vasyliy G. Kravets; Vasily V. Motuz; Alexander V. Prygun; V. I. Kozheshcurt
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Recording and storage of information in boron-doped silicon using YAG:Nd laser
Author(s): Juris Blums; Arthur Medvids
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Reversible recording medium based on chalcogenide glass
Author(s): Andrey A. Kryuchin; Viacheslav V. Petrov; G. Y. Yudin; Tatyana I. Sergienko
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Diffraction optical elements with deep phase profile obtained with the use of x-ray parallel intensive beam
Author(s): Voldemar Petrovich Koronkevich; G. N. Kulipanov; Oleg A. Makarov; Vladimir Nazmov; Valery F. Pindyurin; M. P. Sinyukov
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New methods of designing the interference polarizers and polarizing beam splitters
Author(s): Yury A. Pervak; Ishtvan V. Fekeshgazi
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Propagation of light in birefringent optically active crystals possessing linear dichroism
Author(s): Oleg S. Kushnir; Orest G. Vlokh
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Holographic NDT methods for plastic pipe vibration and brittle crack propagation analysis
Author(s): Vladimir B. Markov; Pierre Michel Boone; Philippe Vanspeybroeck
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Original method of diagnostics and modification of II-VI and III-V semiconductors
Author(s): Y. U. Ovsyannikov; Alexander M. Kamuz; Pavel F. Oleksenko; Fiodor F. Sizov
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Porous silicon layers for optical recording
Author(s): E. N. Sal'kova; Constantin Nelep; E. B. Kaganovich; A. V. Savchuk; T. A. Sergan
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Increased temperature accuracy of the cathode ray tube camera based on digital signal processing
Author(s): Vladimir Porev; Vladimir N. Borovitsky; Sergey Popov
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Some peculiarities of dielectric tensor field optical tomography technique
Author(s): S. Y. Berezhna; I. V. Berezhnyi; O. M. Krupych; Orest G. Vlokh
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Laser complex for investigation of semiconductor nonlinear constants
Author(s): Vitaly V. Grabovski; Ishtvan V. Fekeshgazi; Konstantin V. May; Valentin I. Prokhorenko; Dmytro Y. Yatskiv
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Application of holographic polymer gratings in spectral devices: temperature stability of parameters
Author(s): Tatiana N. Smirnova; I. A. Strelets; Eugene A. Tikhonov
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Formation of phase-change and relief-change recording media by joint oxidative thermodecomposition of hexacarbonyls on the surface
Author(s): D. A. Grinko; A. A. Krujchin
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Evaluation of the measuring errors of the surface properties of substances with an optical-digital diagnostic system
Author(s): Leonid I. Muravsky; Roman S. Batchevsky; Arkadiy I. Stefansky
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Optical parameters of chalcogenide glass probe elements for fiber optic temperature sensors
Author(s): Ivan Rosola; Lev Kozich; Vadim Kozak; Alexander A. Kikineshy
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Measurement of reflection factor of recording coating of optical information carrier on cylindrical substrate
Author(s): A. D. Leonetz; V. G. Kravetz; Andrey A. Kryuchin
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Theory of optical nondestructive testing of the surface quality of semiconductor wafers on kinetics of recombination heating
Author(s): N. N. Grigor'ev; Tamara A. Kudykina
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Optical diagnostics of thermoplastic dielectric and semiconductor material in thin layers
Author(s): Sergey A. Voronov; Oleg Borisovich Katkovskiy; Sergey Alexandrov Neduzhiy; Alexander Vladimirov Solovyov; Yuriy Georgievic Statnikov
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Methods and apparatus for optical diagnostics with high-accuracy polarimetry
Author(s): Yaroslav I. Shopa; Modest O. Kravchuk; Orest G. Vlokh
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Optical probing of magnetic amorphous ribbon subsurface layers
Author(s): Leonid V. Poperenko; M. V. Vinnichenko; V. V. Vovchak
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Multilayer photorecording medium and devices for recording and processing of information
Author(s): Violetta I. Belozertseva; Y. A. Lupashko; V. V. Mussil; Alexander P. Ovcharenko
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Holographic interferometer based on multimode light-guiding bundles
Author(s): O. V. Zolochevskaja; K. A. Gnatovskij
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Orientation of single crystal with high-accuracy polarimeter
Author(s): Oleg S. Kushnir; Orest G. Vlokh
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Interpretation of polarization speckle parameters in optical diagnostics of scattering medium
Author(s): Oksana I. Barchuk; Tetiana V. Molebna; Alexandr G. Chumakov; Vitalij N. Kurashov; Valeryj V. Marjenko
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Thermostimulate optimization of CdHgTe IR-photodetector parameters
Author(s): Lyudmila A. Karachevtseva; Alexei V. Lyubchenko
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Temporary evolution of the spontaneous gratings in thin photosensitive films AgCl-Ag
Author(s): V. I. Lymar; Vladimir K. Miloslavsky; Leonid A. Ageev
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Recording media based on As-S thin films prepared at low temperature
Author(s): M. L. Trunov; Nicolai D. Savchenko; N. Y. Baran; V. M. Rubish
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Problems of the diagnostics of waveguide of thin film and volume materials for the creation of hybrid and quasimonolithic integrated optical elements and devices
Author(s): Lyudmila I. Konopaltseva; M. I. Schuchenko; Nadezda P. Sytcheva
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Development of computer informational system of diagnostics integrated optical materials, elements, and devices
Author(s): Anatoly E. Volosovitch; Lyudmila I. Konopaltseva
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Electrographic and electrophotographic reserve materials with dirigible, structural, sensitometric, and operational characteristics
Author(s): Sergey Alexandrov Neduzhiy; Alexander V. Pavlov; Yuriy Georgievic Statnikov; Sergey A. Voronov; Vladimir G. Syromyatnikov; Yuriy P. Getmanchuk; Irina D. Laznikova
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HgCdTe infrared linear arrays for 3-5- and 8-12-um wavelength regions
Author(s): Sergey D. Darchuk; Yurii P. Derkach; Yu. G. Kononenko; V. A. Petryakov; Vladimir P. Reva; Fiodor F. Sizov; Vladimir V. Tetyorkin
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Rapid multichannel (N*8) system for infrared and mm-wave investigations
Author(s): Vladimir P. Kuzkov; Anatoliy M. Kudelja; A. Y. Larkin
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