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PROCEEDINGS VOLUME 2541

Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries
Editor(s): John C. Stover
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Softcover $105.00 * $105.00 *

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Volume Details

Volume Number: 2541
Date Published: 1 September 1995
Softcover: 19 papers (196) pages
ISBN: 9780819419002

Table of Contents
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Optical scattering enhanced by silicon micromachined surfaces
Author(s): David M. Sowders; Victor M. Bright; Edward S. Kolesar
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Variable BRDF reference material
Author(s): Jeff L. Brown
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TIS uniformity maps of wafers, disks, and other samples
Author(s): John C. Stover; Marvin L. Bernt; Tod F. Schiff
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How scattering kills specular reflectance
Author(s): Sheldon M. Smith
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Roughness measurement of dielectrics with light scatter
Author(s): Marvin L. Bernt; John C. Stover
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Enhanced backscattering from very smooth metal surfaces
Author(s): Zu-Han Gu; Jean M. Bennett
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Scattering effects of machined optical surfaces
Author(s): Anita Kotha; James E. Harvey
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Application of optical scattering in multichip module processing
Author(s): Meirong Tu; Yang Xu; Peter J. Gielisse; Igor F. Kulisic
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Anomalous optical scattering from intersecting fine particles
Author(s): Alina V. Paley; Alex V. Radchik; Geoffrey B. Smith
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Light scattering from non-Gaussian surfaces
Author(s): Eugene L. Church; Peter Z. Takacs
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Multiple particle technique for determination of differential scattering cross-section of very small surface bound particles
Author(s): John C. Stover; Marvin L. Bernt
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Angular scattering measurements and calculations of rough spherically shaped carbon particles
Author(s): Christian Sasse; Jouni Peltoniemi
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Instrumentation for the determination of material properties from spectroscopic measurements of total integrated scatter
Author(s): G. Lewis Powell; T. E. Barber; John Ternay Neu
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Two portable devices for the measurement of scatter of a laser beam and evaluation of the scattering materials' Vos function
Author(s): Robert I. Young; Peter M. Hallett
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Is there any significant correlation between roughness and scattering near the Rayleigh limit?
Author(s): Hendrik Rothe; Andre Kasper
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Optoelectronic scanning device for the observation of scattering of YAG laser light in semiconductor materials
Author(s): Marek Daszkiewicz; Jacek Galas; Tomasz Kozlowski; Narcyz Blocki; Marta Pawlowska; Andrzej Hruban
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Extreme ultraviolet scatter from particulate contaminated mirrors
Author(s): Michael Phillip Newell; Laura A. Whitlock; Ritva A. M. Keski-Kuha; John Larkin Jackson
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