Share Email Print


Charge-Coupled Devices and Solid State Optical Sensors V
Editor(s): Morley M. Blouke
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a black-and-white photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 2415
Date Published: 10 April 1995
Softcover: 29 papers (332) pages
ISBN: 9780819417626

Table of Contents
show all abstracts | hide all abstracts
Sandbox CCDs
Author(s): James R. Janesick; Tom S. Elliott; Rusty Winzenread; Jeff H. Pinter; Rudolph H. Dyck
Show Abstract
Radiation-hardened backside-illuminated 512 x 512 charge-coupled device
Author(s): Philip A. Bates; Peter A. Levine; Donald J. Sauer; Fu-Lung Hsueh; Frank V. Shallcross; Ronald K. Smeltzer; Grazyna M. Meray; Gordon Charles Taylor; John R. Tower
Show Abstract
CCDs for spectroscopy
Author(s): Yair Talmi; Morley M. Blouke; Taner Dosluoglu; Mark D. Nelson; Raymond W. Simpson; John Stephen West
Show Abstract
Operating a large-area MPP-CCD with antiblooming
Author(s): Ralf Kohley; Klaus Reif; Thomas Pohlmann; Philipp Mueller
Show Abstract
Seven-um pixel size tapped frame transfer CCD image sensor
Author(s): David A. Dobson; William D. Washkurak; M. Suhail Agwani; Savvas G. Chamberlain
Show Abstract
High-performance 1K x 1K progressive scan imager
Author(s): Chris J. Schaeffer; Holger Stoldt; Bart G. M. Dillen; Herman L. Peek; Willem Hoekstra; Jan van Dijk; E. Roks; Agnes C. M. Kleimann; Peter C. J. van de Rijt; Rik H. S. de Gruijter
Show Abstract
Multi-element avalanche photosensor
Author(s): Vitaly E. Shubin; Dmitry A. Shushakov
Show Abstract
Novel interline transfer CCD array for near-infrared applications
Author(s): Stacy R. Kamasz; M. Suhail Agwani
Show Abstract
High-speed dual-output-channel stage-selectable TDI CCD image sensor for high-resolution applications
Author(s): M. Suhail Agwani; David A. Dobson; William D. Washkurak; Savvas G. Chamberlain
Show Abstract
High-resolution CCD linear image sensors for the advanced visible and near-infrared radiometer (AVNIR)
Author(s): Tadashi Shiraishi; Sotoju Asai; Naofumi Murata; Muneo Hatta; Takashi Kadowaki; Hirokazu Tanaka; Yoshio Tange; Yuji Miyachi; Kouichi Inoue
Show Abstract
Linear thin-film position-sensitive detector (LTFPSD) for 3D measurements
Author(s): Rodrigo Martins; Guilherme Lavareda; Elvira Fortunato; Fernando Soares; Luis Fernandes; Luis Alberto Almeida Ferreira
Show Abstract
Vision through the power supply of the NCP retina
Author(s): Thierry M. Bernard; Philippe E. Nguyen
Show Abstract
Contact-type full-color reading system using three-color solid state illuminators
Author(s): Kazumi Komiya; Narinobu Satoh
Show Abstract
Infrared line scanner digital system
Author(s): Vladimir Illich Ponomarev; Ricardo Peralta-Fabi; Sergey N. Kulish
Show Abstract
Amorphous silicon image sensor for x-ray applications
Author(s): Thorsten Graeve; Wingo Huang; Stephen M. Alexander; Youming Li
Show Abstract
Back-illuminated CCD mosaics
Author(s): Michael P. Lesser; David B. Ouellette
Show Abstract
Amorphous silicon area detectors for protein crystallography
Author(s): Stephan W. Ross; Istvan Naday; Miklos Kanyo; Mary L. Westbrook; Edwin M. Westbrook; Walter Charles Phillips; Martin J. Stanton; Robert A. Street
Show Abstract
Stability of lumogen films on CCDs
Author(s): Michael A. Damento; Andrew A. Barcellos; William V. Schempp
Show Abstract
Electron-bombarded back-illuminated CCD sensors for low-light-level imaging applications
Author(s): George M. Williams; Alice L. Rheinheimer; Verle W. Aebi; Kenneth A. Costello
Show Abstract
Gold detector: modular CCD area detector for macromolecular crystallography
Author(s): Istvan Naday; Stephan W. Ross; Miklos Kanyo; Mary L. Westbrook; Edwin M. Westbrook; Walter Charles Phillips; Martin J. Stanton; Daniel M. O'Mara
Show Abstract
Measurement of kinds of thresholds during the interaction between the laser beam and the CCD
Author(s): Xiao-Wu Ni; Jian Lu; Zhen-Hua Lin; Anzhi He
Show Abstract
Modular high-performance 2-um CCD-BiCMOS process technology for application-specific image sensors and image sensor systems on a chip
Author(s): R. Michael Guidash; P. P. K. Lee; J. M. Andrus; Antonio S. Ciccarelli; H. J. Erhardt; J. R. Fischer; Eric J. Meisenzahl; Robert H. Philbrick; Timothy J. Kenney
Show Abstract
256 x 256 CMOS active pixel image sensor
Author(s): Sayed I. Eid; Alex G. Dickinson; Dave A. Inglis; Bryan D. Ackland; Eric R. Fossum
Show Abstract
Lock-in CCD and the convolver CCD: applications of exposure-concurrent photocharge transfer in optical metrology and machine vision
Author(s): Peter Seitz; Thomas Spirig; Oliver Vietze; Peter Metzler
Show Abstract
Intelligent CMOS imaging
Author(s): Peter B. Denyer; David Renshaw; Stewart Smith
Show Abstract
Pre-amplifier-per-pixel charge-injection-device image sensor
Author(s): Sayed I. Eid
Show Abstract
Adaptive sensitivity CCD image sensor
Author(s): Sarit Chen; Ran Ginosar
Show Abstract
High-sensitive transformer of infrared images into visible range
Author(s): Gennadii K. Vlasov
Show Abstract
128 x 128 CMOS photodiode-type active pixel sensor with on-chip timing, control, and signal chain electronics
Author(s): Robert H. Nixon; Sabrina E. Kemeny; Craig O. Staller; Eric R. Fossum
Show Abstract

© SPIE. Terms of Use
Back to Top