### Proceedings of SPIE Volume 2265

Polarization Analysis and Measurement IIFormat | Member Price | Non-Member Price |
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Volume Details

Volume Number: 2265

Date Published: 14 September 1994

Softcover: 50 papers (492) pages

ISBN: 9780819415899

Date Published: 14 September 1994

Softcover: 50 papers (492) pages

ISBN: 9780819415899

Table of Contents

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Standard polarization components: progress toward an optical retardance standard

Author(s): Kent B. Rochford; Paul A. Williams; Allen H. Rose; I. G. Clarke; Paul D. Hale; Gordon W. Day

Author(s): Kent B. Rochford; Paul A. Williams; Allen H. Rose; I. G. Clarke; Paul D. Hale; Gordon W. Day

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Principal angles and principal azimuths of an in-line symmetric three-reflection bare-mirror system: application to circular polarization of VUV radiation

Author(s): Ayman Mohammed Kan'an; Rasheed M. A. Azzam

Author(s): Ayman Mohammed Kan'an; Rasheed M. A. Azzam

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Polarization alignment of polarization maintaining fiber using coherent detection

Author(s): Roman C. Gutierrez

Author(s): Roman C. Gutierrez

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Fast imaging polarimetry with precision universal compensator

Author(s): Guang Mei; Rudolf Oldenbourg

Author(s): Guang Mei; Rudolf Oldenbourg

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Spatiotemporal strain distribution mapping using novel optical heterodyne polarimeter

Author(s): Kazuhiko Oka; Tomoko Yamaguchi; Yoshihiro Ohtsuka

Author(s): Kazuhiko Oka; Tomoko Yamaguchi; Yoshihiro Ohtsuka

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Fiber optic in-line polarimeter: system design and computer-aided analysis

Author(s): Bernhard Scholl; Jens C. Rasmussen; Hans Juergen Schmitt

Author(s): Bernhard Scholl; Jens C. Rasmussen; Hans Juergen Schmitt

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Polariscope using the phase-shifting technique

Author(s): Yukitoshi Otani; Toru Yoshizawa

Author(s): Yukitoshi Otani; Toru Yoshizawa

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Development and calibration of an optical fiber polarimeter

Author(s): Charles S. Brown; Marcus W. Shute; Diedre D. Williams; F.U. Muhammad

Author(s): Charles S. Brown; Marcus W. Shute; Diedre D. Williams; F.U. Muhammad

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New method for the determination of the G factor for a spectrophotofluorometer

Author(s): Edward Collett; Enrique Homar

Author(s): Edward Collett; Enrique Homar

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Birefringent characteristics of two new crystalline materials: CeF3 and LaF3

Author(s): Michael J. Derks; Greg A. Kopp

Author(s): Michael J. Derks; Greg A. Kopp

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Periodic and quasiperiodic nonquarterwave multilayer coating for 90-deg reflection phase retardance at 45-deg angle of incidence

Author(s): Mostofa M. K. Howlader; Rasheed M. A. Azzam

Author(s): Mostofa M. K. Howlader; Rasheed M. A. Azzam

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Fabrication of two-dimensional rough surfaces for light scattering and polarization measurements

Author(s): Michel A. Josse; Zu-Han Gu

Author(s): Michel A. Josse; Zu-Han Gu

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Polarimetry and scatterometry using a Wollaston polarimeter

Author(s): Conrad Wells; Samuel F. Pellicori; Mike Pavlov

Author(s): Conrad Wells; Samuel F. Pellicori; Mike Pavlov

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Polarizer uniformity measurements taken with an imaging polarimeter

Author(s): J. Larry Pezzaniti; Russell A. Chipman; Stephen C. McClain

Author(s): J. Larry Pezzaniti; Russell A. Chipman; Stephen C. McClain

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Fresnel's interface reflection coefficients for the parallel and perpendicular polarizations: global properties and facts not found in your textbook

Author(s): Rasheed M. A. Azzam

Author(s): Rasheed M. A. Azzam

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Complex-amplitude noise characteristics of analog liquid crystal spatial light modulators

Author(s): Michael V. Morelli; Thomas F. Krile; John F. Walkup

Author(s): Michael V. Morelli; Thomas F. Krile; John F. Walkup

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Ellipsometric measurements applied to liquid crystal display technology

Author(s): Leonard G. Hale; Donald B. Taber; Eric Schonning; Donato Rizzi; William J. Gunning; John P. Eblen

Author(s): Leonard G. Hale; Donald B. Taber; Eric Schonning; Donato Rizzi; William J. Gunning; John P. Eblen

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Mueller matrix formalism in imagery: an experimental arrangement for noise reduction

Author(s): Bernard Le Jeune; Jean-Pierre Marie; Pierre-Yves Gerligand; Jack Cariou; Jean Lotrian

Author(s): Bernard Le Jeune; Jean-Pierre Marie; Pierre-Yves Gerligand; Jack Cariou; Jean Lotrian

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Ellipsometric measurements on SiO2 by intensity ratio technique

Author(s): Yu-Faye Chao; C. S. Wei; Wei-Te Lee; Shy Chaung Lin; Tien Sheng Chao

Author(s): Yu-Faye Chao; C. S. Wei; Wei-Te Lee; Shy Chaung Lin; Tien Sheng Chao

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Modulated interference effects: use of photoelastic modulators with lasers

Author(s): Theodore C. Oakberg

Author(s): Theodore C. Oakberg

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Tunable birefringent filters using liquid crystal variable retarders

Author(s): Greg A. Kopp

Author(s): Greg A. Kopp

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Compensation of extraordinary ray pencil astigmatism generated by a birefringent crystal in convergent beam

Author(s): Jean-Jacques P. Arnoux

Author(s): Jean-Jacques P. Arnoux

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Evaluation of the spatial inhomogeneities of ferrofluid thin plates polarimetric characteristics for active imagery

Author(s): Pierre-Yves Gerligand; Bernard Le Jeune; Jack Cariou; Jean Lotrian

Author(s): Pierre-Yves Gerligand; Bernard Le Jeune; Jack Cariou; Jean Lotrian

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Liquid Crystal Polarimeter for solid state imaging of solar vector magnetic fields

Author(s): Laurence J. November; Lawrence M. Wilkins

Author(s): Laurence J. November; Lawrence M. Wilkins

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Zurich Imaging Stokes Polarimeters I and II

Author(s): Christoph U. Keller; Hans-Peter Povel; Jan Olof Stenflo

Author(s): Christoph U. Keller; Hans-Peter Povel; Jan Olof Stenflo

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Use of Mueller and non-Mueller matrices to describe polarization properties of telescope-based polarimeters

Author(s): P. H. Seagraves; David F. Elmore

Author(s): P. H. Seagraves; David F. Elmore

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Polarization sensitivity modeling of reflective imaging systems

Author(s): Conrad Wells

Author(s): Conrad Wells

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Optimum angles for a Mueller matrix polarimeter

Author(s): Amrit Ambirajan; Dwight C. Look

Author(s): Amrit Ambirajan; Dwight C. Look

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Unified formalism for polarization optics: further developments

Author(s): Charles S. Brown; F.U. Muhammad

Author(s): Charles S. Brown; F.U. Muhammad

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Lorentz group underpinnings for the Jones and Mueller calculi

Author(s): F.U. Muhammad; Charles S. Brown

Author(s): F.U. Muhammad; Charles S. Brown

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Polarization analysis of depolarizing optical systems

Author(s): Sergey S. Girgel; Victor A. Emelyanov; Nikolay N. Fedosenko

Author(s): Sergey S. Girgel; Victor A. Emelyanov; Nikolay N. Fedosenko

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Phase-shift control in electro-optical analyzers

Author(s): Victor M. Grigoryev; Nikolai I. Kobanov

Author(s): Victor M. Grigoryev; Nikolai I. Kobanov

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Light depolarization in optical waveguides with irregular boundaries of dielectric layers

Author(s): Andry V. Kovalenko; Vitalij N. Kurashov; Natalia I. Deriougina

Author(s): Andry V. Kovalenko; Vitalij N. Kurashov; Natalia I. Deriougina

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Polarization-based devices in solar observations at the Sayan Observatory

Author(s): Victor M. Grigoryev; Nikolai I. Kobanov; Valery I. Skomorovsky

Author(s): Victor M. Grigoryev; Nikolai I. Kobanov; Valery I. Skomorovsky

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Parametric resonance in optical resonator systems with anisotropic modulators

Author(s): Alexander M. Kul'minskii; Valerii N. Severikov; Alexander P. Voitovich

Author(s): Alexander M. Kul'minskii; Valerii N. Severikov; Alexander P. Voitovich

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One method of imaging polarimetry for remote sensing purposes: the technique accuracy investigations

Author(s): Oleh Lychak

Author(s): Oleh Lychak

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Anisotropically saturating nonlinearity of the polymer films with bacteriorhodopsin

Author(s): Elena Y. Korchemskaya; Marat S. Soskin; Dmitriy A. Stepanchikov

Author(s): Elena Y. Korchemskaya; Marat S. Soskin; Dmitriy A. Stepanchikov

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Advance of the design and technology of birefringent filters

Author(s): Valery I. Skomorovsky

Author(s): Valery I. Skomorovsky

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Chromatic dispersion characteristics of highly birefringent optical fibers

Author(s): Velko Peyov Tzolov; Marie Fontaine

Author(s): Velko Peyov Tzolov; Marie Fontaine

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Investigation of stress-induced birefringence in large semiconductor wafers by imaging polarimetry

Author(s): Andrzej L. Bajor

Author(s): Andrzej L. Bajor

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Instrumental polarization effects of the German Vacuum Tower Telescope (VTT) at Tenerife

Author(s): Dirk Soltau

Author(s): Dirk Soltau

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Ultraviolet/visible polarimetric signatures for discrimination

Author(s): Stephen L. Hammonds; Dimitris Lianos

Author(s): Stephen L. Hammonds; Dimitris Lianos

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Polarization errors associated with birefringent waveplates

Author(s): Edward A. West; Matthew H. Smith

Author(s): Edward A. West; Matthew H. Smith

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