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PROCEEDINGS VOLUME 2260

Stray Radiation in Optical Systems III
Editor(s): Robert P. Breault
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Volume Details

Volume Number: 2260
Date Published: 7 October 1994
Softcover: 24 papers (234) pages
ISBN: 9780819415844

Table of Contents
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Status of data transfer without optical drawings and tables
Author(s): Timothy D. Wise; Michael J. Hayford
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Selection of infrared black(s) for the Space Infra-Red Telescope Facility (SIRTF): a surface-by-surface performance comparison
Author(s): Ann St. Clair Dinger
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Stray light performance optimization through system design
Author(s): Francis M. Reininger
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"Common" black baffle surfaces for telescopes and cryogenic infrared instruments
Author(s): Stephen M. Pompea
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Atomic oxygen exposure effects module of the database for the properties of black, white, reflective, and transmissive spectrally selective surfaces
Author(s): Susan H. C. P. McCall; J. Elder Pierre; A. Mabee; Rod C. Tennyson; D. Morison; Jacob Kleiman; Zelina Iskanderova; Yurii Ivanovich Gudimenko
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Measurement and analysis of scatter from rough surfaces
Author(s): John C. Stover; Marvin L. Bernt; Eugene L. Church
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Instrumentation at the National Institue of Standards and Technology for bidirectional reflectance distribution function (BRDF) measurements
Author(s): Clara C. Asmail; Christopher L. Cromer; James Proctor; Jack J. Hsia
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Extended performance infrared directional reflectometer for the measurement of total, diffuse, and specular reflectance
Author(s): John Ternay Neu; Michael T. Beecroft; Ronald Schramm
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Accuracy and repeatability results of OMNISCATR: a high-speed high-resolution three-dimensional scatterometer
Author(s): Raymond J. Castonguay; Terry D. Ferguson
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Bidirectional reflectance distribution function (BRDF) sensing with fiber optics, programmable laser diodes, and high-resolution CCD arrays
Author(s): Hendrik Rothe; Andre Kasper; Peter Riedel; Oliver Specht; Walter Mueller
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Inputting off-axis optical systems into APART for stray light analysis
Author(s): Daniel Milsom
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In-flight and post-flight stray radiation measurements on the Infrared Background Signature Survey (IBSS) telescope
Author(s): Reinhard A. Birkl; Guenter Lange; Claus Boesswetter; Gerald M. Lamb
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Depolarization measurements of an integrating sphere
Author(s): Stephen C. McClain; Chanda L. Bartlett; J. Larry Pezzaniti; Russell A. Chipman
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Enhanced backscattering from one-dimensional free-standing dielectric film
Author(s): Zu-Han Gu; Jun Q. Lu; Alexei A. Maradudin; Eugenio R. Mendez
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Polarization BRDF
Author(s): J. Larry Pezzaniti; Russell A. Chipman; Stephen C. McClain
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Review of black and reflective spectrally selective surfaces developed in the former USSR
Author(s): Susan H. C. P. McCall; Leon B. Bergrambekov; J. Elder Pierre
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Measurement and analysis of scatter from silicon wafers
Author(s): John C. Stover; Marvin L. Bernt; Eugene L. Church; Peter Z. Takacs
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Optical reflectance characterization of silicon micromachined surfaces
Author(s): David M. Sowders; Victor M. Bright; Edward S. Kolesar
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Unusual BRDF variations at specific infrared wavelengths
Author(s): Sheldon M. Smith
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OMNISCATR: a high-speed high-resolution three-dimensional scatterometer measures complex scatter interference and diffraction patterns
Author(s): Raymond J. Castonguay
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Bidirectional Reflectance Analysis and Visualization Operations (BRAVO): a 3D visualization and processing tool for BRDF data
Author(s): Robert A. Shepherd
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