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PROCEEDINGS VOLUME 2253

Optical Interference Coatings
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Volume Details

Volume Number: 2253
Date Published: 4 November 1994
Softcover: 136 papers (1422) pages
ISBN: 9780819415622

Table of Contents
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Design of optical multilayer coatings
Author(s): Philip Werner Baumeister
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Development of the needle optimization technique and new features of OptiLayer design software
Author(s): Alexander V. Tikhonravov; Michael K. Trubetskov
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Stack-by-stack synthesis of antireflection coatings with wide-angular incidence
Author(s): Maria Luisa Rastello; Amedeo Premoli
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Explicit design of equiripple edge filters
Author(s): John S. Seeley
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Synthesis of infrared filters for use in spaceflight systems
Author(s): Colin Cole; Roger Hunneman; John W. Bowen
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Overcoming low index limitations in antireflection coatings with additional thickness
Author(s): Ronald R. Willey
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Analytical approach of rugate filter properties using Mathieu functions
Author(s): Y. Rouxel
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Synthesis of optical coatings using a simulated annealing algorithm
Author(s): Patrick Chaton; P. Pinston; Jean-Pierre Gailliard
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Thin film design program based on the flip-flop method with a random search
Author(s): Angela M. Piegari; Gabriele Emiliani
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Polarization effects in optical thin films
Author(s): Kopel Rabinovitch; Gregory Toker
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Development of transparent conductive ZnO by Rf magnetron sputtering
Author(s): Francesca Demichelis; C. F. Pirri; E. Tresso
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Antireflection coatings for two widely separated wavelengths
Author(s): Yury A. Pervak; Ishtvan V. Fekeshgazi
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Design of broadband dichroic mirrors using admittance matching
Author(s): Andreea Trache; Voicu Lupei; Mihai P. Dinca
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Design of graded-reflectivity-mirrors using rotating masks
Author(s): Andreea Trache; Voicu Lupei; Mihai P. Dinca
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Design of dielectric high-reflectors for dispersion control in femtosecond lasers
Author(s): Robert Szipocs; Ambrus Kohazi-Kis
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Robust filter design by stochastic optimization
Author(s): Horst Greiner
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Energetic particles for vacuum deposition
Author(s): Hermann R. Dobler
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Low-loss ion beam sputtered coatings in the nineties
Author(s): David T. Wei
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Application of ion-assisted-deposition using a gridless end-Hall ion source for volume manufacturing of thin film optical filters
Author(s): Michael L. Fulton
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Plasma-ion-assisted-deposition: a novel technique for the production of optical coatings
Author(s): Alfons Zoeller; S. Beisswenger; Rainer Goetzelmann; K. Matl
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Control of silicon oxynitrides refractive index by reactive-assisted ion beam sputter deposition
Author(s): Michel Ida; Patrick Chaton; B. Rafin
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Direct optical monitoring instrument with a double detection system for the control of multilayer systems from the visible to the near infrared
Author(s): Markus Tilsch; Volker Scheuer; Josef Staub; Theo T. Tschudi
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In situ optical multichannel spectrometer system
Author(s): Harry H. Bauer; Erwin Nuessler
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Computer-integrated manufacturing of advanced thin film coatings
Author(s): Harry H. Bauer; Erwin Nuessler
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New source of energetic neutral particles
Author(s): Hermann R. Dobler
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Reduction of absorption losses in ion beam sputter deposition of optical coatings for the visible and near infrared
Author(s): Volker Scheuer; Markus Tilsch; Theo T. Tschudi
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Molecular beam deposition of fluorides
Author(s): Sven Laux; Ute Kaiser; Wolfgang Richter
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Electron cyclotron resonance plasma chemical vapor deposition for rugate film manufacturing
Author(s): Pavel V. Bulkin; Pieter L. Swart; Beatrys M. Lacquet
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Rugate filters for image projection in head-mounted displays
Author(s): John Allen; Peter G. Girow; B. Herrington; P. Gee
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Laser protection devices based on multilayer coatings on polycarbonate substrates
Author(s): G. Hubrach; Karl Josef Becker; Erich J. Hacker; H. Bernitizki; Hans Lauth
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Optical coatings on plastic lenses by PICVD-technique
Author(s): Wolfgang Moehl; U. Lange; Volker Paquet
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Structural and chemical properties of thin films (Al2O3, ZrO2, BN) and multicomponent films (ZrO2, Ti) deposited by pulsed laser deposition
Author(s): Ernst-Wolfgang Kreutz; Mirka Alunovic; A. Voss; Wilhelm Pfleging; H. Sung; David A. Wesner
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Single and multilayer coatings deposited by laser-assisted electron beam evaporation
Author(s): Dieter Schaefer; Peter Thomsen-Schmidt; H. Johansen; T. Martini; Bernhard Steiger; G. Pfeifer; Guenter Reisse
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Amorphous fluoropolymer: next generation optical coating candidate
Author(s): Robert Chow; Gary E. Loomis; Maura K. Spragge; Edward F. Lindsey; Frank Rainer; Richard L. Ward; Mark R. Kozlowski
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Investigation of the preparation and properties of organic dye/metal oxide composite thin films
Author(s): Steffen Jaeger; F. Neumann; Claus-Peter Klages
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Correlation between structural, mechanical, and optical properties of ZnSe-MgF2 mixture thin films
Author(s): Luc Nouvelot; Jean-Yves Robic
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Deposition and characterization of a-SiC:H thin films
Author(s): Francesca Demichelis; C. F. Pirri; E. Tresso; F. Valente; E. Bolzan; Valentino Rigato
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Ion-assisted deposition of yttrium fluoride as a substitute for thorium fluoride: application to infrared antireflection coating on germanium
Author(s): Jean-Yves Robic; Bernard Rolland; Jean-Claude Deutsch; Patrick Gallais
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Ion-beam-assisted deposition of thermally evaporated Cr thin films
Author(s): Chang Kwon Hwangbo; Kwang-Lim Yoo; Hyun-Ju Cho
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Film thickness and growth rate measurement by modulation of the interference of light in a plate
Author(s): Mohammad Taghi Tavassoly; Mohsen Cargar; Hafez Assadi
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Low loss mirrors @ 514 nm for large interferometer optics
Author(s): Harry H. Bauer; Erwin Nuessler
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Thin film morphology in TEM as revealed by heat-shock fracturing and replication of film cross sections
Author(s): Theo Mueller; Hans K. Pulker
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Investigation of the microstructure of coatings for high-power lasers by nonoptical techniques
Author(s): Robert J. Tench; Mark R. Kozlowski; Robert Chow
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Secondary neutral mass spectrometry (SNMS) depth profile analysis of optical coatings
Author(s): Peter Weissbrodt; Dirk Mademann; Erich J. Hacker
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Overlapping of roughness spectra measured in macroscopic (optical) and microscopic (AFM) bandwIDths
Author(s): Claude Amra; Carole Deumie; Didier Torricini; Pierre J. Roche; Raymond Galindo; P. Dumas; F. Salvan
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Surface topography restitution for rough thin film deposits
Author(s): Antoine Llebaria; F. Abdellani; Monique Rasigni; Georges Rasigni
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Modified floatation method as an accurate tool for determining the macroscopic mass density of optical interference coatings
Author(s): Martina Vogel; Olaf Stenzel
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Application of the Fourier transform in a preliminary analysis of the reflectivity curve obtained by grazing x-ray reflectometry
Author(s): Francoise Bridou; Bruno Pardo
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X-ray investigation of supersmooth surfaces
Author(s): Igor V. Kozhevnikov; Victor E. Asadchikov; B. M. Alaudinov; Albert Yu. Karabekov; Alexander V. Vinogradov
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Effects of near-surface transition layer on x-ray reflection and scattering
Author(s): Igor A. Artioukov; Igor V. Kozhevnikov
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Study on the hardness of composite films prepared by ion-assisted co-evaporation process
Author(s): Rung-Ywan Tsai; Fang Chung Ho
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Characterization of statistically rough surfaces of thin deposits by an autoregressive process
Author(s): M. Lafraxo; Monique Rasigni; F. Abdellani; Veronique Buat; Georges Rasigni; Antoine Llebaria
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Measurement of thermal conductivity in dielectric films by the thermal pulse method
Author(s): Manfred Dieckmann; Detlev Ristau; Uwe Willamowski; Holger Schmidt
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Resistance of coated optics to UV laser irradiation
Author(s): Norbert Kaiser
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Damage testing and characterization of dielectric coatings for high-power excimer lasers
Author(s): Klaus R. Mann; Eric Eva; A. Hopfmueller
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Influence of defect shape on laser-induced damage in multilayer coatings
Author(s): Mark R. Kozlowski; Robert J. Tench; Robert Chow; Lynn Matthew Sheehan
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Damage of mirrors under high-power continuous wave CO2 laser irradiation: threshold and aging
Author(s): Jean Hue; Jean DiJon; Philippe Lyan
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Optical thin films from the sol-gel process
Author(s): Herve G. Floch; Philippe F. Belleville
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Variable reflectivity mirrors for Nd:YAG (1.06-um) and Er:YAG lasers (2.94-um)
Author(s): Georg Bostanjoglo; Achim Bernhardt
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Ultra-low absorption coatings for mid-infrared cw lasers
Author(s): J. Earl Rudisill; William H. Lohneiss; William Q. Jeffers
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Fabrication of laser mirrors using ion beam
Author(s): John Allen; Peter G. Girow; D. M. Yates; N. Anscomb
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Laser conditioning of optical coatings: some issues in the characterization by atomic force microscopy
Author(s): Anne Fornier; C. Cordillot; Dominique Ausserre; F. Paris
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Thermal stresses field-induced by continuous wave laser irradiation of optical components
Author(s): Erik Duloisy; Jean DiJon
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Ion-assisted deposition of nontoxic coatings for high-power CO2 laser optics
Author(s): A. Schnellbuegel; Harro Hagedorn; Rainer Anton
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Applications of thin film techniques in liquid crystal light valve (LCLV) device
Author(s): Xu Liu; Haifeng Li; Peifu Gu; Jinfa Tang
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Fabrication and properties of multilayer porous silicon filters
Author(s): Michael G. Berger; S. Frohnhoff; Ruedger Arens-Fischer; M. Thoenissen; C. Dieker; H. Muender; Hans Luth; Wolfgang Theiss; M. Arntzen
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Optical properties of single-layer and multilayer anisotropic coatings
Author(s): Ian J. Hodgkinson; Qihong Wu
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Antireflection coatings on 1.55 um LiNbO3 guided-wave devices using sputtered SiO2/Y2O3 and SiO2/TiO2 bilayers
Author(s): C. Ramus; F. Huet; Jean Saulnier
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Utility of multidielectric coatings for realization of waveguides
Author(s): Francois Flory; Ralf Mollenhauer; Emile P. Pelletier
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Composite films prepared by plasma-IAD for design and fabrication of antireflection coatings in visible and near-infrared spectral regions
Author(s): Rung-Ywan Tsai; Fang Chung Ho
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Tunable, bistable, and active filters
Author(s): Keith L. Lewis
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Tungsten trioxide films during cation insertion: in situ optical characterization
Author(s): Enrico Masetti; Danilo Dini; Franco Decker
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CdSSe-doped glasses as the optical device material
Author(s): Nicolai R. Kulish; Vladimir P. Kunets; Mikhail P. Lisitsa; Yury A. Pervak; Ishtvan V. Fekeshgazi
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Optical-electric thin films produced by low voltage reactive plasma-assisted deposition
Author(s): Xu Liu; Bin Wang; Peifu Gu; Jinfa Tang
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Design of a new sensor of multiple gases based on the integration of interference filters
Author(s): Fernando Lopez; Antonio J. de Castro; Juan Melendez; Jesus Meneses
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Image processing of multiple beam interferometry fringes for surface forces apparatus applications
Author(s): Salvador Bosch; F. Wolf; Xudong Xiao; Miguel Salmeron
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Ellipsometric measurement of the optical properties and electrical conductivity of indium tin oxide thin films
Author(s): John A. Woollam; William A. McGahan; Blaine D. Johs
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Variable angle spectroscopic ellipsometry for deep UV characterization of dielectric coatings
Author(s): Alexander Zuber; Norbert Kaiser; Jean-Louis P. Stehle
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Surface contamination of bare substrates: mapping of absorption and influence on depostited thin films
Author(s): Mireille Commandre; Pierre J. Roche; Jean-Pierre Borgogno; Gerard Albrand
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Application of photothermal probe beam deflection technique for the high-sensitive characterization of optical thin films with respect to their optical, thermal, and thermoelastic inhomgeneities
Author(s): Eberhard Welsch; K. Ettrich; M. Peters; Holger Blaschke; W. Ziegler; Axel Bodemann; Michael Reichling
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Loss anomalies in multilayer planar waveguides
Author(s): Claude Amra; M. Ranier; Catherine Grezes-Besset; Sophie Maure; Frederic Cleva; Ralf Mollenhauer; Gerard Albrand
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Photothermal deflection in a supercritical fluid
Author(s): Matthew E. Briggs; Robert W. Gammon
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Multilayer coating characterization for interferometric gravitational waves detection
Author(s): Vincent Loriette; Laurent Pinard; Albert Claude Boccara; Jean-Marie Mackowski
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Infrared reflectance spectroscopy for surface topographic analysis of reststrahlen materials
Author(s): Stefan K. Andersson; Carl-Gustaf Ribbing
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Optical characterization of interface roughness of thin films on transparent substrates
Author(s): Daniel Roennow; Arne Roos
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Interface and volume inhomegeneities in optical thin films investigated by light scattering methods
Author(s): Angela Duparre; Stefan Gliech; Karl Hehl; Stephan Pichlmaier; Uwe Schuhmann
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Algebraic determination of thin film optical constants from photometric (t,Rf,Rm) and (T,Rb,Rm) measurements
Author(s): Valentin G. Panayotov; Ivan Konstantinov
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Optimal choice of the experiment for precise thin film analysis
Author(s): Jiri Hrdina
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Protection coating for optical discs, aspherical lenses, and optical waveguides
Author(s): Alfred Rot; Irina Zaks-Rot
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Optical analysis of complex multilayer structures using multiple data types
Author(s): Blaine D. Johs; Roger H. French; Franklin D. Kalk; William A. McGahan; John A. Woollam
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New algorithm for single wavelength ellipsometry of samples consisting of two absorbing layers
Author(s): Salvador Bosch; Santiago Vallmitjana; Francisco Monzonis
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Light scattering to characterize both faces of transparent substrates: radiative and embedded light
Author(s): Didier Torricini; Claude Amra
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Design of an integrated scatter instrument for measuring scatter losses of superpolished optical surfaces, application to surface characterization of transparent fused quartz substrates
Author(s): Oliver Kienzle; Volker Scheuer; Josef Staub; Theo T. Tschudi
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Mathematical modeling and simulation of resonance field phenomena in thin films with periodic surface inhomogeneities
Author(s): Alexander V. Tikhonravov; Aleksei A. Bikov
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Light scattering from localized and random interface or bulk irregularities in multilayer optics: the inverse problem
Author(s): Claude Amra; Catherine Grezes-Besset; Sophie Maure; Didier Torricini
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Computer modeling of optical thin film deposition
Author(s): Ian J. Hodgkinson; John R. Gee
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Deposition of metal/dielectric multilayer filters
Author(s): Brian Thomas Sullivan; Jerzy A. Dobrowolski
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Modified Forouhi and Bloomer dispersion model for the optical constants of amorphous hydrogenated carbon thin films
Author(s): William A. McGahan; Tim Makovicka; Jeff Hale; John A. Woollam
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Synthesis of rugate-absorbing thin films
Author(s): Francisco Villa; Roberto Machorro
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Interpreting anisotropy and disturbances of optical properties of thin films in terms of layer microstructure
Author(s): Francois Flory; Jean-Pierre Borgogno; D. Endelema; Emmanuel Rausa; Herve Rigneault; Antonella Rizzo
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Influence of the ion beam assistance on the coating stress induced by water absorption
Author(s): Salvatore Scaglione; D. Flori; Luisa Caneve
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Effects of deposition conditions on thin film bulk and interface absorption
Author(s): Mireille Commandre; Pierre J. Roche; Jean-Pierre Borgogno; Gerard Albrand
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Residual stresses in silicon dioxide thin films prepared by reactive electron beam evaporation
Author(s): Herve Leplan; Bernard Geenen; Jean-Yves Robic; Y. Pauleau
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Silicon- and aluminum-nitride films deposited by reactive low-voltage ion plating and reactive dc-magnetron sputtering
Author(s): G. W. Vogl; K. H. Monz; Quang D. Nguyen; Michael Huter; Eduard P. Rille; Hans K. Pulker
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Interpretation of measurements of both losses on guided propagation and absorption from a model of absorbing transition layers
Author(s): Pierre J. Roche; Mireille Commandre; Ralf Mollenhauer; Francois Flory
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Effects of rough interfaces in a multilayer stack
Author(s): Raul Garcia-Llamas; Luis Efrain Regalado
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Tin depth profile in surface layers of a float glass
Author(s): Bernard Dugnoille; I. Rase; O. Virlet
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New ellipsometric approach for thin anisotropic film investigation
Author(s): Valery N. Filippov; Michael M. Karpuk; Gennadij K. Zhavnerko
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Growth of low and high refractive index dielectric films: an in situ ellipsometry study
Author(s): Josette Rivory; S. Fisson; Jean Marc Frigerio; V. Nguyen Van; G. Vuye; Yangshu Wang; Florin Abeles
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Optical properties of Si3N4 films produced by reactive d.c.-magnetron sputtering
Author(s): Eduard P. Rille; Michael Huter
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Multilayer optics for synchrotron x-ray applications
Author(s): Eric Ziegler
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Glancing incidence x-ray scattering by multilayers for x-UV mirrors
Author(s): Jean-Pierre Chauvineau; Y. Chambet; C. Marliere
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Pulsed-laser deposition of x-ray optical layer stacks with atomically flat interfaces
Author(s): Hermann Mai; Reiner Dietsch; Thomas Holz; S. Voellmar; S. Hopfe; Roland Scholz; Peter Weissbrodt; Rhena Krawietz; B. Wehner; H. Eichler; H. Wendrock
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Multilayer coatings for x-ray optics made by distributed electron cyclotron resonance (DECR) plasma sputtering
Author(s): Peter Hoghoj; Eric Ziegler; Eike Lueken; Jean-Christophe Peffen; Andreas K. Freund
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Manufacturing and testing of a laterally graded division parameter multilayer inferential mirror for x-UV
Author(s): Christophe Guichet; R. Rivoira; Georges Rasigni; Robert J. Barchewitz; Jean-Michel Andre
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Multilayer supermirrors: broad-band reflection coatings for the 15 to 100 keV range
Author(s): Karsten Dan Joensen; Paul Gorenstein; Finn Erland Christensen; P. Hoeghoej; Eric Ziegler; Jean Susini; Andreas K. Freund; James L. Wood
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Design and fabrication of IR filters with good flatness
Author(s): Anmin Zheng; Alan Whatley
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Fabrication, structure, optical properties, and stability of W-Si multilayer x-ray reflectors
Author(s): Hans-Joachim Kuehn; J. Kraeusslich
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In situ growth studies of nanometer thin-film multilayers using grazing x-ray reflectivity and ellipsometry
Author(s): Eike Lueken; Eric Ziegler; P. Hoeghoej; Andreas K. Freund; Erich Gerdau; Alain Fontaine
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Temperature stability of thin-film narrow bandpass filters produced by ion-assisted deposition
Author(s): Haruo Takahashi
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Coatings in space: ground- and space-based stability investigations
Author(s): Erich J. Hacker; Peter Weissbrodt; L. Raupach; Hans Lauth; Heiner Kappel; Sigrid Wagner; Dirk-Roger Schmitt
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Degradation of thin films in low-earth-orbit and comparisons with laboratory simulation
Author(s): Blaine R. Spady; Ron A. Synowicki; Jeff Hale; M. J. DeVries; Natale Joseph Ianno; William A. McGahan; John A. Woollam
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Optical and structural properties of YF3 thin films prepared by ion-assisted deposition or ion-beam sputtering techniques
Author(s): Jean-Yves Robic; Viviane Muffato; Patrick Chaton; Michel Ida; M. Berger
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Properties of rf magnetron-sputtered C and C:N thin films
Author(s): Jaroslav Sobota; Jiri Hrdina; Vladimir Vorlicek; Ivan Gregora; Petr Siroky; Vratislav Perina
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High-stability coatings for space optics: application to silex program
Author(s): Patrice Davi
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Recent developments in highly durable protective/antireflection coatings for Ge and ZnS substrates
Author(s): Wasim Hasan; Steven H. Propst
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Multidielectric mirrors for the super-ACO storage-ring free-electron-laser in the UV
Author(s): David Garzella; Marie-Emmanuelle Couprie; T. Hara; Anne Delboulbe; Michel Billardon
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Fourier transform technique with frequency filtering for antireflection coating design
Author(s): Pierre G. Verly
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Influence of preparation conditions on the laser damage threshold of oxide thin films at 248 nm measured by photoacoustic mirage detection
Author(s): Michael Reichling; J. Siegel; Eckart Matthias; Dieter Schaefer; Peter Thomsen-Schmidt
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Optical characterization of single- and double-layers with correlated randomly rough boundaries
Author(s): Ivan Ohlidal; Frantisek Vizd'a
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Darwinian evolution of homogeneous multilayer systems: a new method for optical coatings design
Author(s): S. Martin; A. Brunet-Bruneau; Josette Rivory; M. Schoenauer
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Optical and environmental performance of nonradioactive infrared optical coatings
Author(s): Henry J.B. Orr; Stuart T. Allan; Desmond R. Gibson
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Ion beam and dual ion beam sputter deposition of tantalum oxide films
Author(s): Mirza Cevro; George Carter
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Low-power laser calorimetry with high resolution
Author(s): Hans Willy Becker; Volker Scheuer; Theo T. Tschudi
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Infrared filters for space-flight focal plane array applications
Author(s): Gary John Hawkins; Roger Hunneman; Colin Cole
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Spectroscopic ellipsometry study of effect of annealing on optical properties of sol-gel deposited WO3 films
Author(s): Joanna Barczynska; John M. Bell; Igor L. Skryabin
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