Share Email Print
cover

Proceedings of SPIE Volume 2248

Optical Measurements and Sensors for the Process Industries
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 2248
Date Published: 15 November 1994
Softcover: 55 papers (498) pages
ISBN: 9780819415547

Table of Contents
show all abstracts | hide all abstracts
High-precision optical measurement methods
Author(s): Hans J. Tiziani
Show Abstract
High-precision gauging of metal rings
Author(s): Mats Carlin; Bjorn Lillekjendlie
Show Abstract
Identification and integrity verification of final disposal casks
Author(s): Dirk Holm; Wolfgang Osten; Ulrike Mieth; Werner P. O. Jueptner; Klaus Rudolf
Show Abstract
Imaging spectrometer for process industry applications
Author(s): Esko Herrala; Jukka T. Okkonen; Timo S. Hyvarinen; Mauri Aikio; Jorma Lammasniemi
Show Abstract
Software tool for developing algorithms for surface inspection systems
Author(s): Ari K. Harkonen; Risto S. Mitikka; Ilkka Moring
Show Abstract
Laser-induced breakdown spectroscopy: a versatile tool for process control
Author(s): Reinhard Noll; R. Sattmann; Volker Sturm
Show Abstract
Calibration of projected fringe surface topography measurement systems
Author(s): Catherine Wykes; R. Morshedizadeh; S. Ordish
Show Abstract
Noncontact profiling of machined metal surfaces by fiber optic interferometry
Author(s): Duncan P. Hand; Thomas A. Carolan; James S. Barton; Julian D. C. Jones
Show Abstract
Brightness measurement of rough surfaces by confocal microscopy and image analysis
Author(s): Patrick Sandoz; Gilbert M. Tribillon
Show Abstract
Surface profiling by frequency-domain analysis of white light interferograms
Author(s): Peter J. de Groot; Leslie L. Deck
Show Abstract
Optical ultrasonic sensors for monitoring from industrial surfaces
Author(s): Richard J. Dewhurst
Show Abstract
Profiling of aspherical surfaces using moire deflectometry
Author(s): T. Uitterdijk; Hans Jan Frankena; Kees Smorenburg
Show Abstract
Common-path holographic interferometer for flatness testing
Author(s): Pierre M. Jacquot; Xavier Colonna de Lega; Pierre Michel Boone
Show Abstract
Long-wavelength laser diode interferometer for surface flatness measurement
Author(s): Peter J. de Groot
Show Abstract
Checking the symmetry of stretchable plastic membrane concave mirrors using a lateral shearing interferometer
Author(s): Peter Waddell; Mathew Stickland; Stuart McKay; Leslie S. Mair
Show Abstract
Surface inspection by optical triangulation
Author(s): Manuel Filipe M. Costa
Show Abstract
Absolute surface shape testing by means of an interferometric sensor
Author(s): Karl-Edmund Elssner; Andreas Vogel; Thomas Bluemel; Ricarda Kafka
Show Abstract
High sensitivity fringe projection micro-shape measurement system
Author(s): Maria Pirga; Malgorzata Kujawinska
Show Abstract
Phase stepping in projected-fringe fiber-based moire interferometry
Author(s): Jesus D. R. Valera; Julian D. C. Jones
Show Abstract
Measurement of angular variations of 3D objects using holographic interferometry
Author(s): Pramod Kumar Rastogi
Show Abstract
Absolute distance and velocity measurements by a double integrated heterodyne interferometer
Author(s): A. Chebbour; Christophe Gorecki; Gilbert M. Tribillon
Show Abstract
Automation of the phase-map extraction by a moire technique in a Fizeau interferometer
Author(s): Benito Vasquez Dorrio; Angel F. Doval; Jose Carlos Lopez Vazquez; R. Soto; Jesus Blanco-Garcia; J. L. Fernandez; Mariano Perez-Amor
Show Abstract
Optical methods for the characterization of mechanical properties of thin silicon films
Author(s): Gilbert M. Tribillon; Bertrand Trolard; Patrick Delobelle; Eric Bonnotte; Luc Bornier
Show Abstract
Electronic shearography (ESPSI) for direct measurement of strains
Author(s): Wolfgang Steinchen; Lian Xiang Yang; M. Schuth; Gerhard Kupfer
Show Abstract
Nondestructive inspection with shearography
Author(s): Andreas Ettemeyer
Show Abstract
Phase-stepped additive stroboscopic fiber optic TV holography for vibration analysis
Author(s): Angel F. Doval; J. L. Fernandez; Mariano Perez-Amor; Jesus D. R. Valera; Julian D. C. Jones
Show Abstract
Whole-field vibration phase measurement with electronic speckle pattern interferometry (ESPI)
Author(s): Jesus D. R. Valera; Julian D. C. Jones; Angel F. Doval
Show Abstract
Visualizing cross sections of 3D turbulent flows using a modified white light Lau interferometer
Author(s): Leslie S. Mair; Peter Waddell; Mathew Stickland; Steven Mason; Stuart McKay
Show Abstract
Optical sensors for the process industries
Author(s): Kenneth T. V. Grattan
Show Abstract
Real-time measurement of optical thickness by three-channel homodyne interferometry
Author(s): Vincenzo Greco; C. Iemmi; S. Ledesma; Giuseppe Molesini; Franco Quercioli
Show Abstract
Analysis of defects in ceramics through photothermal deflection method
Author(s): Mario Bertolotti; M. Firpo; Adriano Fontana; G. L. Liakhou; Roberto Li Voti; Concita Sibilia
Show Abstract
Digital image processing of double pulse holograms: investigation of velocity and number density of droplets in sprays
Author(s): Andreas Ante; Johannes K. Schaller; Detlev K. Fiedler; Christo G. Stojanoff
Show Abstract
Knowledge-based monitoring and control of plasma processes using chromaticity measurements
Author(s): Paul C. Russell; Gordon R. Jones; P. Baker; P. Huggett; D. Alston; Richard V. Smith
Show Abstract
Simultaneous particle size, 3D position and velocity measurements from processing of defocused images recorded with two CCD cameras
Author(s): Denis Lebrun; Cafer Ozkul; C. E. Touil; J. B. Blaisot; Alain Kleitz
Show Abstract
Refractive index determination as a tool for temperature measurement and process control: a new approach
Author(s): Johannes K. Schaller; S. Wassenberg; Detlev K. Fiedler; Christo G. Stojanoff
Show Abstract
Temperature measurement with a tapered monomode fiber by coherence multiplexing
Author(s): Denis Konan; Hugues Giovannini; Arnaud Symon; Xavier Daxhelet
Show Abstract
Mirror temperature of semiconductor diode lasers studied with a photothermal deflection method
Author(s): Mario Bertolotti; G. L. Liakhou; Roberto Li Voti; Ruo Peng Wang; Concita Sibilia; Vladimir P. Yacovlev
Show Abstract
Compensation for the vibration-induced linear birefringence modulation in Faraday effect magnetometers
Author(s): Sohail H. Zaidi; Ralph P. Tatam
Show Abstract
Thermovisual system for nondestructive evaluation of objects for various designations
Author(s): Sergej Yablotchnikov; Eugene Zavalnjuk
Show Abstract
True RGB line scan camera for color machine vision applications
Author(s): Guy F. Lemstrom
Show Abstract
Computer-controlled high accuracy optical measurement
Author(s): Michael Schulz
Show Abstract
Automated headspace analysis for quality assurance of pharmaceutical vials by laser Raman spectroscopy
Author(s): A. S. Gilbert; K. W. Hobbs; A. H. Reeves; P. P. Jobson
Show Abstract
Multiple-reflection beams for simplified heterodyne interferometers
Author(s): Bernard Cretin; Pascal Vairac
Show Abstract
Three dimensional reconstruction of objects with large depth variations
Author(s): Jacques Lewandowski; Bruno Menard; Y. Kermabon; Daniel G. Hennequin
Show Abstract
Monocular parameter estimation from intersections with planar surfaces
Author(s): Rolf Gerdes
Show Abstract
Measuring the motion parameters of objects by speckle optics methods
Author(s): Leonid Victorovic Tanin; Sergei Constantin Dick
Show Abstract
Application of optothermal hybrid microscopy in nondestructive and noncontact testing of coatings
Author(s): T. Vetterlein; Beatrice Bendjus
Show Abstract
Azo-dye-doped polymers as novel optical storage media in holographic interferometry
Author(s): Burkhard Fleck; Henning Rehn; Lutz Wenke
Show Abstract
Holographic interferometry in high-temperature flows using the high entalphy shock tunnel in Gottingen (HEG)
Author(s): Dirk Kastell; Georg Eitelberg; Sebastian Kortz; Burkhard Fleck
Show Abstract
Close range dimensional measurement using grating techniques and natural edges
Author(s): Klaus Andresen; Z. Lei; K. Hentrich
Show Abstract
Monitoring the optical polishing process by computerized microscopy techniques
Author(s): Vincenzo Greco; C. Iemmi; S. Ledesma; Giuseppe Molesini; Franco Quercioli
Show Abstract
White light interferometric fiber optic measurement systems
Author(s): Kenneth Weir; Kenneth T. V. Grattan; Andrew W. Palmer
Show Abstract
Comprehensive optical diagnostics of IR-sensitive film structures
Author(s): Sergey C. Stafeev
Show Abstract
Superimposed holographic interferometer
Author(s): Vladimir S. Obraztsov; Yuri N. Evchenko; Anna V. Sergeeva; Gennadi B. Rozhkov
Show Abstract
Computer-based three-dimensional imaging
Author(s): Valery Petrov
Show Abstract

© SPIE. Terms of Use
Back to Top