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Proceedings of SPIE Volume 2208

Refractometry
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Volume Details

Volume Number: 2208
Date Published: 23 June 1995
Softcover: 39 papers (250) pages
ISBN: 9780819417060

Table of Contents
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Spatial inhomogeneities and temporal fluctuations of the refractive index in gas laser media
Author(s): Krzysztof M. Abramski
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Group velocity dispersion compensation in femtosecond Ti:sapphire laser
Author(s): Piotr Wiewior
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Secondary spectrum aberrations of refractive optical systems
Author(s): Tadeusz Kryszczynski
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Design of the narrow band nonpolarizing antireflection coating illustrated with admittance diagrams
Author(s): Grzegorz Jerzy Kopec
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Diagnostics of seawater refractive turbulence
Author(s): Yurij I. Kopilevich; N. V. Aleksejev; B. V. Kurasov; Viktor A. Yakovlev
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Refractive index and light scattering models in the volume scattering function measurement
Author(s): Janusz Mroczka; Marian Parol; Dariusz Wysoczanski
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High-precision interference refractometer for length measurements
Author(s): Reimund Torge; Egbert Morgenbrod; Thomas Irtenkauf
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Precise methods of refraction measurements in moveable object direction
Author(s): Vladimir Trikoz
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Metrological guarantee of polarimetry and refractometry: state of the problem and outlook
Author(s): Mark L. Gourari
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Statistical algorithm to obtain refractive index and thickness from spectrophotometric interference patterns
Author(s): Fernando Carreno; Eusebio Bernabeu
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Distributed feedback dye laser: a simple instrument for measurement of refractive index of laser media
Author(s): T. Sh. Efendiev; V. M. Katarkevich; Yu. V. Kostenich; Anatoly Nikolaevich Rubinov
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Intelligent refractive index detector for capillary electrophoresis
Author(s): Vasily L. Kasyutich; Igor I. Mahnach
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Temperature dependence of refractive index as a basis for laser thermometry of semiconductor crystals
Author(s): Alexander N. Magunov
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Measurement of temperature dependencies of real and imaginary parts of the complex index of refraction of monocrystalline of silicon in the range of absorption edge
Author(s): Alexander N. Magunov
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M-line spectroscopy for nonlinear waveguide characterization
Author(s): Guy Vitrant; Raymond Reinisch; Francois Kajzar
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Effects of absorption and coupling strength on accuracy of dark mode refractometry
Author(s): Jaromir Pistora; Dalibor Ciprian
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Miniature integrated optical refractometer chip
Author(s): Lothar U. Kempen; Rino E. Kunz
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Increasing of sensitivity of lightguide refractive index sensors
Author(s): Sergey U. Dovgalets
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Refractive index dependence of attenuation in antiresonant reflecting optical waveguides
Author(s): Jacek Marek Kubica
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Modeling of light transmission in a fiber optic path of any shape for refractometric sensors with intensity modulation
Author(s): Ryszard Hypszer; Jerzy Plucinski
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Modeling and computer optimization of fiber optic refractometric sensors
Author(s): Ryszard Hypszer; Bogdan B. Kosmowski; Jerzy Plucinski
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Fourier analysis as a means of contemporary measurements of several quantities influencing the refractive index of intensity-based fiber sensors
Author(s): Vladimir Vasinek
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Refractometry of absorbing media: theory, devices, metrology
Author(s): Vladimir N. Morozov
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Refractometry of weakly absorbing multilayers via reflectometry
Author(s): Emoeke Loerincz; Robert Klug
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Measurement of refraction and absorption indices of thin polymer film on the transparent semiconductor substrate via FTIR spectrometry
Author(s): Polina G. Buyanovskaya
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Refractometry by means of surface plasmon resonance
Author(s): Janusz W. Sadowski
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Photoinduced birefringence and its application
Author(s): Valery A. Barachevsky
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Birefringence measurement of optical fibers under various stress conditions
Author(s): Tomasz R. Wolinski
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Multiple reflections in retardation plates with elliptical birefringence
Author(s): Kazimierz Pietraszkiewicz; Wladyslaw Artur Wozniak; Piotr Kurzynowski
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Refractometry of cryogenic condensed medium
Author(s): L. Sh. Oleinikov; V. D. Glazunov; V. N. Shekhtman; A. G. Pel'menev
Interferometric method for the determination of absolute refractive index and optical thickness
Author(s): S. A. Aleksandrov; I. V. Chernych; Konstantin G. Predko
Refractometry by phase measuring interferometry
Author(s): Malgorzata Sochacka

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