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Laser Dimensional Metrology: Recent Advances for Industrial Application
Editor(s): Michael J. Downs

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 2088
Date Published: 1 February 1993

Table of Contents
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Trends in instrumentation for roughness and form measurement
Author(s): David J. Whitehouse
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Laser-beam scanning
Author(s): D. P. Rowe; P. M. Watts
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Validation of assessment software in dimensional metrology
Author(s): A. B. Forbes
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Adaptive optics
Author(s): Fritz Merkle
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Comparison of long-range and interferometric laser distance instruments using multiple reflections
Author(s): David C. Williams; Jason E. Banyard
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High-power semiconductor lasers for lidar and sensing applications
Author(s): Mark C. Farries; Andrew C. Carter; T. J. Reid
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Performance tests of an angular scan LED array-based range-imaging sensor
Author(s): Janusz A. Marszalec; Risto A. Myllylae
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Investigations of bimorph adaptive mirrors
Author(s): Andrej V. Ikramov; I. M. Roshchupkin; Andrey G. Safronov
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Three-dimensional contouring by an optical radar system
Author(s): Heinrich A. Hoefler; Gerhard Schmidtke
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Spatial metrology using shaped laser beams
Author(s): Barry J. Gorham
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Two- and three-dimensional laser scanners for fast dimensional measurements and inspection
Author(s): Willem D. van Amstel; Ronald J. Asjes; Peter F.A. van de Goor; Piet Merkelbach
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On-line inspection of textile geometries
Author(s): Thomas Bahners; Werner Ringens; Eckhard Schollmeyer
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Automated calibration equipment for machine tools
Author(s): G. D. Pitt
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Fibre optic shape-measuring system using phase-stepping speckle-pattern interferometry
Author(s): Lewis S. Wang; Brian N. Dobbins; K. Jambunathan; Xiaoping Wu
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Laser radar-based measuring systems for large scale assembly applications
Author(s): Ilkka P.A. Kaisto; Juha Tapio Kostamovaara; Markku Manninen; Risto A. Myllylae
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Instruments for the automatic measurement of radius of curvature
Author(s): Kevin Ross Manning
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Subnanometre precision closed-loop positioning for optics and X-Y stage control using capacitance displacement sensors and piezo-electric actuators
Author(s): Newrick K. Reay
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Novel algorithm for comparative measurement of submicrometre features on photomasks
Author(s): John W. Nunn; P. Salmon
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New concept of optical super resolution
Author(s): Vladimir P. Tychinsky; Alex Odintsov
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Absolute noncontacting method to characterize x-ray mirrors with large radii with nanometre accuracy
Author(s): Manohar Virdee
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New design of an optical profiler
Author(s): John A. Meiling; Shaun Coles
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Measurement of the linear thermal expansion coefficient of gauge blocks by interferometry
Author(s): E. B. Hughes
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High-speed optical measurement of 3-D surfaces
Author(s): Alistair J.C. Brown
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Dispersion-free Fabry-Perot interferometer for measuring very small displacements
Author(s): Yuri V. Troitski
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New interferometric profiler for smooth and rough surfaces
Author(s): Paul J. Caber; Stephen J. Martinek; Robert J. Niemann
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On-line particle size and velocity measurements by the analysis of defocused images: extended depth of field
Author(s): Denis Lebrun; Cafer Ozkul; C. E. Touil; J. B. Blaisot; Alain Kleitz
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