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Proceedings of SPIE Volume 1991

Diffractometry and Scatterometry
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Volume Details

Volume Number: 1991
Date Published: 31 October 1994
Softcover: 42 papers (284) pages
ISBN: 9780819412409

Table of Contents
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Hologram: the diffraction grating, the lens, or whether tertio est datur?
Author(s): Grazyna Mulak
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Image processing and recognition using diffractive and digital techniques
Author(s): Jacek Galas
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Microscope diffraction pattern processing
Author(s): Dariusz Litwin
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Optical Fourier transform diffractometry for kinoform technology
Author(s): Maciej Sypek; Mariusz Krukowski; Piotr Borowik
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Diffraction of polarized light by the real diffractive optical elements
Author(s): Jan Popelek; Frantisek Urban; Ludmila Vrestalova
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Optical bistability of relief-dynamic-grating near Wood's anomalies
Author(s): Raimondas Petruskevicius; A. Greicius; Mikhail N. Libenson
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Instrument for measuring the light scattered by diffraction gratings
Author(s): Mariusz Szyjer
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Convolution formulation of diffraction for grating system
Author(s): Alexander P. Smirnov
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Diffraction and interference of light with two phase diffraction holographic gratings
Author(s): Iosif S. Zeilikovich
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Correlator based on joint Fourier transform of mutually incoherent fields using a second order hologram
Author(s): Peter V. Polyanskii
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Rapid tunable acousto-optic spectral devices and their applications
Author(s): S. M. Kopylov; B. G. Lysoy; L. K. Mikhailov; A. V. Solovyov; O. B. Cherednichenco
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Assymetric Fourier transform diffractometry and its applications to refractometry of transparent plate-like objects
Author(s): Alexander A. Arefiev
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Laser diffraction on the inclined narrow slit with the final thickness edges
Author(s): Iosif S. Zeilikovich
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Measurement of the diameter of wires and fibers by using CCD line-scan detector
Author(s): Narcyz Blocki; Marek Daszkiewicz; Jacek Galas
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Light scattering by conducting surfaces with one-dimensional roughness
Author(s): Kevin A. O'Donnell; Michael E. Knotts; T. R. Michel
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Optical techniques and reflection: high-energy electron diffraction for investigation of semiconductor surface and interface roughness
Author(s): Marian A. Herman
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Light scattering problems in confocal scanning microscopy
Author(s): Colin J. R. Sheppard
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System for surface roughness control of plane and spherical very smooth surfaces
Author(s): Oleg V. Angelsky; Ivan A. Buchkovsky; Peter P. Maksimyak
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Scatterometer and scatteroscope for testing optical surfaces
Author(s): Wieslaw Chabros; Leszek Rafal Staronski
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Optical instrument for evaluation of rough machined-surface by angular distribution of scattered light
Author(s): Czeslaw Lukianowicz
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Influence of surface roughness variations on the surface enhanced Raman scattering signal
Author(s): Stefan Kruszewski
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Phase correlation method for speckle in-plane motion analysis using digitally addressed SLM
Author(s): Christophe Gorecki
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Using collective Cotton-Mouton effect to probe optical anisotropy within scattering centers
Author(s): Antoni Adamczyk
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Scatterometry of laser-light-induced sodium clusters
Author(s): Daniel Jakubczyk; K. Kolwas; Maciej Kolwas
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Modeling of threshold conditions for scattering and absorption of radiation by mirror surfaces with condensed layers of residual gas particles
Author(s): L. Sh. Oleinikov
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Characteristic features of scattering of radiation by N2, 02, Ar, Ne and air particles condensed at a mirror surface
Author(s): L. Sh. Oleinikov; V. D. Glazunov
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Light scattering from damage and contamination of optical surfaces
Author(s): I. A. Zabelina; V. A. Gogolev
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Resonance Raman scattering of Peierls-Hubbard dimers in tetrathiofulvalene (TTF) salts
Author(s): Stefan Kruszewski; Luigino Feltre; Renato Bozio; Carlo Bellitto
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Evaluation of eye lens state by means of light scattering measurements
Author(s): J. Kaczynski; Bronislaw Grzegorzewski
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Goniometric investigations of light scattered by bones of the skull
Author(s): Magdalena Wietlicka-Piszcz; Roman Mazur; Bronislaw Grzegorzewski
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Diffractometry and scatterometry at the Institute of Applied Optics, Warsaw
Author(s): Marek Daszkiewicz
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Diagnostics of sea-water turbulence by small-angle light scattering
Author(s): N. V. Aleksejev; Yurij I. Kopilevich; B. V. Kurasov; Viktor A. Yakovlev
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Optical correlation method for measuring particle size and concentration
Author(s): Peter P. Maksimyak; Oleg V. Angelsky
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Spectral absorption and scattering characteristics: definitions of pigment powders in the mid-infrared region
Author(s): M. M. Seredenko
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