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Proceedings of SPIE Volume 1907

Machine Vision Applications in Industrial Inspection
Editor(s): Frederick Y. Wu; Benjamin M. Dawson
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Volume Details

Volume Number: 1907
Date Published: 6 May 1993
Softcover: 25 papers (282) pages
ISBN: 9780819411402

Table of Contents
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Model matching using multiple data sources
Author(s): Guanghua Zhang; E. Thirion; Andrew M. Wallace
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Standardized, object-oriented, 3D vision input system
Author(s): John Tabor; Michael Fahy
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I/O pin solder-point inspection system
Author(s): Tetsuo Koezuka; Yoshinori Suto; Moritoshi Ando
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System integration of road-crack evaluation system
Author(s): Satoshi Abe; Toshio Abe; Hisao Sato; Taizo Okano; Koki Sengoku
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Fill-tube bore inspection with machine vision
Author(s): Martin J. Pechersky; W. Clanton Mosley; P. A. Kestin; Rhonda K. Dickerson
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Prototype model for automatic IC bonding inspection
Author(s): Mandava Rajeswari; K. Saravanan; P. Krishnasamy
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Automatic defect classification system for semiconductor wafers
Author(s): Rivi Sherman; Ehud Tirosh; Zeev Smilansky
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Automatic defect classification for integrated circuits
Author(s): Paul B. Chou; A. Ravishankar Rao; Martin C. Sturzenbecker; Virginia H. Brecher
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Automated system for classification of defects in web materials
Author(s): Dragana P. Brzakovic; Hal E. Beck; P. Shanmugam
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Features for automatic surface inspection
Author(s): Joon Hee Han; Doo M. Yoon; Myeong K. Kang
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Automated direct patterned-wafer inspection
Author(s): Babak H. Khalaj; Hamid K. Aghajan; Thomas Kailath
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Adaptive texture filtering for defect inspection in ultrasound images
Author(s): Carl Zmola; Andrew C. Segal; Brian Lovewell; Charles Nash
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PC-based real-time defect imaging system for high-speed web inspection
Author(s): James W. Roberts; S. D. Rose; Graham A. Jullien; Lee T. Nichols; P. Tom Jenkins; Savvas G. Chamberlain; Gerhard Maroscher; R. Mantha; David J. Litwiller
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Area parameters in machine vision: a sampling of multiple applications
Author(s): Thomas M. Seitzler
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Scanning probe microscopy: trends and image processing issues
Author(s): Gopal Sarma Pingali; Ramesh C. Jain
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Panning for gold by the moment method
Author(s): Richard R. Zito
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Analyzing simulated and measured optical scatter for semiconductor process verification
Author(s): Richard H. Krukar; S. Sohail H. Naqvi; John Robert McNeil; Donald R. Hush; James E. Franke; Thomas M. Niemczyk; David Keller; Richard A. Gottscho; Avi Kornblit
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Diffraction image processing algorithms for in-situ monitoring of submicron polysilicon linewidths
Author(s): Phillip Chapados
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Registration error measurements with coherent optical processors
Author(s): Xian-Yang Cai; Frank Kvasnik; Roy W. Blore
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Poultry grading/inspection using color imaging
Author(s): Wayne D. Daley; Richard Carey; Chris Thompson
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Color analysis of defects for automated visual inspection of pine wood
Author(s): Elzbieta A. Marszalec; Matti Pietikaeinen
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Computerized image quality inspection system
Author(s): Feng Ouyang
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