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Proceedings of SPIE Volume 1900

Charge-Coupled Devices and Solid State Optical Sensors III
Editor(s): Morley M. Blouke
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Volume Details

Volume Number: 1900
Date Published: 12 July 1993
Softcover: 27 papers (256) pages
ISBN: 9780819411334

Table of Contents
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Active pixel sensors: are CCDs dinosaurs?
Author(s): Eric R. Fossum
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IR spectrometer using spectral pattern recognition: a feasibility study
Author(s): Michael R. Descour; Eustace L. Dereniak
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Smart optical and image sensors fabricated with industrial CMOS/CCD semiconductor processes
Author(s): Peter Seitz; Dirk Leipold; Joerg Kramer; Jeffrey M. Raynor
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Design of a low-light-level image sensor with on-chip sigma-delta analog-to-digital conversion
Author(s): Sunetra K. Mendis; Bedabrata Pain; Robert H. Nixon; Eric R. Fossum
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640 x 400 pixels a-Si:H TFT-driven 2D image sensor
Author(s): Ken-ichi Kobayashi; Seigo Makida; Yoshihide Sato; Toshihisa Hamano
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Performance of a high-speed PtSi IRCCD camera system
Author(s): Laurence M. Flath; Eustace L. Dereniak; Steven M. Shepard
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Modular CCD detector for x-ray crystallography
Author(s): Walter Charles Phillips; Martin J. Stanton; Daniel M. O'Mara; Istvan Naday; Edwin M. Westbrook
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Implications of a thinned CCD QE model
Author(s): James S. Flores
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Issues in the design of systems incorporating electron bombarded CCDs
Author(s): Alice L. Reinheimer
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16:9 aspect ratio for broadcast applications and its consequences for new CCD imagers
Author(s): Martien van de Steeg; Noortje Daemen; Wim Huinink; Laurens Korthout; Herman L. Peek; Mike Stekelenburg
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Model for random pixel clustering in large-format CCDs
Author(s): Doug W. Donaghue
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Fast centroiding with a 24 x 24 frame transfer CCD
Author(s): Hans J. Meyer; Phil J. Kruczkowski; William V. Schempp
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Performance of a large-format charge-injection device
Author(s): Jeffrey J. Zarnowski; Sayed I. Eid; Frank S. Arnold; Matthew A. Pace; Joseph Carbone; Bryn Williams
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Two-poly 128x128-element area array with lateral antiblooming
Author(s): William D. Washkurak; Savvas G. Chamberlain; James W. Roberts
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Electron bombardment radiation damage in Tektronix CCDs
Author(s): Alice L. Reinheimer
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Page-sized amorphous silicon image sensor arrays
Author(s): Robert A. Street; Richard L. Weisfield; Steven E. Nelson; R. Chang
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Design and electro-optical characterization of a 1024 x 1024 imager
Author(s): Stacy R. Kamasz; William D. Washkurak; Gareth P. Weale; Shing-Fat Fred Ma; Charles R. Smith; Savvas G. Chamberlain
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New low-noise, random access, radiation-resistant and large-format charge-injection device (CID) imagers
Author(s): Joseph Carbone; Jeffrey J. Zarnowski; Frank S. Arnold; J. Hutton
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26.2-million-pixel CCD image sensor
Author(s): Savvas G. Chamberlain; Stacy R. Kamasz; Shing-Fat Fred Ma; William D. Washkurak; Michael G. Farrier; P. Tom Jenkins
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32-megapixel dual-color CCD imaging system
Author(s): Christopher W. Stubbs; Stuart L. Marshall; Kenneth H. Cook; Robert Hills; Joseph P. Noonan; Carl W. Akerlof; Charles R. Alcock; Timothy S. Axelrod; D. P. Bennett; K. Dagley; K. C. Freeman; Kim Griest; Hye-Sook Park; Saul Perlmutter; Bruce A. Peterson; Peter J. Quinn; Alex W. Rodgers; C. Sosin; W. J. Sutherland
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Large-pitch multiple-output 128x256-element area array
Author(s): William D. Washkurak; Savvas G. Chamberlain
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Electrolytic gate for quantum efficiency enhancement in thinned CCDs
Author(s): Michael A. Damento; Mary Watson; Gary R. Sims
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Backside coatings for back illuminated CCDs
Author(s): Michael P. Lesser
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Stable ultraviolet antirelection coatings for charge-coupled devices
Author(s): Morley M. Blouke; Mark D. Nelson
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Thinned back-illuminated CCD for x-ray microscopy
Author(s): Werner Meyer-Ilse; Thomas Wilhein; Peter Guttmann
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4-million-pixel CCD array for scientific applications
Author(s): Stephen J. Strunk; Pao-Jung Chen; Masoud M. Fattahi; Troy Kaysser; Buon T. Nguyen; Hsin-Fu Tseng; Rusty Winzenread; Mingzhi Wei
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Results from proton damage tests on the Michelson Doppler Imager CCD for SOHO
Author(s): Igor Zayer; Ira Chapman; Dexter W. Duncan; G. A. Kelly; Keith E. Mitchell
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