Share Email Print
cover

Proceedings of SPIE Volume 1753

Stray Radiation in Optical Systems II
Editor(s): Robert P. Breault
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 1753
Date Published: 12 February 1993
Softcover: 33 papers (338) pages
ISBN: 9780819409263

Table of Contents
show all abstracts | hide all abstracts
Ultralight weight beryllium mirror development
Author(s): Michelle L. Delatte
Show Abstract
Critical parameters for the preparation of low-scatter electroless nickel coatings
Author(s): Douglas L. Hibbard
Show Abstract
Beryllium mirror polishing optimization for minimum cost
Author(s): Leonard A. Abbatiello
Show Abstract
Imaging incoherent, off-axis, scattered radiation
Author(s): John Larkin Jackson
Show Abstract
Baffle knife-edge radius requirements for exoatmospheric interceptors and surveillance sensors
Author(s): Thomas Gregg Carter
Show Abstract
Correcting for diffraction in the far-infrared reflectance measurement of rough surfaces
Author(s): Sheldon M. Smith
Show Abstract
Effect of jet engine exhaust on SOFIA stray-light performance
Author(s): Ann St. Clair Dinger
Show Abstract
Specular baffles
Author(s): Gary L. Peterson; Steve C. Johnston; Jerry Thomas
Show Abstract
Wavelength dependence of scatter in chemical-vapor-deposited SiC
Author(s): Jitendra Singh Goela; Michael A. Pickering; Raymond L. Taylor
Show Abstract
Computer modeling of slit diffraction (spatial filtering)
Author(s): Michael J. Satter
Show Abstract
Very near specular measurement via incident angle scaling
Author(s): John C. Stover; Marvin L. Bernt
Show Abstract
Near specular measurements of integrated scatter
Author(s): James A. Bender; Timothy D. Henning; Marvin L. Bernt
Show Abstract
APMOD: a graphical PC-based preprocessor for APART/PADE
Author(s): Daniel Milsom; Robert P. Breault
Show Abstract
PEARLSS: a model for contamination effects--description and results
Author(s): Laura A. Whitlock; John Larkin Jackson
Show Abstract
Design review of a broadband three-dimensional scatterometer
Author(s): Fredrick M. Cady; Mary W. Knighton; Daniel R. Cheever; Brett D. Swimley; Theodore L. Hundtoft; Tod F. Schiff; Mark E. Southwood
Show Abstract
Thermal emissivity analysis of a GEMINI 8-meter telescope design
Author(s): Ann St. Clair Dinger
Show Abstract
Design and on-orbit performance of the WINDII baffle system
Author(s): William A. Gault; Jean-Francis Brun; Mary Donna-Lee Desaulniers; Douglas W. Miller; Frederick Pasternak; Yves J. Rochon; J. M. Rupil; Gordon G. Shepherd
Show Abstract
Stray light analysis of the Cassini telescope
Author(s): Robert P. Breault; Daniel Milsom
Show Abstract
Utilization of Siamese pseudo-optics in APART
Author(s): Timothy D. Wise
Show Abstract
Using APART for wall visibility calculations in the calibration channel of wide field planetary camera II
Author(s): James W. Scholl; Marija Scholl
Show Abstract
An almost 'perfectly' diffuse, 'perfect' reflector for far-infrared reflectance calibration
Author(s): Sheldon M. Smith
Show Abstract
Design review of a unique out-of-plane polarimetric scatterometer
Author(s): Tod F. Schiff; John C. Stover; Daniel J. Wilson; Brett D. Swimley; Mark E. Southwood; Donald R. Bjork
Show Abstract
Mueller matrix measurements of scattered light
Author(s): Tod F. Schiff; John C. Stover; B. D. Swimley; Donald R. Bjork
Show Abstract
Retroreflections on a low-tech approach to the measurement of opposition effect
Author(s): Tod F. Schiff; John C. Stover; Daniel J. Wilson; B. D. Swimley; Mark E. Southwood; Donald R. Bjork
Show Abstract
Reflective and transmissive scatter from ZnS and ZnSe samples
Author(s): John G. Kepros
Show Abstract
Experimental investigation of the scattering function outside the region of shift invariance
Author(s): John G. Kepros; Eldon N. Okazaki; Linda C. Chin
Show Abstract
Calculation of signal-to-noise ratio of a monostatic bidirectional laser reflectometer
Author(s): Zu-Han Gu; Zong Qi Lin; Jeffrey A. Estep
Show Abstract
Bidirectional reflectance data to support paint development and signature calculations
Author(s): Michael T. Beecroft; John Ternay Neu; James C. Jafolla
Show Abstract
Outline of selection processes for black baffle surfaces in optical systems
Author(s): Stephen M. Pompea; Susan H. C. P. McCall
Show Abstract
Stray light analysis of the 2.5-meter telescope for the Sloan Digital Sky Survey
Author(s): Stephen M. Pompea; John Eric Mentzell; Walter A. Siegmund
Show Abstract
Reviews of black surfaces for space and ground-based optical systems
Author(s): Susan H. C. P. McCall; Stephen M. Pompea; Robert P. Breault; Nancy L. Regens
Show Abstract
Rugged dark materials for stray-light suppression by seeded ion beam texturing
Author(s): Charles C. Blatchley; Edward A. Johnson; Yi Kang Pu; Christopher J. Von Benken
Show Abstract
Advanced Baffles: knife-edged diffuse-absorptive and dual reflective baffles
Author(s): Roland D. Seals; Malcolm B. McIntosh
Show Abstract

© SPIE. Terms of Use
Back to Top