### PROCEEDINGS VOLUME 1746

Polarization Analysis and MeasurementFormat | Member Price | Non-Member Price |
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Softcover | $105.00 * | $105.00 * |

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 1746

Date Published: 11 December 1992

Softcover: 43 papers (424) pages

ISBN: 9780819409195

Date Published: 11 December 1992

Softcover: 43 papers (424) pages

ISBN: 9780819409195

Table of Contents

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Polarization analysis based on grating conical diffraction

Author(s): Rasheed M. A. Azzam; Kurt A. Giardina

Author(s): Rasheed M. A. Azzam; Kurt A. Giardina

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Polarized light-scattering applications and measurements of fundamentalsystems

Author(s): William S. Bickel; Gorden W. Videen

Author(s): William S. Bickel; Gorden W. Videen

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Advanced Stokes polarimeter: a new instrument for solar magnetic field research

Author(s): David F. Elmore; Bruce W. Lites; Steven Tomczyk; Andrew Skumanich; Richard B. Dunn; Jeffrey A. Schuenke; Kim V. Streander; Terry W. Leach; C. W. Chambellan; Howard K. Hull; L. B. Lacey

Author(s): David F. Elmore; Bruce W. Lites; Steven Tomczyk; Andrew Skumanich; Richard B. Dunn; Jeffrey A. Schuenke; Kim V. Streander; Terry W. Leach; C. W. Chambellan; Howard K. Hull; L. B. Lacey

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Scanning laser polarimetry of the retinal nerve fiber layer

Author(s): Andreas W. Dreher; Klaus Reiter

Author(s): Andreas W. Dreher; Klaus Reiter

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Polarimeter for mapping spatial distribution of dynamic state of polarization

Author(s): Yoshihiro Ohtsuka; Kazuhiko Oka

Author(s): Yoshihiro Ohtsuka; Kazuhiko Oka

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Exploiting spatial transformations of the light state for precise ellipsometry

Author(s): Laurence J. November

Author(s): Laurence J. November

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Three-dimensional image formation and restoration in an optical microscope with polarization aberrations

Author(s): Hong Jiang; Eric W. Hansen

Author(s): Hong Jiang; Eric W. Hansen

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Polarization sensitivity analysis of an earth remote-sensing instrument: the MODIS-N Phase B study

Author(s): Eugene Waluschka; Peter R. Silverglate; Christ Ftaclas; Aaron N. Turner

Author(s): Eugene Waluschka; Peter R. Silverglate; Christ Ftaclas; Aaron N. Turner

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Systems-level polarization modeling of multispectral space sensors

Author(s): Conrad Wells

Author(s): Conrad Wells

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Polarization ray tracing in anisotropic optically active media

Author(s): Stephen C. McClain; Russell A. Chipman

Author(s): Stephen C. McClain; Russell A. Chipman

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Polarization analysis of bulk-optic Faraday current sensor with a triangular configuration

Author(s): Beatrice C.B. Chu; Yanong N. Ning; David A. Jackson

Author(s): Beatrice C.B. Chu; Yanong N. Ning; David A. Jackson

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Linear polarization sensitivity specifications for spaceborne instruments

Author(s): Peter William Maymon; Russell A. Chipman

Author(s): Peter William Maymon; Russell A. Chipman

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Transparent binary-thickness coatings on metal substrates that produce binary patterns of orthogonal elliptical polarization states in reflected light

Author(s): Rasheed M. A. Azzam; Wade W. Angel

Author(s): Rasheed M. A. Azzam; Wade W. Angel

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Alignment technique for polarization-based optical systems

Author(s): Lie-yi Sheng; Bin Lin; Senlu Xu; Lie-wei Zhu

Author(s): Lie-yi Sheng; Bin Lin; Senlu Xu; Lie-wei Zhu

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Unified formalism for treating polarization effects using Stokes parameters and the Lorentz group

Author(s): Charles S. Brown

Author(s): Charles S. Brown

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Generalized diattenuation and retardance for inhomogeneous polarization elements

Author(s): Shih-Yau Lu; Russell A. Chipman

Author(s): Shih-Yau Lu; Russell A. Chipman

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Brown's polarization formalism applied to analogous dynamical systems

Author(s): F. U. Muhammad; Francis K. A. Allotey

Author(s): F. U. Muhammad; Francis K. A. Allotey

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Some necessary conditions on Mueller matrices

Author(s): Alexander B. Kostinski; Clark R. Givens; John M. Kwiatkowski

Author(s): Alexander B. Kostinski; Clark R. Givens; John M. Kwiatkowski

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High-speed ellipsometry for the production of thin metal layers

Author(s): Horst Schwiecker; Bui Dang Doi; Pham Thi Thanh Ha; J. Zilian; Ulrich Schneider; Joerg Heland

Author(s): Horst Schwiecker; Bui Dang Doi; Pham Thi Thanh Ha; J. Zilian; Ulrich Schneider; Joerg Heland

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Mueller matrix algorithms

Author(s): David B. Chenault; J. Larry Pezzaniti; Russell A. Chipman

Author(s): David B. Chenault; J. Larry Pezzaniti; Russell A. Chipman

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Differential reflection of circularly polarized light from a naturally optically active medium

Author(s): Jacques P. Badoz; Mark P. Silverman

Author(s): Jacques P. Badoz; Mark P. Silverman

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Refractive-index and thickness measurements for an anisotropic film by S- and P-polarized reflectances

Author(s): Tami Kihara; Kiyoshi Yokomori

Author(s): Tami Kihara; Kiyoshi Yokomori

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Birefringence characterization using transmission ellipsometry

Author(s): Soe-Mie F. Nee

Author(s): Soe-Mie F. Nee

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Crosstalk in solar polarization measurements

Author(s): Edward A. West; K. S. Balasubramaniam

Author(s): Edward A. West; K. S. Balasubramaniam

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Mueller matrix measurements with an out-of-plane polarimetric scatterometer

Author(s): Tod F. Schiff; John C. Stover; Donald R. Bjork; B. D. Swimley; Daniel J. Wilson; Mark E. Southwood

Author(s): Tod F. Schiff; John C. Stover; Donald R. Bjork; B. D. Swimley; Daniel J. Wilson; Mark E. Southwood

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Complete measurement of Kerr parameters by using rotating-analyzer magneto-optic spectroscopy

Author(s): Liang-Yao Chen; Xing-Wei Feng; Yushi Tian; Yi Su; Hong-Zhou Ma; You-Hua Qian; Defang Shen; John A. Woollam

Author(s): Liang-Yao Chen; Xing-Wei Feng; Yushi Tian; Yi Su; Hong-Zhou Ma; You-Hua Qian; Defang Shen; John A. Woollam

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Computer-aided polarimetry involving nonideal optical components

Author(s): John R. Engel

Author(s): John R. Engel

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Polarization-based phase-shifting method for shape contours

Author(s): Jing Fang; Y. P. Ma; Hong-Min Shi; Xuesong Li; Guoying Wu

Author(s): Jing Fang; Y. P. Ma; Hong-Min Shi; Xuesong Li; Guoying Wu

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Linear diattenuation of a front-side-illuminated CCD

Author(s): Apostolos Deslis; Suzanne Terese Smith; James P. McGuire

Author(s): Apostolos Deslis; Suzanne Terese Smith; James P. McGuire

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Polarization-sensitive Schottky photodiode

Author(s): Ludvig V. Belyakov; D. N. Goryachev; Olga M. Sreseli; Ilya D. Yaroshetskii

Author(s): Ludvig V. Belyakov; D. N. Goryachev; Olga M. Sreseli; Ilya D. Yaroshetskii

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Off-axis polarizing properties of polarizing beamsplitter cubes

Author(s): J. Larry Pezzaniti; Russell A. Chipman

Author(s): J. Larry Pezzaniti; Russell A. Chipman

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High-efficiency reflection polarizer based on light interference in a Buried Low-INDex (BLIND) layer in a high-index substrate at high angles of incidence

Author(s): Rasheed M. A. Azzam

Author(s): Rasheed M. A. Azzam

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Design and analysis of a depolarizer for the NASA MODerate-resolution Imaging Spectrometer-Tilt (MODIS-T)

Author(s): Stephen C. McClain; Peter William Maymon; Russell A. Chipman

Author(s): Stephen C. McClain; Peter William Maymon; Russell A. Chipman

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DC bias modulation characteristics of longitudinal KD*P modulators

Author(s): Edward A. West; Nathan A. Wilkins

Author(s): Edward A. West; Nathan A. Wilkins

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