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PROCEEDINGS VOLUME 1746

Polarization Analysis and Measurement
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Volume Details

Volume Number: 1746
Date Published: 11 December 1992
Softcover: 43 papers (424) pages
ISBN: 9780819409195

Table of Contents
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Polarization analysis based on grating conical diffraction
Author(s): Rasheed M. A. Azzam; Kurt A. Giardina
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Polarized light-scattering applications and measurements of fundamentalsystems
Author(s): William S. Bickel; Gorden W. Videen
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Advanced Stokes polarimeter: a new instrument for solar magnetic field research
Author(s): David F. Elmore; Bruce W. Lites; Steven Tomczyk; Andrew Skumanich; Richard B. Dunn; Jeffrey A. Schuenke; Kim V. Streander; Terry W. Leach; C. W. Chambellan; Howard K. Hull; L. B. Lacey
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Scanning laser polarimetry of the retinal nerve fiber layer
Author(s): Andreas W. Dreher; Klaus Reiter
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Polarimeter for mapping spatial distribution of dynamic state of polarization
Author(s): Yoshihiro Ohtsuka; Kazuhiko Oka
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Precision polarimetry of polarization components
Author(s): Russell A. Chipman
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Mechanics of polarization ray tracing
Author(s): Russell A. Chipman
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Exploiting spatial transformations of the light state for precise ellipsometry
Author(s): Laurence J. November
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Three-dimensional image formation and restoration in an optical microscope with polarization aberrations
Author(s): Hong Jiang; Eric W. Hansen
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Polarization sensitivity analysis of an earth remote-sensing instrument: the MODIS-N Phase B study
Author(s): Eugene Waluschka; Peter R. Silverglate; Christ Ftaclas; Aaron N. Turner
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Systems-level polarization modeling of multispectral space sensors
Author(s): Conrad Wells
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Polarization ray tracing in anisotropic optically active media
Author(s): Stephen C. McClain; Russell A. Chipman
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Effects of incoherent scattering on ellipsometry
Author(s): Soe-Mie F. Nee
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Polarization analysis of bulk-optic Faraday current sensor with a triangular configuration
Author(s): Beatrice C.B. Chu; Yanong N. Ning; David A. Jackson
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Coating-induced wavefront aberrations
Author(s): Daniel J. Reiley; Russell A. Chipman
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Linear polarization sensitivity specifications for spaceborne instruments
Author(s): Peter William Maymon; Russell A. Chipman
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Transparent binary-thickness coatings on metal substrates that produce binary patterns of orthogonal elliptical polarization states in reflected light
Author(s): Rasheed M. A. Azzam; Wade W. Angel
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Alignment technique for polarization-based optical systems
Author(s): Lie-yi Sheng; Bin Lin; Senlu Xu; Lie-wei Zhu
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Unified formalism for treating polarization effects using Stokes parameters and the Lorentz group
Author(s): Charles S. Brown
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Lorentz transformations on Stokes vectors
Author(s): F. U. Muhammad; Charles S. Brown
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Generalized diattenuation and retardance for inhomogeneous polarization elements
Author(s): Shih-Yau Lu; Russell A. Chipman
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Brown's polarization formalism applied to analogous dynamical systems
Author(s): F. U. Muhammad; Francis K. A. Allotey
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Some necessary conditions on Mueller matrices
Author(s): Alexander B. Kostinski; Clark R. Givens; John M. Kwiatkowski
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High-speed ellipsometry for the production of thin metal layers
Author(s): Horst Schwiecker; Bui Dang Doi; Pham Thi Thanh Ha; J. Zilian; Ulrich Schneider; Joerg Heland
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Mueller matrix algorithms
Author(s): David B. Chenault; J. Larry Pezzaniti; Russell A. Chipman
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Differential reflection of circularly polarized light from a naturally optically active medium
Author(s): Jacques P. Badoz; Mark P. Silverman
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Refractive-index and thickness measurements for an anisotropic film by S- and P-polarized reflectances
Author(s): Tami Kihara; Kiyoshi Yokomori
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Birefringence characterization using transmission ellipsometry
Author(s): Soe-Mie F. Nee
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Crosstalk in solar polarization measurements
Author(s): Edward A. West; K. S. Balasubramaniam
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Mueller matrix measurements with an out-of-plane polarimetric scatterometer
Author(s): Tod F. Schiff; John C. Stover; Donald R. Bjork; B. D. Swimley; Daniel J. Wilson; Mark E. Southwood
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Complete measurement of Kerr parameters by using rotating-analyzer magneto-optic spectroscopy
Author(s): Liang-Yao Chen; Xing-Wei Feng; Yushi Tian; Yi Su; Hong-Zhou Ma; You-Hua Qian; Defang Shen; John A. Woollam
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Laser polarimeter magnetic spectrometer
Author(s): Valerii S. Zapasskii
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Computer-aided polarimetry involving nonideal optical components
Author(s): John R. Engel
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Polarization-based phase-shifting method for shape contours
Author(s): Jing Fang; Y. P. Ma; Hong-Min Shi; Xuesong Li; Guoying Wu
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Linear diattenuation of a front-side-illuminated CCD
Author(s): Apostolos Deslis; Suzanne Terese Smith; James P. McGuire
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Polarization-sensitive Schottky photodiode
Author(s): Ludvig V. Belyakov; D. N. Goryachev; Olga M. Sreseli; Ilya D. Yaroshetskii
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Waveplates from stretched glass
Author(s): Nicholas F. Borrelli; Claude L. Davis
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Off-axis polarizing properties of polarizing beamsplitter cubes
Author(s): J. Larry Pezzaniti; Russell A. Chipman
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Efficient polarizers for infrared ellipsometry
Author(s): Karl Barth; Fritz Keilmann
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High-efficiency reflection polarizer based on light interference in a Buried Low-INDex (BLIND) layer in a high-index substrate at high angles of incidence
Author(s): Rasheed M. A. Azzam
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Design and analysis of a depolarizer for the NASA MODerate-resolution Imaging Spectrometer-Tilt (MODIS-T)
Author(s): Stephen C. McClain; Peter William Maymon; Russell A. Chipman
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DC bias modulation characteristics of longitudinal KD*P modulators
Author(s): Edward A. West; Nathan A. Wilkins
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Characterization of ion-exchanged waveguides for integrated-optical polarization devices
Author(s): Kenneth H. Church; Raymond Zanoni
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