Share Email Print
cover

Proceedings of SPIE Volume 1720

Intl Symp on Optical Fabrication, Testing, and Surface Evaluation
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 1720
Date Published: 20 October 1992
Softcover: 78 papers (646) pages
ISBN: 9780819408877

Table of Contents
show all abstracts | hide all abstracts
Super-smooth surface polishing on aspherical optics
Author(s): Manabu Ando; Mahito Negishi; Masafumi Takimoto; Akinobu Deguchi; Nobuo Nakamura; Makoto Higomura; Hironori Yamamoto
Measurement of large-scale and high-precision optics using a noncontact form-measuring probe
Author(s): Seiichiro Murai; Katsunobu Ueda; Shigeru Sakuta; Ken Ishikawa
New machining method of a large-size asymmetric aspheric mirror
Author(s): Yasuo Higashi; Sigeaki Koike; Toshikazu Takatomi; Shin Koizumi
Development of ultraprecise injection molding method for thermoplasticlenses
Author(s): Akiro Fukushima; Motoaki Kawazu; Hidenori Ito; Hisaaki Koseko; Toshiharu Hatakeyama; Wataru Ohotani; Toshihiro Kanematsu
Computer-controlled polishing of aspheric surfaces
Author(s): Tianning Cao; Jianping Zhang
Present and future standard specimens for surface-finish metrology (Summary Only)
Author(s): Theodore V. Vorburger; Jun-Feng Song; Egon Marx; Robert I. Scace; Thomas Robert Lettieri
Show Abstract
Development of new instrument detecting integrated intensity fluctuations for surface roughness measurements
Author(s): Eiichi Miyazaki; Kunifumi Nakanishi; Takeaki Yoshimura
Show Abstract
Real-time surface roughness measurement under speckle pattern illumination
Author(s): Kiyoshi Nakagawa; Takeaki Yoshimura; Takumi Minemoto
Show Abstract
Noncontact measuring methods of optical surface roughness
Author(s): Feng Liang; Tianning Cao
Show Abstract
Aspheric technology for zoom lenses (Invited Paper)
Author(s): Toshihide Dohi
Show Abstract
Comparison of surface roughness measured with an optical profiler and a scanning probe microscope (Invited Paper)
Author(s): Jay Jahanmir; James C. Wyant
Show Abstract
Surface roughness and waviness measurements for optical parts (Invited Paper)
Author(s): Thomas C. Bristow
Show Abstract
Fringe-scanning white-light microscope for surface profile measurement and material identification
Author(s): Kumiko Matsui; Satoshi Kawata
Show Abstract
Phase-shifting common-path interferometers using double-focus lenses for surface profiling
Author(s): Hisao Kikuta; Koichi Iwata
Show Abstract
Scattering characteristics of dielectric optical multilayers in visible region
Author(s): Takayuki Akiyama
Show Abstract
Multiobjective space datum line available through paralleled plate
Author(s): Dachun Shi; Ge Shuai; Pengfei Zhou
Show Abstract
New type of instrument for the orientation of the optical axis of crystal
Author(s): Tianning Cao
Show Abstract
X-ray imaging optics in Japan (Invited Paper)
Author(s): Takeshi Namioka; Koujun Yamashita; Masaki Yamamoto; Tadashi Matsushita; Sadao Aoki; Shigeru Sato
Show Abstract
Structure and x-ray optical properties of MBE-grown multilayers (Invited Paper)
Author(s): Charles M. Falco; Patrick A. Kearney; Judith A. Ruffner; Jon M. Slaughter
Show Abstract
X-ray multilayer mirrors for grazing incidence
Author(s): Masaaki Sudoh; Katsunobu Ueda; Shinichi Nakamura; Hirobumi Ohmori
Show Abstract
Fabrication and evaluation of Cr-C multilayer mirrors for soft x rays
Author(s): Masahito Niibe; Masami Tsukamoto; Takashi Iizuka; Akira Miyake; Yutaka Watanabe; Yasuaki Fukuda
Show Abstract
Design and fabrication of the Schwarzschild objective for soft x-ray microscopes
Author(s): Yoshiaki Horikawa; Shouichirou Mochimaru; Yoshinori Iketaki; Koumei Nagai; Kaneyasu Okawa; Shigemi Iura
Show Abstract
Radiation damage of multilayer mirrors for soft x-ray lasers
Author(s): Masami Tsukamoto; Masahito Niibe; Yutaka Watanabe; Akira Miyake; Takashi Iizuka; Yasuaki Fukuda; Yoshiaki Kato; Hiroyuki Shiraga; Hiroyuki Daido; Kensuki Murai; Ciaran L. S. Lewis; David Neely; Domhnail O'Neill
Show Abstract
X-ray mirrors for SR lithography (Invited Paper)
Author(s): Takashi Kaneko; Sei-ichi Itabashi; Yasunao Saitoh; Ikuo Okada; Hideo Yoshihara
Show Abstract
Thickness dependence of the optical constants of thin Pt, Au, and Rh films in the soft x-ray region
Author(s): Mihiro Yanagihara; Takaumi Maehara; Masaki Yamamoto; Takeshi Namioka
Show Abstract
Two-stage x-ray mirror system for microscopic x-ray photoelectron spectroscopy
Author(s): Ken Ninomiya; Masaki Hasegawa; Sadao Aoki
Show Abstract
Fabrication and testing of grazing incidence mirrors for hard x rays
Author(s): Fumihiko Uchida; Yoshio Suzuki
Show Abstract
Technological challenges in the Japan National Large Telescope project (Invited Paper)
Author(s): Keiichi Kodaira
Show Abstract
Advances in optical disk lens (Invited Paper)
Author(s): Tadashi Kojima
Show Abstract
Zone-plate null interferometer for measuring aspherical mirror with large aperture
Author(s): Toshio Honda; Y. Kawamoto; Haike Guan; Masahiro Yamaguchi; Nagaaki Ohyama
Show Abstract
Analysis of zone-plate interference fringe pattern
Author(s): Kazuhide Kamiya; Takashi Nomura; Hiroshi Miyashiro; Kazuo Yoshikawa; Hatsuzo Tashiro; Shigeo Ozono; Masane Suzuki
Show Abstract
Application of a fringe scanning method to zone-plate interferometry
Author(s): Takashi Nomura; Hiroshi Miyashiro; Kazuhide Kamiya; Kazuo Yoshikawa; Hatsuzo Tashiro; Shigeo Ozono; Masane Suzuki
Show Abstract
Precision polarimetry of optical components (Invited Paper)
Author(s): Russell A. Chipman
Show Abstract
Two-dimensional birefringence measurement using the phase-shifting technique
Author(s): Yukitoshi Otani; Takuya Shimada; Toru Yoshizawa; Norihiro Umeda
Show Abstract
Contour mapping of dynamic stress distributions by novel polarization interferometry
Author(s): Kazuhiko Oka; Yoshihiro Ohtsuka
Show Abstract
Measurement of 2D birefringence distribution
Author(s): Masato Noguchi; Tsuyoshi Ishikawa; Masahiro Ohno; Satoru Tachihara
Show Abstract
Fabrication and testing of x-ray telescope
Author(s): Jingchi Yu; Xiafei Sun; Zhangnan Huang
Show Abstract
Soft x-ray polarization measurement with a laboratory reflectometer
Author(s): Masaki Yamamoto; Kou Mayama; Hiroshi Nomura; Hiroaki Kimura; Mihiro Yanagihara; Takeshi Namioka
Show Abstract
Design, fabrication, and polarization of soft x-ray transmission multilayers
Author(s): Hiroshi Nomura; Kou Mayama; Takuya Sasaki; Masaki Yamamoto; Mihiro Yanagihara
Show Abstract
Fringe contrast improvement in Twyman-Green interferometer for lens test
Author(s): Hitoshi Ohashi; Yoichi Iba; Toshiro Okamura
Show Abstract
Heterodyne common-path interferometer for testing surface roughness
Author(s): Changyuan Han; Bin Liu; Zhenwu Lu; Quwu Gu
Show Abstract
Error sources in phase-measuring interferometry (Invited Paper)
Author(s): Katherine Creath
Show Abstract
Measurement of phase change of light on reflection
Author(s): Takuma Doi; Kouji Toyoda; Yoshihisa Tanimura
Show Abstract
Measurement of large plane surface shape with interferometric aperture synthesis
Author(s): Masashi Otsubo; Katsuyuki Okada; Jumpei Tsujiuchi
Show Abstract
Measurement of radius of concave mirror by zone-plate interferometer
Author(s): Zhi Qiang Liu; Katsuyuki Okada; Jumpei Tsujiuchi
Show Abstract
Advanced interferometry at Carl Zeiss (Summary Only)
Author(s): Michael F. Kuechel
Show Abstract
Two-wavelength laser-diode interferometry with electronic calibration techniques
Author(s): Ribun Onodera; Yukihiro Ishii
Show Abstract
Oblique incidence interferometry for gear-tooth surface profiling
Author(s): Tomomi Ino; Toyohiko Yatagai
Show Abstract
Talbot projected 3D profilometry by means of one-step phase-shift algorithms
Author(s): Ruowei Gu; Toru Yoshizawa
Show Abstract
Surface condition measurement using optical heterodyne method
Author(s): Hiroo Fujita
Show Abstract
Two holographic methods for flatness testing with subwavelength or multiple-wavelength sensitivity
Author(s): Pierre Michel Boone; Pierre M. Jacquot
Show Abstract
Approach to high-accuracy qualification of long-radius spherical surfaces (Invited Paper)
Author(s): George C. Hunter; P. L. Pfluke; Lars A. Selberg
Show Abstract
Fabrication of lenslet grating with multilevel phases
Author(s): Yingbai Yan; Xu Wang; Changkun Yao; Guofan Jin; Minxian Wu
Show Abstract
General principles behind JCII's testing of optical instruments (Invited Paper)
Author(s): Hideki Kondo
Show Abstract
Absolute surface measurements of processed material using two-color lasers
Author(s): Hirokazu Matsumoto
Show Abstract
Modern surface technique and its valuation on ultraprecise metrology grating
Author(s): Lin Chen
Show Abstract
Electronic pseudocolor encoder for optical testing
Author(s): Suganda Jutamulia; Akihiro Fujita; Shinji Toyoda; Eiichi Ito; Aris Tanone; Francis T. S. Yu
Show Abstract
Fabrication and testing issues in free-space digital optical switching and computing (Invited Paper)
Author(s): Frederick B. McCormick; Jose M. Sasian; Randall J. Crisci; Rick L. Morrison; Frank A. P. Tooley; Esther Kerbis; Sonya L. Walker
Show Abstract
Displacement meter with ferroelectric liquid crystal spatial light modulator utilizing speckle photography
Author(s): Yuji Kobayashi; Tamiki Takemori; Naohisa Mukohzaka; Narihiro Yoshida; Terushige Hori; Seiji Fukushima
Show Abstract
Digital wavefront measuring interferometer for testing optical surfaces and lenses
Author(s): Tianning Cao
Show Abstract
Estimation of the size parameters of fine rectangular grooves based on Fraunhofer diffraction
Author(s): Takashi Miyoshi; Yasuhiro Takaya
Show Abstract
Crystal streak camera for infrared light pulse
Author(s): Osamu Matsumoto; Yasushi Ohbayashi
Show Abstract
Digital receiving mode of radial gratings and its receiving precision
Author(s): Song Shen; Xiangqun Cao
Show Abstract
Calculation of grating transmission functions by determining the spectral intensity
Author(s): Xiangqun Cao; Hong Xie; Ling Chen
Show Abstract
Advancements in one-dimensional profiling with a long-trace profiler
Author(s): Steven C. Irick; Wayne R. McKinney
Show Abstract
Progress at the Center for Optics Manufacturing
Author(s): Stephen D. Jacobs
Show Abstract
Calibration of phase-shift interferometer
Author(s): Der-Shen Wan; Wen-Shang Chiang; Ming-Wen Chang
Show Abstract
Method for measuring small displacements by using an electro-optic modulator
Author(s): Li-Horng Shyu; Chieh-Li Chen; Der-Chin Su
Show Abstract
Fabrication and testing of x-ray optical elements
Author(s): Changxin Zhou
Show Abstract
Null test of aspheric surfaces in zone-plate interferometer
Author(s): Junejei Huang; Chihui Chang
Show Abstract
Refractive index measurement for irregular-shaped samples
Author(s): Shu-Mieh Yang; Kuo-Hao Chang; Ta-Kun Kung
Show Abstract
HOE interferometer for cylindrical surface
Author(s): Yoshitaka Minami; Kenji Yasuda
Show Abstract
Aspheric lens LD collimator for an optical intersatellite link
Author(s): Mitsuo Nohara; Keizo Inagaki; Hideaki Koyanagi; Isao Ishibai
Show Abstract

© SPIE. Terms of Use
Back to Top