Share Email Print
cover

Proceedings of SPIE Volume 1681

Optically Based Methods for Process Analysis
Editor(s): David S. Bomse; Harry Brittain; Stuart Farquharson; Jeremy M. Lerner; Alan J. Rein; Cary Sohl; Terry R. Todd; Lois Weyer
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 1681
Date Published: 14 August 1992
Softcover: 39 papers (394) pages
ISBN: 9780819408426

Table of Contents
show all abstracts | hide all abstracts
Luminescent sensors: modeling of microheterogeneous systems and model differentiation
Author(s): James N. Demas; Benjamin A. DeGraff
Show Abstract
Development and characterization of a miniature dual-channel spectrometer for spectrocolorimetry
Author(s): Harry J. Oana; Lothar Jahreiss; Danny C. Rich; Stephan Trost
Show Abstract
Instrumental techniques for infrared and Raman vibrational optical activity
Author(s): Laurence A. Nafie
Show Abstract
Multisite on-line process control using a CCD detector system
Author(s): Ishai Nir
Show Abstract
Basics of fiber optics
Author(s): Craig D. Harrison
Show Abstract
Optical design of a new photodiode-array absorbance detector for high-performance liquid chromatography
Author(s): Anthony C. Gilby; Michael J. Leveille
Show Abstract
Instrumentation for the observation of circular dichroism in IR vibrational transitions
Author(s): Max Diem
Show Abstract
Instrumentation systems for passive fiber optic chemical sensors
Author(s): Douglas J. Ferrell; Jeremy M. Lerner; Robert A. Lieberman; Toni B. Quintana; Edward M. Schmidlin; Steven J. Syracuse
Show Abstract
Spectroscopy in pharmaceutical development: an overview
Author(s): Stephen Scypinski; Ramaswamy Murari; Anne Grant; Sammy Ng
Show Abstract
Time-resolved fluorescence analysis
Author(s): J. B. Alexander Ross; William R. Laws
Show Abstract
Colorimetry with a diode array spectrometer
Author(s): David Baker
Show Abstract
Infrared phase-modulated ellipsometer for in-situ characterization of surfaces and thin films
Author(s): Nadine Blayo; Bernard Drevillon; Razvigor Ossikovski
Show Abstract
Holographic Raman sensor for process-control application
Author(s): Harry Owen
Show Abstract
Diode laser spectroscopy for on-line chemical analysis
Author(s): David S. Bomse; D. Christian Hovde; Daniel B. Oh; Joel A. Silver; Alan C. Stanton
Show Abstract
Remote Raman analysis for process-monitoring applications
Author(s): Francis J. Purcell; Roy E. Grayzel; Fran Adar
Show Abstract
New generation in process-control colorimetric instrumentation
Author(s): Jack A. Ladson
Show Abstract
Compact and high-speed ellipsometer
Author(s): Akira Kazama; Yoshiro Yamada; Takeo Yamada; Takahiko Oshige; Tomoyuki Kaneko; Akio Nagamune
Show Abstract
Optically based methods for process analysis
Author(s): Thomas J. Mabon
Show Abstract
Automated in-line color measurement for quality control
Author(s): Anne Hruza; Jack A. Ladson
Show Abstract
Industrial process control with array spectroscopy
Author(s): Douglas S. Malchow
Show Abstract
Temporal and spatial variation of free calcium with contraction in isolated cardiac myocytes
Author(s): Francis M. Siri
Show Abstract
Determination of transesterification reaction endpoint using NIR spectroscopy
Author(s): Wayne D. Mockel; Mark P. Thomas
Show Abstract
Precision of the petrochemical process analysis using NIR spectroscopy
Author(s): Timothy M. Davidson; Keith T. DeConde; Rosemary Hake; David H. Tracy; Allen Gantz; Lawrence McDermott
Show Abstract
Environmental considerations for fiber optic remote sensing systems in on-line process monitoring
Author(s): Richard D. Driver; James N. Downing; M. L. Brubaker; John D. Stark; Lubos J. B. Vacha; Tracey L. Wilbourn
Show Abstract
Use of fiber-optic-based flow cells and probes in the chemical and petroleum industries
Author(s): Mike Ponstingl; Hans Vetter
Show Abstract
Fiber optic process interfaces and applications
Author(s): Richard S. Harner
Show Abstract
Monitoring final quality of liquid dyestuffs through optical spectroscopy
Author(s): Claudio G. Puebla
Show Abstract
Fourier transform infrared spectroscopy for process monitoring and control
Author(s): Peter R. Solomon; Philip W. Morrison; Michael A. Serio; Robert M. Carangelo; James R. Markham; Stephen C. Bates; Joseph E. Cosgrove
Show Abstract
Applications of Raman spectroscopy to industrial processes
Author(s): Stuart Farquharson; Stan F. Simpson
Show Abstract
On-line analysis of chemical composition using an FT-Raman spectrometer in the near-IR
Author(s): Arlene A. Garrison
Show Abstract
In-situ monitoring of chemical reactions by Fourier transform IR spectroscopy
Author(s): Alan J. Rein
Show Abstract
Chemometrics in the real world
Author(s): Steven M. Donahue
Show Abstract
Off-line real-time FTIR analysis of a process step in imipenem production
Author(s): Jhansi R. Boaz; Scott M. Thomas; Steven M. Meyerhoffer; Steven J. Staskiewicz; Joseph E. Lynch; Richard S. Egan; Dean K. Ellison
Show Abstract
Problem solving in pharmaceutical production using scanning infrared microprobe analysis
Author(s): John A. Reffner
Show Abstract
Application of FTIR microscopy in the study of pharmaceutical packaging materials and formulations
Author(s): John J. Hu; James B. Johnson
Show Abstract
On-line IR analyzer system to monitor cephamycin C loading on ion-exchange resin
Author(s): Sheldon Shank; Warren Russ; Douglas Gravatt; Wesley Lee; Steven M. Donahue
Show Abstract
Process development utilizing advanced technologies: the RC1 reaction calorimeter, the multifunctional SimuSolv software, and the ReactIR reaction analysis system
Author(s): Ralph N. Landau; Susan M. Penix; Steven M. Donahue; Alan J. Rein
Show Abstract
Pharmaceutical process development and optimization using in-situ Fourier transform infrared spectroscopy
Author(s): Alan J. Rein
Show Abstract
On-line polymeric measurements in real time with NIR spectroscopy
Author(s): Greg K. Brown
Show Abstract

© SPIE. Terms of Use
Back to Top